Anton Timothy Dahbura
Anton Timothy Dahbura
Associate Research Scientist, Johns Hopkins University
Verified email at jhu.edu
Title
Cited by
Cited by
Year
A protocol test generation procedure
K Sabnani, A Dahbura
Computer Networks and ISDN systems 15 (4), 285-297, 1988
6221988
An optimization technique for protocol conformance test generation based on UIO sequences and rural Chinese postman tours
AV Aho, AT Dahbura, D Lee, MU Uyar
IEEE transactions on communications 39 (11), 1604-1615, 1991
6121991
The consensus problem in fault-tolerant computing
M Barborak, A Dahbura, M Malek
ACM Computing Surveys (CSur) 25 (2), 171-220, 1993
5451993
An 0(n2.5) Fault Identification Algorithm for Diagnosable Systems
AT Dahbura, GM Masson
IEEE Transactions on Computers, 486-492, 1984
3881984
On self-diagnosable multiprocessor systems: diagnosis by the comparison approach
A Sengupta, AT Dahbura
IEEE Transactions on Computers, 1386-1396, 1992
3731992
Protocol conformance testing using multiple UIO sequences
YN Shen, F Lombardi, AT Dahbura
IEEE Transactions on Communications 40 (8), 1282-1287, 1992
1711992
The comparison approach to multiprocessor fault diagnosis
AT Dahbura, KK Sabnani, LL King
IEEE Transactions on Computers, 373-378, 1987
1421987
Formal methods for generating protocol conformance test sequences
AT Dahbura, KK Sabnani, MU Uyar
Proceedings of the IEEE 78 (8), 1317-1326, 1990
1241990
A distributed system-level diagnosis algorithm for arbitrary network topologies
S Rangarajan, AT Dahbura, EA Ziegler
IEEE Transactions on Computers 44 (2), 312-334, 1995
1141995
MoCCA: A mobile communication and computing architecture
A Smailagic, D Siewiorek, L Bass, B Iannucci, A Dahbura, S Eddleston, ...
Digest of Papers. Third International Symposium on Wearable Computers, 64-71, 1999
971999
Optimal test sequence generation for protocols: the Chinese postman algorithm applied to Q. 931
MÜ Uyar, AT Dahbura
Conformance testing methodologies and architectures for OSI protocols, 347-351, 1995
961995
Optimal test generation for finite state machine models
AT Dahbura, KK Sabnani, MU Uyar
US Patent 4,991,176, 1991
911991
A new technique for generating protocol test
K Sabnani, A Dahbura
ACM SIGCOMM Computer Communication Review 15 (4), 36-43, 1985
831985
System-level diagnosis: A perspective for the third decade
AT Dahbura
Concurrent Computations, 411-434, 1988
781988
An optimal test sequence for the JTAG/IEEE P1149. 1 test access port controller
AT Dahbura, MU Uyar, CW Yau
Proceedings.'Meeting the Tests of Time'., International Test Conference, 55-62, 1989
691989
Yield enhancement of programmable ASIC arrays by reconfiguration of circuit placements
J Narasimham, K Nakajima, CS Rim, AT Dahbura
IEEE transactions on computer-aided design of integrated circuits and …, 1994
671994
Spare capacity as a means of fault detection and diagnosis in multiprocessor systems
AT Dahbura, KK Sabnani, WJ Hery
IEEE Transactions on Computers 38 (6), 881-891, 1989
541989
An experience in estimating fault coverage of a protocol test
A Dahbura, K Sabnani
IEEE INFOCOM'88, Seventh Annual Joint Conference of the IEEE Computer and …, 1988
511988
Increased throughput for the testing and repair of RAMs with redundancy
RW Haddad, AT Dahbura, AB Sharma
IEEE Transactions on Computers, 154-166, 1991
471991
A fault-tolerant protocol for location directory maintenance in mobile networks
S Rangarajan, K Ratnam, AT Dahbura
Twenty-Fifth International Symposium on Fault-Tolerant Computing. Digest of …, 1995
401995
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