Differential reflectivity of Si (111) 2× 1 surface with polarized light: a test for surface structure P Chiaradia, A Cricenti, S Selci, G Chiarotti Physical review letters 52 (13), 1145, 1984 | 264 | 1984 |
Classification of M1/M2-polarized human macrophages by label-free hyperspectral reflectance confocal microscopy and multivariate analysis AR Francesca R. Bertani, Pamela Mozetic, Marco Fioramonti, Michele Iuliani ... Scientific Reports 7 (8965), 8965-1 8965-9, 2017 | 230 | 2017 |
Surface differential reflectivity spectroscopy of semiconductor surfaces S Selci, F Ciccacci, G Chiarotti, P Chiaradia, A Cricenti Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 5 (3 …, 1987 | 121 | 1987 |
Molecular structure of DNA by scanning tunneling microscopy A Cricenti, S Selci, AC Felici, R Generosi, E Gori, W Djaczenko, ... Science 245 (4923), 1226-1227, 1989 | 100 | 1989 |
Polarization-dependent reflectivity of Si (111)-(2× 1) surface above the gap S Selci, P Chiaradia, F Ciccacci, A Cricenti, N Sparvieri, G Chiarotti Physical Review B 31 (6), 4096, 1985 | 84 | 1985 |
Surface states in Si (111) 2× 1 and Ge (111) 2× 1 by optical reflectivity S Nannarone, P Chiaradia, F Ciccacci, R Memeo, P Sassaroli, S Selci, ... Solid State Communications 33 (6), 593-595, 1980 | 82 | 1980 |
Electron-phonon interaction in optical absorption at the Si (111) 2× 1 surface F Ciccacci, S Selci, G Chiarotti, P Chiaradia Physical review letters 56 (22), 2411, 1986 | 80 | 1986 |
Preparation and characterization of tungsten tips for scanning tunneling microscopy A Cricenti, E Paparazzo, MA Scarselli, L Moretto, S Selci Review of scientific instruments 65 (5), 1558-1560, 1994 | 51 | 1994 |
Nanolithography: a borderland between STM, EB, IB, and X-ray lithographies M Gentili, C Giovannella, S Selci, ( Eds.) Springer, 1994 | 43* | 1994 |
Optical detection of surface states in GaAs (110) and GaP (110) P Chiaradia, G Chiarotti, F Ciccacci, R Memeo, S Nannarone, P Sassaroli, ... Surface Science 99 (1), 70-75, 1980 | 42 | 1980 |
The effect of surface states and band bending change on reflectivity of cleaved GaAs (110) and GaP (110) F Ciccacci, S Selci, G Chiarotti, P Chiaradia, A Cricenti Surface Science 168 (1-3), 28-34, 1986 | 41 | 1986 |
SERENA: particle instrument suite for determining the Sun-Mercury interaction from BepiColombo S Orsini, SA Livi, H Lichtenegger, S Barabash, A Milillo, E De Angelis, ... Space science reviews 217, 1-107, 2021 | 37 | 2021 |
Optical reflectance spectroscopy of ancient papers with discoloration or foxing M Missori, M Righini, S Selci Optics communications 231 (1-6), 99-106, 2004 | 37 | 2004 |
Polarization dependence of optical transitions in GaP (1 1 0) and GaAs (1 1 0) surfaces studied with surface differential reflectivity S Selci, F Ciccacci, A Cricenti, AC Felici, C Goletti, P Chiaradia Solid state communications 62 (12), 833-834, 1987 | 36 | 1987 |
Dielectric properties of the Si (111) 2× 1 surface: Optical constants and the energy-loss spectrum S Nannarone, S Selci Physical Review B 28 (10), 5930, 1983 | 34 | 1983 |
Position of the empty surface-state band on Si (111) 2× 1 A Cricenti, S Selci, KO Magnusson, B Reihl Physical Review B 41 (18), 12908, 1990 | 32 | 1990 |
Si (100) 1× 1-Sb and Si (100) 2× 1-Sb surfaces studied with angle-resolved photoemission and surface differential reflectivity A Cricenti, S Selci, AC Felici, L Ferrari, G Contini, G Chiarotti Physical Review B 47 (23), 15745, 1993 | 31 | 1993 |
Determination of the complex dielectric function of Si (111) 2× 1, GaAs (110) and GaP (110) surfaces by polarized surface differential reflectivity A Cricenti, S Selci, F Ciccacci, AC Felici, C Goletti, Z Yong, G Chiarotti Physica Scripta 38 (2), 199, 1988 | 30 | 1988 |
Imaging of single‐stranded DNA with the scanning tunneling microscope A Cricenti, S Selci, G Chiarotti, F Amaldi Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1991 | 27 | 1991 |
Dielectric functions of Si (111) 2× 1, Ge (111) 2× 1, GaAs (110) and GaP (110) surfaces obtained by polarized surface differential reflectivity S Selci, A Cricenti, F Ciccacci, AC Felici, C Goletti, Z Yong, G Chiarotti Surface Science 189, 1023-1027, 1987 | 25 | 1987 |