Tino Hofmann
TitleCited byYear
Ellipsometry at the Nanoscale
M Losurdo, K Hingerl
Springer, 2013
982013
Generalized far-infrared magneto-optic ellipsometry for semiconductor layer structures: determination of free-carrier effective-mass, mobility, and concentration parameters in …
M Schubert, T Hofmann, CM Herzinger
JOSA A 20 (2), 347-356, 2003
912003
Protein adsorption on and swelling of polyelectrolyte brushes: A simultaneous ellipsometry-quartz crystal microbalance study
E Bittrich, KB Rodenhausen, KJ Eichhorn, T Hofmann, M Schubert, ...
Biointerphases 5, 159, 2010
792010
Optical, structural, and magnetic properties of cobalt nanostructure thin films
D Schmidt, AC Kjerstad, T Hofmann, R Skomski, E Schubert, M Schubert
Journal of Applied Physics 105 (11), 113508-113508-7, 2009
752009
Variable-wavelength frequency-domain terahertz ellipsometry
T Hofmann, CM Herzinger, A Boosalis, TE Tiwald, JA Woollam, ...
Review of Scientific Instruments 81, 023101, 2010
722010
Generalized ellipsometry for monoclinic absorbing materials: determination of optical constants of Cr columnar thin films
D Schmidt, B Booso, T Hofmann, E Schubert, A Sarangan, M Schubert
Optics letters 34 (7), 992-994, 2009
702009
Monoclinic optical constants, birefringence, and dichroism of slanted titanium nanocolumns determined by generalized ellipsometry
D Schmidt, B Booso, T Hofmann, E Schubert, A Sarangan, M Schubert
Applied Physics Letters 94, 011914, 2009
692009
Ellipsometry of functional organic surfaces and films
K Hinrichs, KJ Eichhorn
Springer, 2018
662018
Ellipsometry of Functional Organic Surfaces and Films
KJEK Hinrichs
Springer, 2014
66*2014
Anisotropy, phonon modes, and free charge carrier parameters in monoclinic -gallium oxide single crystals
M Schubert, R Korlacki, S Knight, T Hofmann, S Schöche, V Darakchieva, ...
Physical Review B 93 (12), 125209, 2016
622016
Terahertz magneto-optic generalized ellipsometry using synchrotron and blackbody radiation
T Hofmann, U Schade, CM Herzinger, P Esquinazi, M Schubert
Review of scientific instruments 77, 063902, 2006
612006
Resistive hysteresis and interface charge coupling in BaTiO-ZnO heterostructures
VM Voora, T Hofmann, M Brandt, M Lorenz, M Grundmann, N Ashkenov, ...
Applied Physics Letters 94, 142904, 2009
522009
Combined optical and acoustical method for determination of thickness and porosity of transparent organic layers below the ultra-thin film limit
KB Rodenhausen, T Kasputis, AK Pannier, JY Gerasimov, RY Lai, ...
Review of Scientific Instruments 82, 103111, 2011
442011
Free electron behavior in InN: On the role of dislocations and surface electron accumulation
V Darakchieva, T Hofmann, M Schubert, BE Sernelius, B Monemar, ...
Applied Physics Letters 94, 022109, 2009
442009
Interface polarization coupling in piezoelectric-semiconductor ferroelectric heterostructures
VM Voora, T Hofmann, M Brandt, M Lorenz, M Grundmann, N Ashkenov, ...
Physical Review B 81 (19), 195307, 2010
432010
Terahertz ellipsometry and terahertz optical-Hall effect
T Hofmann, CM Herzinger, JL Tedesco, DK Gaskill, JA Woollam, ...
Thin Solid Films 519 (9), 2593-2600, 2011
422011
Hole-channel conductivity in epitaxial graphene determined by terahertz optical-Hall effect and midinfrared ellipsometry
T Hofmann, A Boosalis, P Kühne, CM Herzinger, JA Woollam, DK Gaskill, ...
Applied Physics Letters 98, 041906, 2011
412011
Transient Absorption Measurements on Anisotropic Monolayer ReS2
Q Cui, J He, MZ Bellus, M Mirzokarimov, T Hofmann, HY Chiu, M Antonik, ...
Small 11 (41), 5565-5571, 2015
402015
Optical Hall Effect in Hexagonal InN
T Hofmann, V Darakchieva, B Monemar, H Lu, WJ Schaff, M Schubert
Journal of Electronic Materials 37 (5), 611-615, 2008
402008
Polaron and phonon properties in proton intercalated amorphous tungsten oxide thin films
MF Saenger, T Höing, BW Robertson, RB Billa, T Hofmann, E Schubert, ...
Physical Review B 78 (24), 245205, 2008
382008
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Articles 1–20