alvise bagolini
alvise bagolini
Mr.
Verified email at fbk.eu
TitleCited byYear
Prototype ATLAS IBL modules using the FE-I4A front-end readout chip
Atlas Ibl Collaboration
Journal of Instrumentation 7 (11), P11010, 2012
1592012
Polyimide sacrificial layer and novel materials for post-processing surface micromachining
A Bagolini, L Pakula, TLM Scholtes, HTM Pham, PJ French, PM Sarro
Journal of Micromechanics and Microengineering 12 (4), 385, 2002
1072002
Stress characterization of electroplated gold layers for low temperature surface micromachining
B Margesin, A Bagolini, V Guarnieri, F Giacomozzi, A Faes, R Pal, ...
Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS 2003 …, 2003
632003
Development of double-sided full-passing-column 3D sensors at FBK
G Giacomini, A Bagolini, M Boscardin, GF Dalla Betta, F Mattedi, M Povoli, ...
IEEE Transactions on Nuclear Science 60 (3), 2357-2366, 2013
552013
Slim edges in double-sided silicon 3D detectors
M Povoli, A Bagolini, M Boscardin, GF Dalla Betta, G Giacomini, ...
Journal of Instrumentation 7 (01), C01015, 2012
522012
Rib waveguides for mid-infrared silicon photonics
MM Milošević, PS Matavulj, PY Yang, A Bagolini, GZ Mashanovich
JOSA B 26 (9), 1760-1766, 2009
442009
Stress and resistivity analysis of electrodeposited gold films for MEMS application
S Kal, A Bagolini, B Margesin, M Zen
Microelectronics journal 37 (11), 1329-1334, 2006
352006
Fabrication of novel MEMS microgrippers by deep reactive ion etching with metal hard mask
A Bagolini, S Ronchin, P Bellutti, M Chistè, M Verotti, NP Belfiore
Journal of Microelectromechanical Systems 26 (4), 926-934, 2017
342017
Development of micro-grippers for tissue and cell manipulation with direct morphological comparison
R Cecchi, M Verotti, R Capata, A Dochshanov, G Broggiato, R Crescenzi, ...
Micromachines 6 (11), 1710-1728, 2015
312015
PECVD low stress silicon nitride analysis and optimization for the fabrication of CMUT devices
A Bagolini, AS Savoia, A Picciotto, M Boscardin, P Bellutti, N Lamberti, ...
Journal of Micromechanics and Microengineering 25 (1), 015012, 2014
302014
⟨ 1 0 0⟩ bar corner compensation for CMOS compatible anisotropic TMAH etching
R Mukhiya, A Bagolini, B Margesin, M Zen, S Kal
Journal of micromechanics and microengineering 16 (11), 2458, 2006
302006
Development of edgeless n-on-p planar pixel sensors for future ATLAS upgrades
M Bomben, A Bagolini, M Boscardin, L Bosisio, G Calderini, J Chauveau, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2013
262013
Seismic velocity sensor with an internal sky-hook damping feedback loop
P Gardonio, M Gavagni, A Bagolini
IEEE Sensors Journal 8 (11), 1776-1784, 2008
262008
Development of planar detectors with active edge
M Povoli, A Bagolini, M Boscardin, GF Dalla Betta, G Giacomini, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2011
252011
Simulation and construction of a MEMS CSFH based microgripper
NP Belfiore, G Broggiato, M Verotti, M Balucani, R Crescenzi, A Bagolini, ...
Int. J. Mech. Control 16 (1), 21-30, 2015
242015
Wideband mechanical response of a high-Q silicon double-paddle oscillator
A Borrielli, M Bonaldi, E Serra, A Bagolini, L Conti
Journal of Micromechanics and Microengineering 21 (6), 065019, 2011
222011
New MEMS tweezers for the viscoelastic characterization of soft materials at the microscale
P Di Giamberardino, A Bagolini, P Bellutti, I Rudas, M Verotti, F Botta, ...
Micromachines 9 (1), 15, 2018
212018
3D-FBK pixel sensors: Recent beam tests results with irradiated devices
A Micelli, K Helle, H Sandaker, B Stugu, M Barbero, F Hügging, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2011
212011
Development of modified 3D detectors at FBK
GF Dalla Betta, A Bagolini, M Boscardin, L Bosisio, P Gabos, G Giacomini, ...
IEEE Nuclear Science Symposuim & Medical Imaging Conference, 382-387, 2010
212010
Enhancement of RF-MEMS switch reliability through an active anti-stiction heat-based mechanism
J Iannacci, A Repchankova, A Faes, A Tazzoli, G Meneghesso, ...
Microelectronics Reliability 50 (9-11), 1599-1603, 2010
212010
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