Atomic-scale determination of surface facets in gold nanorods B Goris, S Bals, W Van den Broek, E Carbó-Argibay, S Gómez-Graña, ... Nature materials 11 (11), 930-935, 2012 | 357 | 2012 |
Electron tomography based on a total variation minimization reconstruction technique B Goris, W Van den Broek, KJ Batenburg, HH Mezerji, S Bals Ultramicroscopy 113, 120-130, 2012 | 255 | 2012 |
StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images A De Backer, KHW Van den Bos, W Van den Broek, J Sijbers, S Van Aert Ultramicroscopy 171, 104-116, 2016 | 209 | 2016 |
A novel quasi-one-dimensional topological insulator in bismuth iodide β-Bi4I4 G Autès, A Isaeva, L Moreschini, JC Johannsen, A Pisoni, R Mori, ... Nature materials 15 (2), 154-158, 2016 | 115 | 2016 |
Correction of non-linear thickness effects in HAADF STEM electron tomography W Van den Broek, A Rosenauer, B Goris, GT Martinez, S Bals, S Van Aert, ... Ultramicroscopy 116, 8-12, 2012 | 100 | 2012 |
Method for retrieval of the three-dimensional object potential by inversion of dynamical electron scattering W Van den Broek, CT Koch Physical review letters 109 (24), 245502, 2012 | 70 | 2012 |
A practical method to determine the effective resolution in incoherent experimental electron tomography HH Mezerji, W Van den Broek, S Bals Ultramicroscopy 111 (5), 330-336, 2011 | 67 | 2011 |
Functional models of UMTS and integration into future networks W Van Den Broek, AN Brydon, JM Cullen, S Kukkonen, A Lensink, ... Electronics & communication engineering journal 5 (3), 165-172, 1993 | 49 | 1993 |
General framework for quantitative three-dimensional reconstruction from arbitrary detection geometries in TEM W Van den Broek, CT Koch Physical Review B 87 (18), 184108, 2013 | 46 | 2013 |
A holographic method to measure the source size broadening in STEM J Verbeeck, A Béché, W Van den Broek Ultramicroscopy 120, 35-40, 2012 | 42 | 2012 |
Crystal Growth and Real Structure Effects of the First Weak 3D Stacked Topological Insulator Bi14Rh3I9 B Rasche, A Isaeva, A Gerisch, M Kaiser, W Van den Broek, CT Koch, ... Chemistry of Materials 25 (11), 2359-2364, 2013 | 37 | 2013 |
Optimization of a FIB/SEM slice‐and‐view study of the 3D distribution of Ni4Ti3 precipitates in Ni–Ti S Cao, W Tirry, W Van Den Broek, D Schryvers Journal of microscopy 233 (1), 61-68, 2009 | 34 | 2009 |
Modular Design with 2D Topological-Insulator Building Blocks: Optimized Synthesis and Crystal Growth and Crystal and Electronic Structures of BixTeI (x = 2, 3) A Zeugner, M Kaiser, P Schmidt, TV Menshchikova, IP Rusinov, ... Chemistry of Materials 29 (3), 1321-1337, 2017 | 32 | 2017 |
FDES, a GPU-based multislice algorithm with increased efficiency of the computation of the projected potential W Van den Broek, X Jiang, CT Koch Ultramicroscopy 158, 89-97, 2015 | 32 | 2015 |
A model based reconstruction technique for depth sectioning with scanning transmission electron microscopy W Van den Broek, S Van Aert, D Van Dyck Ultramicroscopy 110 (5), 548-554, 2010 | 31 | 2010 |
Exploring different inelastic projection mechanisms for electron tomography B Goris, S Bals, W Van den Broek, J Verbeeck, G Van Tendeloo Ultramicroscopy 111 (8), 1262-1267, 2011 | 29 | 2011 |
Overcoming information reduced data and experimentally uncertain parameters in ptychography with regularized optimization M Schloz, TC Pekin, Z Chen, W Van den Broek, DA Muller, CT Koch Optics Express 28 (19), 28306-28323, 2020 | 28 | 2020 |
Third-dimension information retrieval from a single convergent-beam transmission electron diffraction pattern using an artificial neural network RS Pennington, W Van den Broek, CT Koch Physical Review B 89 (20), 205409, 2014 | 28 | 2014 |
Defocus and twofold astigmatism correction in HAADF-STEM ME Rudnaya, W Van den Broek, RMP Doornbos, RMM Mattheij, ... Ultramicroscopy 111 (8), 1043-1054, 2011 | 26 | 2011 |
Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency W Van den Broek, S Van Aert, D Van Dyck Microscopy and Microanalysis 18 (2), 336-342, 2012 | 22 | 2012 |