Quantitative mass and energy dispersive elastic recoil spectrometry: Resolution and efficiency considerations HJ Whitlow, G Possnert, CS Petersson Nuclear Instruments and Methods in Physics Research Section B: Beam …, 1987 | 214 | 1987 |
The Schottky‐barrier height of the contacts between some rare‐earth metals (and silicides) and p‐type silicon H Norde, J de Sousa Pires, F d’Heurle, F Pesavento, S Petersson, ... Applied Physics Letters 38 (11), 865-866, 1981 | 189 | 1981 |
Diffusion in intermetallic compounds with the CaF2 structure: A marker study of the formation of NiSi2 thin films F d’Heurle, S Petersson, L Stolt, B Strizker Journal of applied physics 53 (8), 5678-5681, 1982 | 162 | 1982 |
Formation of iridium silicides from Ir thin films on Si substrates S Petersson, J Baglin, W Hammer, F d’Heurle, TS Kuan, I Ohdomari, ... Journal of Applied Physics 50 (5), 3357-3365, 1979 | 132 | 1979 |
Monte Carlo simulation of electron transport in 4H–SiC using a two‐band model with multiple minima HE Nilsson, U Sannemo, CS Petersson Journal of applied physics 80 (6), 3365-3369, 1996 | 96 | 1996 |
Characterization of 3D thermal neutron semiconductor detectors J Uher, C Fröjdh, J Jakůbek, C Kenney, Z Kohout, V Linhart, S Parker, ... Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2007 | 85 | 2007 |
The formation of silicides in Mo-W Bilayer films on si substrates: A marker experiment J Baglin, J Dempsey, W Hammer, F d’Heurle, S Petersson, C Serrano Journal of Electronic Materials 8, 641-661, 1979 | 83 | 1979 |
Formation of wide and deep pores in silicon by electrochemical etching P Kleimann, J Linnros, S Petersson Materials Science and Engineering: B 69, 29-33, 2000 | 76 | 2000 |
Nucleation‐controlled thin‐film interactions: Some silicides R Anderson, J Baglin, J Dempsey, W Hammer, F d’Heurle, S Petersson Applied Physics Letters 35 (3), 285-287, 1979 | 70 | 1979 |
Studies of formation of silicides and their barrier heights to silicon KE Sundström, S Petersson, PA Tove physica status solidi (a) 20 (2), 653-668, 1973 | 69 | 1973 |
An alternative marker experiment in the formation of Mo and W silicides J Baglin, F d’Heurle, S Petersson Applied Physics Letters 33 (4), 289-290, 1978 | 66 | 1978 |
An interface—marker technique applied to the study of metal silicide growth JEE Baglin, FM d'Heurle, WN Hammer, S Petersson Nuclear Instruments and Methods 168 (1-3), 491-497, 1980 | 65 | 1980 |
Schottky-barrier behavior of metals on n- and p-type MO Aboelfotoh, C Fröjdh, CS Petersson physical Review B 67 (7), 075312, 2003 | 58 | 2003 |
The thin‐film formation of rhodium silicides S Petersson, R Anderson, J Baglin, J Dempsey, W Hammer, F d’Heurle, ... Journal of Applied Physics 51 (1), 373-382, 1980 | 57 | 1980 |
An X-ray imaging pixel detector based on scintillator filled pores in a silicon matrix P Kleimann, J Linnros, C Fröjdh, CS Petersson Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2001 | 54 | 2001 |
Schottky‐barrier height of iridium silicide I Ohdomari, KN Tu, FM d’Heurle, TS Kuan, S Petersson Applied Physics Letters 33 (12), 1028-1030, 1978 | 51 | 1978 |
Improvement of an X-ray imaging detector based on a scintillating guides screen X Badel, A Galeckas, J Linnros, P Kleimann, C Fröjdh, CS Petersson Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2002 | 50 | 2002 |
An X-ray imaging pixel detector based on a scintillating guides screen P Kleimann, J Linnros, C Frojdh, CS Petersson 1999 IEEE Nuclear Science Symposium. Conference Record. 1999 Nuclear Science …, 1999 | 48 | 1999 |
Observations of stresses in thin films of palladium and platinum silicides on silicon J Angilello, F d’Heurle, S Petersson, A Segmüller Journal of Vacuum Science and Technology 17 (1), 471-475, 1980 | 48 | 1980 |
IrSi1. 75 a new semiconductor compound S Petersson, JA Reimer, MH Brodsky, DR Campbell, F d’Heurle, ... Journal of Applied Physics 53 (4), 3342-3343, 1982 | 44 | 1982 |