| Negative oxygen vacancies in as charge traps in high- stacks JL Gavartin, D Muņoz Ramo, AL Shluger, G Bersuker, BH Lee Applied Physics Letters 89 (8), 082908, 2006 | 273 | 2006 |
| Trapping, self-trapping and the polaron family AM Stoneham, J Gavartin, AL Shluger, AV Kimmel, DM Ramo, ... Journal of Physics: Condensed Matter 19 (25), 255208, 2007 | 199 | 2007 |
| Spectroscopic properties of oxygen vacancies in monoclinic Hf O 2 calculated with periodic and embedded cluster density functional theory DM Ramo, JL Gavartin, AL Shluger, G Bersuker Physical Review B 75 (20), 205336, 2007 | 199 | 2007 |
| The role of nitrogen-related defects in high- dielectric oxides: Density-functional studies JL Gavartin, AL Shluger, AS Foster, GI Bersuker Journal of Applied Physics 97 (5), 053704, 2005 | 168 | 2005 |
| Theoretical prediction of intrinsic self-trapping of electrons and holes in monoclinic HfO 2 DM Ramo, AL Shluger, JL Gavartin, G Bersuker Physical review letters 99 (15), 155504, 2007 | 155 | 2007 |
| Electronic properties of structural defects at the MgO (001) surface PV Sushko, JL Gavartin, AL Shluger The Journal of Physical Chemistry B 106 (9), 2269-2276, 2002 | 142 | 2002 |
| Defects in microelectronic materials and devices DM Fleetwood, RD Schrimpf CRC press, 2008 | 119 | 2008 |
| Structural, electronic and vibrational properties of tetragonal zirconia under pressure: a density functional theory study V Milman, A Perlov, K Refson, SJ Clark, J Gavartin, B Winkler Journal of Physics: Condensed Matter 21 (48), 485404, 2009 | 103 | 2009 |
| Modeling charge self-trapping in wide-gap dielectrics: Localization problem in local density functionals JL Gavartin, PV Sushko, AL Shluger Physical review B 67 (3), 035108, 2003 | 92 | 2003 |
| Oxide muonics: II. Modelling the electrical activity of hydrogen in wide-gap and high-permittivity dielectrics SFJ Cox, JL Gavartin, JS Lord, SP Cottrell, JM Gil, HV Alberto, JP Duarte, ... Journal of Physics: Condensed Matter 18 (3), 1079, 2006 | 79 | 2006 |
| Predicting Drug Substances Autoxidation P Lienard, J Gavartin, G Boccardi, M Meunier Pharmaceutical Research 32 (1), 300-310, 2014 | 75 | 2014 |
| Interfacial oxide growth at silicon∕high- oxide interfaces: First principles modeling of the interface MH Hakala, AS Foster, JL Gavartin, P Havu, MJ Puska, RM Nieminen Journal of applied physics 100 (4), 043708, 2006 | 67 | 2006 |
| Ab initio modeling of structure and defects at the HfO2/Si interface JL Gavartin, L Fonseca, G Bersuker, AL Shluger Microelectronic Engineering 80, 412-415, 2005 | 60 | 2005 |
| Lattice relaxation and charge-transfer optical transitions due to self-trapped holes in nonstoichiometric LaMnO3 crystal NN Kovaleva, JL Gavartin, AL Shluger, AV Boris, AM Stoneham Journal of Experimental and Theoretical Physics 94 (1), 178-190, 2002 | 51 | 2002 |
| Oxygen vacancies in cubic ZrO 2 nanocrystals studied by an ab initio embedded cluster method DM Ramo, PV Sushko, JL Gavartin, AL Shluger Physical Review B 78 (23), 235432, 2008 | 46 | 2008 |
| Calculation of adiabatic barriers for cation diffusion in Li2O and LiCl crystals JL Gavartin, CRA Catlow, AL Shluger, AN Varaksin, YN Kolmogorov Modelling and Simulation in Materials Science and Engineering 1 (1), 29, 1992 | 45 | 1992 |
| The oxide gate dielectric: do we know all we should? AM Stoneham, JL Gavartin, AL Shluger Journal of Physics: Condensed Matter 17 (21), S2027, 2005 | 32 | 2005 |
| Modeling hfo2/sio2/si interface JL Gavartin, AL Shluger Microelectronic engineering 84 (9-10), 2412-2415, 2007 | 31 | 2007 |
| Nano and Giga Challenges in Microelectronics AL Shluger, AS Foster, JL Gavartin, PV Sushko Greer, J, 151, 2003 | 25 | 2003 |
| Mechanism of charge trapping reduction in scaled high-κ gate stacks G Bersuker, BH Lee, HR Huff, J Gavartin, A Shluger Defects in High-k Gate Dielectric Stacks, 227-236, 2006 | 23 | 2006 |
