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Jacob Seifert
Jacob Seifert
Postdoctoral researcher at Nanophotonics group, Utrecht University, The Netherlands
Verified email at uu.nl
Title
Cited by
Cited by
Year
Optimizing illumination for precise multi-parameter estimations in coherent diffractive imaging
D Bouchet, J Seifert, AP Mosk
Optics Letters 46 (2), 254-257, 2021
162021
Efficient and flexible approach to ptychography using an optimization framework based on automatic differentiation
J Seifert, D Bouchet, L Loetgering, AP Mosk
OSA Continuum 4 (1), 121-128, 2021
142021
Maximum-likelihood estimation in ptychography in the presence of Poisson–Gaussian noise statistics
J Seifert, Y Shao, R Van Dam, D Bouchet, T Van Leeuwen, AP Mosk
Optics Letters 48 (22), 6027-6030, 2023
92023
Wavelength-multiplexed multi-mode EUV reflection ptychography based on automatic differentiation
Y Shao, S Weerdenburg, J Seifert, HP Urbach, AP Mosk, W Coene
Light: Science & Applications 13 (1), 196, 2024
82024
Noise-robust latent vector reconstruction in ptychography using deep generative models
J Seifert, Y Shao, AP Mosk
Optics Express 32 (1), 1020-1033, 2023
42023
Sensor fusion in ptychography
K Maathuis, J Seifert, AP Mosk
Optics Continuum 1 (9), 1909-1917, 2022
22022
Illumination diversity in multiwavelength extreme ultraviolet ptychography
A Pelekanidis, F Zhang, M Gouder, J Seifert, M Du, KSE Eikema, S Witte
Photonics Research 12 (12), 2757-2771, 2024
2024
Characterizing post-compression of mJ-level ultrafast pulses via loose focusing in a gas cell
F Zhang, A Pelekanidis, A Karpavicius, M Gouder, J Seifert, K Eikema, ...
Optics Express 32 (23), 40990-41003, 2024
2024
EUV imaging of nanostructures without lenses
W Coene, Y Shao, S Weerdenburg, S Senhorst, R Horsten, HP Urbach, ...
UV and Higher Energy Photonics: From Materials to Applications 2024 13115, 22-25, 2024
2024
Differentiable Modeling for Computational Imaging
J Seifert
Utrecht University, 2024
2024
Illumination diversity in multi-wavelength extreme ultraviolet ptychography
S Witte, A Pelekanidis, F Zhang, M Gouder, J Seifert, M Du, K Eikema
Optica Open, 2024
2024
Maximum-likelihood estimation in ptychography in the presence of Poisson–Gaussian noise statistics: publisher’s note
J Seifert, Y Shao, R Van Dam, D Bouchet, T Van Leeuwen, AP Mosk
Optics Letters 48 (23), 6291-6291, 2023
2023
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