| Enhancement in Thermoelectric Figure of Merit in Nanostructured Bi2Te3 with Semimetal Nanoinclusions S Sumithra, NJ Takas, DK Misra, WM Nolting, PFP Poudeu, KL Stokes Advanced Energy Materials 1 (6), 1141-1147, 2011 | 211 | 2011 |
| Correlation between microstructure and drastically reduced lattice thermal conductivity in bismuth telluride/bismuth nanocomposites for high thermoelectric figure of merit DK Misra, S Sumithra, NS Chauhan, WM Nolting, PFP Poudeu, KL Stokes Materials Science in Semiconductor Processing 40, 453-462, 2015 | 16 | 2015 |
| Effect of NiTe Nanoinclusions on Thermoelectric Properties of Bi2Te3 S Sumithra, NJ Takas, WM Nolting, S Sapkota, PFP Poudeu, KL Stokes Journal of electronic materials 41, 1401-1407, 2012 | 15 | 2012 |
| Adv. Energy Mater. 1, 1141 (2011) S Sumithra, NJ Takas, DK Misra, WM Nolting, PFP Poudeu, KL Stokes | 9 | |
| Detection of silicide formation in nanoscale visualization of interface electrostatics W Nolting, C Durcan, VP LaBella Applied Physics Letters 110 (14), 2017 | 8 | 2017 |
| Nanoscale Schottky barrier mapping of thermally evaporated and sputter deposited W/Si (001) diodes using ballistic electron emission microscopy W Nolting, C Durcan, AJ Narasimham, VP LaBella Journal of Vacuum Science & Technology B 34 (4), 2016 | 7 | 2016 |
| Effect of Sn Substitution on the Thermoelectric Properties of Nanostructured Bulk Bi2-xSbxTe3 Alloy. S Santhanam, NJ Takas, WM Nolting, PFP Poudeu, KL Stokes MRS Online Proceedings Library 1329, 1-6, 2011 | 5 | 2011 |
| Adv. Energy Mater. 1, 1141–1147 (2011) S Sumithra, NJ Takas, DK Misra, WM Nolting, PFP Poudeu, KL Stokes | 5 | |
| Nanoscale Schottky barrier visualization utilizing computational modeling and ballistic electron emission microscopy W Nolting, C Durcan, S Gassner, J Goldberg, R Balsano, VP LaBella Journal of Applied Physics 123 (24), 2018 | 4 | 2018 |
| Effects of electrical bias and temperature stress on the negative magnetoresistance of a low-k dielectric BT McGowan, WM Nolting, JR Lloyd Journal of Applied Physics 118 (22), 2015 | 3 | 2015 |
| Visualizing metal/HfO2/SiO2/Si (001) interface electrostatic barrier heights with ballistic hole emission microscopy J Rogers, H Choi, S Gassner, W Nolting, D Pennock, S Consiglio, ... Journal of Applied Physics 126 (19), 2019 | 2 | 2019 |
| Determination of the energetic resolution of Schottky barrier visualization via interface band structure and parallel momentum conservation J Rogers, W Nolting, C Durcan, R Balsano, VP LaBella AIP Advances 11 (2), 2021 | 1 | 2021 |
| The Role of Nanoparticle Inclusions on High-performance half-Heusler Thermoelectric Materials R Yaqub, PS Sahoo, JP Makongo, WM Notling, PFP Poudeu, KL Stokes MRS Online Proceedings Library (OPL) 1267, 1267-DD05-18, 2010 | 1 | 2010 |
| The Effects of Ionized Impurities on the Nanoscale Spatial Distribution of the Schottky Barrier S Gassner, J Rogers, H Choi, W Nolting, V Labella APS March Meeting Abstracts 2019, G70. 044, 2019 | | 2019 |
| Comparison of Capacitance-Voltage, Current-Voltage, and BEEM Measurements of Metal-Graphene-Semiconductor Schottky Barrier Heights H Choi, J Rogers, S Gassner, W Nolting, V Labella APS March Meeting Abstracts 2019, G70. 059, 2019 | | 2019 |
| Visualizing the Electrostatic Barrier of a Material Interface to Nanoscale Dimensions: Defects, Silicides, and Dielectrics W Nolting, J Rogers, S Gassner, H Choi, V Labella APS March Meeting Abstracts 2019, K23. 007, 2019 | | 2019 |
| Nanoscale Visualization of the Au/HfO2/Si (001) Interface Electrostatics with BEEM J Rogers, D Pennock, H Choi, S Gassner, W Nolting, V Labella APS March Meeting Abstracts 2019, L46. 011, 2019 | | 2019 |
| Nanoscale Visualization of Schottky Barrier Interfaces with Ballistic Electron Emission Microscopy W Nolting, J Rogers, S Gassner, D Pennock, J Goldberg, V LaBella APS March Meeting Abstracts 2018, R01. 006, 2018 | | 2018 |
| BEEMfit: Ballistic Electron Emission Microscopy Spectra Fitting for Schottky Barrier Visualization V LaBella, W Nolting APS March Meeting Abstracts 2017, K35. 013, 2017 | | 2017 |
| Signatures of Silicide Formation in Measurements of Nanoscale Interface Electrostatics with BEEM W Nolting, C Durcan, V LaBella APS March Meeting Abstracts 2017, K35. 012, 2017 | | 2017 |
Ferdinand PoudeuProfessor of Materials Science and Engineering, University of MichiganVerified email at umich.edu
