Anton Timothy Dahbura
Anton Timothy Dahbura
Associate Research Scientist, Johns Hopkins University
Verified email at jhu.edu
TitleCited byYear
A protocol test generation procedure
K Sabnani, A Dahbura
Computer Networks and ISDN systems 15 (4), 285-297, 1988
6011988
An optimization technique for protocol conformance test generation based on UIO sequences and rural Chinese postman tours
AV Aho, AT Dahbura, D Lee, MU Uyar
IEEE transactions on communications 39 (11), 1604-1615, 1991
5951991
The consensus problem in fault-tolerant computing
M Barborak, A Dahbura, M Malek
ACM Computing Surveys (CSur) 25 (2), 171-220, 1993
5241993
An 0(n2.5) Fault Identification Algorithm for Diagnosable Systems
AT Dahbura, GM Masson
IEEE Transactions on Computers, 486-492, 1984
3631984
On self-diagnosable multiprocessor systems: diagnosis by the comparison approach
A Sengupta, AT Dahbura
IEEE Transactions on Computers 41 (11), 1386-1396, 1992
3461992
Protocol conformance testing using multiple UIO sequences
YN Shen, F Lombardi, AT Dahbura
IEEE Transactions on Communications 40 (8), 1282-1287, 1992
1721992
The comparison approach to multiprocessor fault diagnosis
AT Dahbura, KK Sabnani, LL King
IEEE Transactions on Computers, 373-378, 1987
1401987
Formal methods for generating protocol conformance test sequences
AT Dahbura, KK Sabnani, MU Uyar
Proceedings of the IEEE 78 (8), 1317-1326, 1990
1211990
A distributed system-level diagnosis algorithm for arbitrary network topologies
S Rangarajan, AT Dahbura, EA Ziegler
IEEE Transactions on Computers 44 (2), 312-334, 1995
1141995
MoCCA: A mobile communication and computing architecture
A Smailagic, D Siewiorek, L Bass, B Iannucci, A Dahbura, S Eddleston, ...
Digest of Papers. Third International Symposium on Wearable Computers, 64-71, 1999
961999
Optimal test sequence generation for protocols: the Chinese postman algorithm applied to Q. 931
M▄ Uyar, AT Dahbura
Conformance testing methodologies and architectures for OSI protocols, 347-351, 1995
941995
Optimal test generation for finite state machine models
AT Dahbura, KK Sabnani, MU Uyar
US Patent 4,991,176, 1991
931991
A new technique for generating protocol test
K Sabnani, A Dahbura
ACM SIGCOMM Computer Communication Review 15 (4), 36-43, 1985
811985
System-level diagnosis: A perspective for the third decade
AT Dahbura
Concurrent Computations, 411-434, 1988
771988
An optimal test sequence for the JTAG/IEEE P1149. 1 test access port controller
AT Dahbura, MU Uyar, CW Yau
Proceedings.'Meeting the Tests of Time'., International Test Conference, 55-62, 1989
681989
Yield enhancement of programmable ASIC arrays by reconfiguration of circuit placements
J Narasimham, K Nakajima, CS Rim, AT Dahbura
IEEE transactions on computer-aided design of integrated circuits andá…, 1994
621994
Spare capacity as a means of fault detection and diagnosis in multiprocessor systems
AT Dahbura, KK Sabnani, WJ Hery
IEEE Transactions on Computers 38 (6), 881-891, 1989
511989
An experience in estimating fault coverage of a protocol test
A Dahbura, K Sabnani
IEEE INFOCOM'88, Seventh Annual Joint Conference of the IEEE Computer andá…, 1988
511988
Increased throughput for the testing and repair of RAMs with redundancy
RW Haddad, AT Dahbura, AB Sharma
IEEE Transactions on Computers 40 (2), 154-166, 1991
451991
A practical variation of the O (n 2.5) fault diagnosis algorithm
AT Dahbura, GM Masson
Proceedings of FTCS, 428-433, 1984
381984
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