Field emission from open ended aluminum nitride nanotubes VN Tondare, C Balasubramanian, SV Shende, DS Joag, VP Godbole, ... Applied Physics Letters 80 (25), 4813-4815, 2002 | 319 | 2002 |
Quest for high brightness, monochromatic noble gas ion sources VN Tondare Journal of Vacuum Science & Technology A 23 (6), 1498-1508, 2005 | 168 | 2005 |
Comparative study of multiwall carbon nanotube nanocomposites by Raman, SEM, and XPS measurement techniques Y Piao, VN Tondare, CS Davis, JM Gorham, EJ Petersen, JW Gilman, ... Composites Science and Technology 208, 108753, 2021 | 58 | 2021 |
Field emission from carbon nanotubes grown on a tungsten tip RB Sharma, VN Tondare, DS Joag, A Govindaraj, CNR Rao Chemical physics letters 344 (3-4), 283-286, 2001 | 55 | 2001 |
The effects of particle size distribution on the rheological properties of the powder and the mechanical properties of additively manufactured 17-4 PH stainless steel JS Weaver, J Whiting, V Tondare, C Beauchamp, M Peltz, J Tarr, TQ Phan, ... Additive manufacturing 39, 101851, 2021 | 44 | 2021 |
Self-assembled Ge nanostructures as field emitters VN Tondare, BI Birajdar, N Pradeep, DS Joag, A Lobo, SK Kulkarni Applied Physics Letters 77 (15), 2394-2396, 2000 | 40 | 2000 |
A comparison of particle size distribution and morphology data acquired using lab-based and commercially available techniques: Application to stainless steel powder JG Whiting, EJ Garboczi, VN Tondare, JHJ Scott, MA Donmez, SP Moylan Powder Technology 396, 648-662, 2022 | 23 | 2022 |
Field emission studies of CVD diamond thin films: effect of acid treatment PM Koinkar, PP Patil, MA More, VN Tondare, DS Joag Vacuum 72 (3), 321-326, 2003 | 20 | 2003 |
Stability of field emission current from porous n-GaAs(110) VN Tondare, M Naddaf, AB Bhise, SV Bhoraskar, DS Joag, AB Mandale, ... Applied physics letters 80 (6), 1085-1087, 2002 | 20 | 2002 |
Three-dimensional (3d) nanometrology based on scanning electron microscope (SEM) stereophotogrammetry VN Tondare, JS Villarrubia, AE Vladár Microscopy and Microanalysis 23 (5), 967-977, 2017 | 17 | 2017 |
Stable field emission from W tips in poor vacuum conditions VN Tondare, NJ van Druten, CW Hagen, P Kruit Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2003 | 16 | 2003 |
Field emission from diamond coated tungsten tips VN Tondare, N Pradeep, DD Bambaladi, VP Godbole, DS Joag Solid-State Electronics 45 (6), 957-962, 2001 | 16 | 2001 |
Uncertainty of particle size measurements using dynamic image analysis JG Whiting, VN Tondare, JHJ Scott, TQ Phan, MA Donmez CIRP Annals 68 (1), 531-534, 2019 | 15 | 2019 |
A method to determine the number of nanoparticles in a cluster using conventional optical microscopes H Kang, R Attota, V Tondare, AE Vladár, P Kavuri Applied Physics Letters 107 (10), 2015 | 12 | 2015 |
Particle-optical apparatus equipped with a gas ion source P Kruit, VN Tondare US Patent 7,772,564, 2010 | 12 | 2010 |
Virtual rough samples to test 3D nanometer-scale scanning electron microscopy stereo photogrammetry JS Villarrubia, VN Tondare, AE Vladár Metrology, Inspection, and Process Control for Microlithography XXX 9778, 80-88, 2016 | 10 | 2016 |
Towards a high brightness, monochromatic electron impact gas ion source VN Tondare | 8 | 2006 |
An electron microscopy investigation of the structure of porous silicon by oxide replication VN Tondare, BC Gierhart, DG Howitt, RL Smith, SJ Chen, SD Collins Nanotechnology 19 (22), 225301, 2008 | 6 | 2008 |
A Concept for Three-Dimensional Particle Metrology Based on Scanning Electron Microscopy and Structure-from-Motion Photogrammetry VN Tondare Journal of Research of the National Institute of Standards and Technology 125, 2020 | 4 | 2020 |
Field electron emission from CdTe deposited tungsten tip: light-induced effects RB Sharma, RA Singh, GC Dubey, VN Tondare, N Pradeep, DS Joag Materials Science and Engineering: A 353 (1-2), 52-55, 2003 | 4 | 2003 |