philippe galy
Title
Cited by
Cited by
Year
First demonstration of a full 28nm high-k/metal gate circuit transfer from Bulk to UTBB FDSOI technology through hybrid integration
D Golanski, P Fonteneau, C Fenouillet-Beranger, A Cros, F Monsieur, ...
2013 Symposium on VLSI Circuits, T124-T125, 2013
312013
Structure for protecting an integrated circuit against electrostatic discharges
P Galy, C Entringer, J Bourgeat
US Patent 8,331,069, 2012
282012
Extended Analysis of the -FET: Operation as Capacitorless eDRAM
C Navarro, J Lacord, MS Parihar, F Adamu-Lema, M Duan, N Rodriguez, ...
IEEE Transactions on Electron Devices 64 (11), 4486-4491, 2017
272017
A review of the Z2-FET 1T-DRAM memory: Operation mechanisms and key parameters
S Cristoloveanu, KH Lee, MS Parihar, H El Dirani, J Lacord, S Martinie, ...
Solid-State Electronics 143, 10-19, 2018
252018
BIMOS transistor and its applications in ESD protection in advanced CMOS technology
P Galy, J Jimenez, J Bourgeat, A Dray, G Troussier, B Heitz, N Guitard, ...
2012 IEEE International Conference on IC Design & Technology, 1-4, 2012
252012
28nm Fully-depleted SOI technology: Cryogenic control electronics for quantum computing
H Bohuslavskyi, S Barraud, M CassÚ, V Barrai, B Bertrand, L Hutin, ...
2017 Silicon Nanoelectronics Workshop (SNW), 143-144, 2017
242017
Cryogenic temperature characterization of a 28-nm FD-SOI dedicated structure for advanced CMOS and quantum technologies co-integration
P Galy, JC Lemyre, P Lemieux, F Arnaud, D Drouin, M Pioro-Ladriere
IEEE Journal of the Electron Devices Society 6, 594-600, 2018
232018
-FET as Capacitor-Less eDRAM Cell For High-Density Integration
C Navarro, M Duan, MS Parihar, F Adamu-Lema, S Coseman, J Lacord, ...
IEEE Transactions on Electron Devices 64 (12), 4904-4909, 2017
232017
Experimental investigation of ESD design window for fully depleted SOI N-MOSFETs
T Benoist, C Fenouillet-Beranger, P Perreau, C Buj, P Galy, ...
Microelectronic engineering 88 (7), 1276-1279, 2011
222011
Evidence of supercoupling effect in ultrathin silicon layers using a four-gate MOSFET
S Cristoloveanu, S Athanasiou, M Bawedin, P Galy
IEEE Electron Device Letters 38 (2), 157-159, 2016
212016
Ultrasonic surgical dental tool and method of making same
T Hickok
US Patent App. 10/211,201, 2004
212004
Electronic device, in particular for protection against electrostatic discharges, and method for protecting a component against electrostatic discharges
J Bourgeat, C Entringer, P Galy, J Jimenez
US Patent 9,019,666, 2015
182015
Experimental Demonstration of Operational Z2-FET Memory Matrix
S Navarro, C Navarro, C Marquez, H El Dirani, P Galy, M Bawedin, ...
IEEE Electron Device Letters 39 (5), 660-663, 2018
172018
Local ESD protection structure based on silicon controlled rectifier achieving very low overshoot voltage
J Bourgeat, C Entringer, P Galy, P Fonteneau, M Bafleur
2009 31st EOS/ESD Symposium, 1-8, 2009
172009
ESD design challenges in 28nm hybrid FDSOI/Bulk advanced CMOS process
A Dray, N Guitard, P Fonteneau, D Golanski, C Fenouillet-Beranger, ...
Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2012, 1-7, 2012
162012
Cryogenic characterization of 28-nm FD-SOI ring oscillators with energy efficiency optimization
H Bohuslavskyi, S Barraud, V Barral, M CassÚ, L Le Guevel, L Hutin, ...
IEEE Transactions on Electron Devices 65 (9), 3682-3688, 2018
152018
Circuit for protecting an integrated circuit against elctrostatic discharges in CMOS technology
P Galy, C Entringer, A Dray
US Patent 8,164,871, 2012
152012
Computation of self-induced magnetic field effects including the lorentz force for fast-transient phenomena in integrated-circuit devices
W Schoenmaker, Q Chen, P Galy
IEEE Transactions on Computer-Aided Design of Integrated Circuits andá…, 2014
142014
Numerical evaluation between Transmission Line Pulse (TLP) and Average Current Slope (ACS) of a submicron gg-nMOS transistor under Electrostatic Discharge (ESD)
P Galy, V Berland, B Foucher, A Guillaume
Workshop EOS/ESD/EMI, LAAS-CNRS Toulouse, 15-17, 2002
142002
The ideal NPN vertical BIMOS transistor analytical model simulation and experimental results of the collector current
P Galy, V Berland
International journal of electronics 81 (5), 501-516, 1996
141996
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Articles 1–20