Yi Jiang
Yi Jiang
Argonne National Laboratory
Verified email at cornell.edu
Title
Cited by
Cited by
Year
Electron ptychography of 2D materials to deep sub-ångström resolution
Y Jiang, Z Chen, Y Han, P Deb, H Gao, S Xie, P Purohit, MW Tate, J Park, ...
Nature 559 (7714), 343-349, 2018
2532018
Hierarchical porous polymer scaffolds from block copolymers
H Sai, KW Tan, K Hur, E Asenath-Smith, R Hovden, Y Jiang, M Riccio, ...
Science 341 (6145), 530-534, 2013
2342013
Transitions from near-surface to interior redox upon lithiation in conversion electrode materials
K He, HL Xin, K Zhao, X Yu, D Nordlund, TC Weng, J Li, Y Jiang, ...
Nano letters 15 (2), 1437-1444, 2015
902015
Connecting fuel cell catalyst nanostructure and accessibility using quantitative cryo-STEM tomography
E Padgett, N Andrejevic, Z Liu, A Kongkanand, W Gu, K Moriyama, ...
Journal of The Electrochemical Society 165 (3), F173, 2018
472018
Nanomaterial datasets to advance tomography in scanning transmission electron microscopy
BDA Levin, E Padgett, CC Chen, MC Scott, R Xu, W Theis, Y Jiang, ...
Scientific data 3 (1), 1-11, 2016
472016
Sub-1.4 eV bandgap inorganic perovskite solar cells with long-term stability
M Hu, M Chen, P Guo, H Zhou, J Deng, Y Yao, Y Jiang, J Gong, Z Dai, ...
Nature communications 11 (1), 1-10, 2020
422020
Breaking the Crowther limit: Combining depth-sectioning and tilt tomography for high-resolution, wide-field 3D reconstructions
R Hovden, P Ercius, Y Jiang, D Wang, Y Yu, HD Abruña, V Elser, ...
Ultramicroscopy 140, 26-31, 2014
322014
The velociprobe: An ultrafast hard x-ray nanoprobe for high-resolution ptychographic imaging
J Deng, C Preissner, JA Klug, S Mashrafi, C Roehrig, Y Jiang, Y Yao, ...
Review of Scientific Instruments 90 (8), 083701, 2019
282019
Influence of Fe Substitution into LaCoO3 Electrocatalysts on Oxygen-Reduction Activity
M Wang, B Han, J Deng, Y Jiang, M Zhou, M Lucero, Y Wang, Y Chen, ...
ACS applied materials & interfaces 11 (6), 5682-5686, 2019
232019
Tutorial on the Visualization of Volumetric Data Using tomviz
BDA Levin, Y Jiang, E Padgett, S Waldon, C Quammen, C Harris, ...
Microscopy Today 26 (1), 12-17, 2018
232018
Theory and practice of electron diffraction from single atoms and extended objects using an EMPAD
MC Cao, Y Han, Z Chen, Y Jiang, KX Nguyen, E Turgut, GD Fuchs, ...
Microscopy 67 (suppl_1), i150-i161, 2018
172018
Mixed-state electron ptychography enables sub-angstrom resolution imaging with picometer precision at low dose
Z Chen, M Odstrcil, Y Jiang, Y Han, MH Chiu, LJ Li, DA Muller
Nature communications 11 (1), 1-10, 2020
162020
Periodic artifact reduction in Fourier transforms of full field atomic resolution images
R Hovden, Y Jiang, HL Xin, LF Kourkoutis
Microscopy and Microanalysis 21 (2), 436-441, 2015
162015
Removing stripes, scratches, and curtaining with nonrecoverable compressed sensing
J Schwartz, Y Jiang, Y Wang, A Aiello, P Bhattacharya, H Yuan, Z Mi, ...
Microscopy and Microanalysis 25 (3), 705-710, 2019
102019
Repeatable and transferable processing for electron tomography: An open platform for visualization and reconstruction of 3d materials
R Hovden, MD Hanwell, U Ayachit, Y Jiang, R Maynard, DA Muller
Microscopy and Microanalysis 21 (S3), 2407-2408, 2015
82015
Sampling limits for electron tomography with sparsity-exploiting reconstructions
Y Jiang, E Padgett, R Hovden, DA Muller
Ultramicroscopy 186, 94-103, 2018
72018
Tomviz: open source platform connecting image processing pipelines to GPU accelerated 3D visualization
MD Hanwell, CJ Harris, A Genova, J Schwartz, Y Jiang, R Hovden
Microscopy and Microanalysis 25 (S2), 408-409, 2019
62019
Electron ptychography achieves atomic-resolution limits set by lattice vibrations
Z Chen, Y Jiang, YT Shao, ME Holtz, M Odstrčil, M Guizar-Sicairos, ...
Science 372 (6544), 826-831, 2021
52021
Advanced platform for 3D visualization, reconstruction, and segmentation with electron tomography
Y Jiang, MD Hanwell, E Padgett, S Waldon, DA Muller, R Hovden
Microscopy and Microanalysis 22 (S3), 2070-2071, 2016
52016
Compressed sensing, sparsity, and the reliability of tomographic reconstructions
Y Jiang, R Hovden, DA Muller, V Elser
Microscopy and Microanalysis 20 (S3), 796-797, 2014
42014
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Articles 1–20