| Annealing shallow Si/SiO2 interface traps in electron-beam irradiated high-mobility metal-oxide-silicon transistors JS Kim, AM Tyryshkin, SA Lyon Applied Physics Letters 110, 123505, 2017 | 48 | 2017 |
| Quantum advantage for computations with limited space D Maslov, JS Kim, S Bravyi, TJ Yoder, S Sheldon Nature Physics 17 (8), 894-897, 2021 | 42 | 2021 |
| Quantum-enhanced markov chain Monte Carlo D Layden, G Mazzola, RV Mishmash, M Motta, P Wocjan, JS Kim, ... Nature 619 (7969), 282-287, 2023 | 26 | 2023 |
| In-situ measurements of the secondary electron yield in an accelerator environment: Instrumentation and methods WH Hartung, DM Asner, JV Conway, CA Dennett, S Greenwald, JS Kim, ... Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2015 | 23 | 2015 |
| Measurements of secondary electron yield of metal surfaces and films with exposure to a realistic accelerator environment W Hartung, J Conway, C Dennett, S Greenwald, JS Kim, Y Li, T Moore, ... Proc. IPAC, 3493-3495, 2013 | 16 | 2013 |
| A low-disorder metal-oxide-silicon double quantum dot JS Kim, TM Hazard, AA Houck, SA Lyon Applied Physics Letters 114 (4), 2019 | 15 | 2019 |
| Hardware-efficient random circuits to classify noise in a multi-qubit system JS Kim, LS Bishop, AD Corcoles, S Merkel, JA Smolin, S Sheldon Phys. Rev. A 104, 022609, 2021 | 13 | 2021 |
| The CESR Test Accelerator Electron Cloud Research Program Phase I Report MA Palmer | 11 | 2014 |
| In situ SEY measurements at CesrTA J Kim, D Asner, J Conway, S Greenwald, Y Li, V Medjidzade, T Moore, ... Proceedings of ECLOUD, 140-146, 2010 | 9 | 2010 |
| In situ secondary electron yield measurement system at CesrTA J Kim, D Asner, J Conway, S Greenwald, Y Li, V Medjidzade, T Moore, ... Proceedings of the 2011 Particle Accelerator Conference, New York, NY, 1253-1255, 2011 | 8 | 2011 |
| Report on instrumentation and methods for in-situ measurements of the secondary electron yield in an accelerator environment WH Hartung, DM Asner, JV Conway, CA Dennett, S Greenwald, JS Kim, ... arXiv preprint arXiv:1407.0772, 2014 | 3 | 2014 |
| Instrumentation and methods for in-situ measurements of the secondary electron yield in an accelerator environment W Hartung, D Asner, J Conway, C Dennett, S Greenwald, JS Kim, Y Li, ... arXiv preprint arXiv:1407.0772, 0 | 2 | |
| The generative quantum eigensolver (GQE) and its application for ground state search K Nakaji, LB Kristensen, JA Campos-Gonzalez-Angulo, MG Vakili, ... arXiv preprint arXiv:2401.09253, 2024 | | 2024 |
| Development and Characterization of Low-Disorder Metal-Oxide-Silicon Quantum Dot Devices JS Kim Princeton University, 2018 | | 2018 |
| Electron Spin Resonance Characterization of Damage and Recovery of Si/SiO2 Interfaces from Electron Beam Lithography JS Kim, A Tyryshkin, S Lyon APS March Meeting Abstracts 2016, L45. 009, 2016 | | 2016 |
| Electron spins at metal-oxide-silicon interfaces SAL Jin-Sung Kim, R.M. Jock, A.M. Tyryshkin APS Meeting Abstracts, 2014 | | 2014 |
