Reji Thomas
TitleCited byYear
Emerging memories: resistive switching mechanisms and current status
DS Jeong, R Thomas, RS Katiyar, JF Scott, H Kohlstedt, A Petraru, ...
Reports on progress in physics 75 (7), 076502, 2012
Solid polymer electrolytes based on polyethylene oxide and lithium trifluoro-methane sulfonate (PEO–LiCF3SO3): Ionic conductivity and dielectric relaxation
NK Karan, DK Pradhan, R Thomas, B Natesan, RS Katiyar
Solid State Ionics 179 (19-20), 689-696, 2008
Optical and electrical properties of BaTiO3 thin films prepared by chemical solution deposition
R Thomas, DC Dube, MN Kamalasanan, S Chandra
Thin solid films 346 (1-2), 212-225, 1999
Multiferroic thin-film integration onto semiconductor devices
R Thomas, JF Scott, DN Bose, RS Katiyar
Journal of Physics: Condensed Matter 22 (42), 423201, 2010
Diffuse phase transitions, electrical conduction, and low temperature dielectric properties of sol–gel derived ferroelectric barium titanate thin films
R Thomas, VK Varadan, S Komarneni, DC Dube
Journal of Applied Physics 90 (3), 1480-1488, 2001
Electrochemical and structural investigations on ZnO treated 0.5 Li2MnO3-0.5 LiMn0. 5Ni0. 5O2 layered composite cathode material for lithium ion battery
G Singh, R Thomas, A Kumar, RS Katiyar, A Manivannan
Journal of the Electrochemical Society 159 (4), A470-A478, 2012
Electrochemical behavior of Cr-doped composite Li2MnO3-LiMn0. 5Ni0. 5O2 cathode materials
G Singh, R Thomas, A Kumar, RS Katiyar
Journal of The Electrochemical Society 159 (4), A410-A420, 2012
Structural, electrical, and magnetic properties of chemical solution deposited and thin films
NM Murari, R Thomas, RE Melgarejo, SP Pavunny, RS Katiyar
Journal of Applied Physics 106 (1), 014103, 2009
Guanidinate-stabilized monomeric hafnium amide complexes as promising precursors for MOCVD of HfO2
A Milanov, R Bhakta, A Baunemann, HW Becker, R Thomas, P Ehrhart, ...
Inorganic chemistry 45 (26), 11008-11018, 2006
Synthesis and electrochemical properties of Li (Ni0. 8Co0. 1Mn0. 1) O2 cathode material: Ex situ structural analysis by Raman scattering and X-ray diffraction at various stages …
JJ Saavedra-Arias, NK Karan, DK Pradhan, A Kumar, S Nieto, R Thomas, ...
Journal of Power Sources 183 (2), 761-765, 2008
Dysprosium scandate thin films as an alternate amorphous gate oxide prepared by metal-organic chemical vapor deposition
R Thomas, P Ehrhart, M Luysberg, M Boese, R Waser, M Roeckerath, ...
Applied physics letters 89 (23), 232902, 2006
Structural, electrical, and low-temperature dielectric properties of sol–gel derived thin films
R Thomas, DC Dube, MN Kamalasanan, S Chandra, AS Bhalla
Journal of applied physics 82 (9), 4484-4488, 1997
PZT (65/35) and PLZT (8/65/35) thin films by sol–gel process: a comparative study on the structural, microstructural and electrical properties
R Thomas, S Mochizuki, T Mihara, T Ishida
Thin Solid Films 443 (1-2), 14-22, 2003
Comparison of precursors for pulsed metal–organic chemical vapor deposition of HfO2 high-K dielectric thin films
AR Teren, R Thomas, J He, P Ehrhart
Thin Solid Films 478 (1-2), 206-217, 2005
Optical properties of sol–gel processed amorphous and crystalline SrTiO3 thin films
R Thomas, DC Dube
Japanese Journal of Applied Physics 39 (4R), 1771, 2000
Reduced leakage current in chemical solution deposited multiferroic heterostructured thin films on platinized silicon substrates
NM Murari, A Kumar, R Thomas, RS Katiyar
Applied Physics Letters 92 (13), 132904, 2008
Liquid injection MOCVD of dysprosium scandate films deposition characteristics and high-k applications
R Thomas, P Ehrhart, M Roeckerath, S van Elshocht, E Rije, M Luysberg, ...
Journal of The Electrochemical Society 154 (7), G147-G154, 2007
thin films for high- dielectric applications grown by chemical vapor deposition on different substrates
S Regnery, R Thomas, P Ehrhart, R Waser
Journal of applied physics 97 (7), 073521, 2005
Extended technique for complex permittivity measurement of dielectric films in the microwave region
R Thomas, DC Dube
Electronics Letters 33 (3), 218-220, 1997
Effect of substrate temperature on the crystallization of Pb (Zr, Ti) O3 films on Pt/Ti/Si substrates prepared by radio frequency magnetron sputtering with a stoichiometric …
R Thomas, S Mochizuki, T Mihara, T Ishida
Materials Science and Engineering: B 95 (1), 36-42, 2002
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Articles 1–20