Luca Sterpone
Luca Sterpone
Verified email at polito.it
TitleCited byYear
Microvesicles derived from adult human bone marrow and tissue specific mesenchymal stem cells shuttle selected pattern of miRNAs
F Collino, MC Deregibus, S Bruno, L Sterpone, G Aghemo, L Viltono, ...
PloS one 5 (7), e11803, 2010
5382010
On the optimal design of triple modular redundancy logic for SRAM-based FPGAs
FL Kastensmidt, L Sterpone, L Carro, MS Reorda
Proceedings of the conference on Design, Automation and Test in Europe …, 2005
2402005
A new reliability-oriented place and route algorithm for SRAM-based FPGAs
L Sterpone, M Violante
IEEE Transactions on Computers 55 (6), 732-744, 2006
1562006
Analysis of the robustness of the TMR architecture in SRAM-based FPGAs
L Sterpone, M Violante
IEEE Transactions on Nuclear Science 52 (5), 1545-1549, 2005
1272005
A new partial reconfiguration-based fault-injection system to evaluate SEU effects in SRAM-based FPGAs
L Sterpone, M Violante
IEEE Transactions on Nuclear Science 54 (4), 965-970, 2007
1112007
A new analytical approach to estimate the effects of SEUs in TMR architectures implemented through SRAM-based FPGAs
L Sterpone, M Violante
IEEE Transactions on Nuclear Science 52 (6), 2217-2223, 2005
1032005
A new hardware/software platform and a new 1/E neutron source for soft error studies: Testing FPGAs at the ISIS facility
M Violante, L Sterpone, A Manuzzato, S Gerardin, P Rech, M Bagatin, ...
IEEE Transactions on Nuclear Science 54 (4), 1184-1189, 2007
932007
On the evaluation of SEU sensitiveness in SRAM-based FPGAs
P Bernardi, MS Reorda, L Sterpone, M Violante
Proceedings. 10th IEEE International On-Line Testing Symposium, 115-120, 2004
692004
Simulation-based analysis of SEU effects in SRAM-based FPGAs
M Violante, L Sterpone, M Ceschia, D Bortolato, P Bernardi, MS Reorda, ...
IEEE Transactions on Nuclear science 51 (6), 3354-3359, 2004
552004
Reconfigurable field programmable gate arrays for mission-critical applications
N Battezzati, L Sterpone, M Violante
Springer Science & Business Media, 2010
462010
Multiple errors produced by single upsets in FPGA configuration memory: a possible solution
MS Reorda, L Sterpone, M Violante
European Test Symposium (ETS'05), 136-141, 2005
462005
Using benchmarks for radiation testing of microprocessors and FPGAs
H Quinn, WH Robinson, P Rech, M Aguirre, A Barnard, M Desogus, ...
IEEE Transactions on Nuclear Science 62 (6), 2547-2554, 2015
392015
An analysis based on fault injection of hardening techniques for SRAM-based FPGAs
L Sterpone, M Violante, S Rezgui
IEEE Transactions on Nuclear Science 53 (4), 2054-2059, 2006
382006
New techniques for improving the performance of the lockstep architecture for SEEs mitigation in FPGA embedded processors
F Abate, L Sterpone, CA Lisboa, L Carro, M Violante
IEEE Transactions on Nuclear Science 56 (4), 1992-2000, 2009
372009
On the design of tunable fault tolerant circuits on sram-based fpgas for safety critical applications
L Sterpone, M Aguirre, J Tombs, H Guzman-Miranda
2008 Design, Automation and Test in Europe, 336-341, 2008
372008
Experimental validation of a tool for predicting the effects of soft errors in SRAM-based FPGAs
L Sterpone, M Violante, RH Sorensen, D Merodio, F Sturesson, ...
IEEE Transactions on Nuclear Science 54 (6), 2576-2583, 2007
362007
A novel fault tolerant and runtime reconfigurable platform for satellite payload processing
L Sterpone, M Porrmann, J Hagemeyer
IEEE transactions on computers 62 (8), 1508-1525, 2013
352013
An analytical model of the propagation induced pulse broadening (PIPB) effects on single event transient in flash-based FPGAs
L Sterpone, N Battezzati, FL Kastensmidt, R Chipana
IEEE Transactions on Nuclear science 58 (5), 2333-2340, 2011
342011
Analysis of SET propagation in flash-based FPGAs by means of electrical pulse injection
L Sterpone, N Battezzati, V Ferlet-Cavrois
IEEE Transactions on Nuclear Science 57 (4), 1820-1826, 2010
322010
Coping with the obsolescence of safety-or mission-critical embedded systems using FPGAs
H Guzman-Miranda, L Sterpone, M Violante, MA Aguirre, ...
IEEE Transactions on Industrial Electronics 58 (3), 814-821, 2010
322010
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