Francisco Yubero

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Agustin R. Gonzalez-ElipeResearch Professor of CSIC at the Instituto de Ciencia de Mataeriales de SevillaVerified email at icmse.csic.es
Sven TougaardProfessor of physics, University of Southern DenmarkVerified email at sdu.dk
Angel BarrancoSenior Scientist, CSIC, Instituto de Ciencia de Materiales de Sevilla (ICMS-CSIC-US)Verified email at csic.es
Jorge Gil-RostraICMSE-CSICVerified email at icmse.csic.es
José Cotrino BautistaUniversidad de SevillaVerified email at us.es
Juan Pedro HolgadoConsejo Superior de Investigaciones CIentíficasVerified email at icmse.csic.es
Sanz JMretired Applied Physics Department Universidad Autónoma de MadridVerified email at uam.es
Carmen López SantosUniversidad de Sevilla / Instituto de Ciencia de Materiales de SevillaVerified email at us.es
Ana BorrásSevilla, Thun, CSIC, EMPAVerified email at icmse.csic.es
Alfonso CaballeroUniversidad de SevillaVerified email at us.es
Rafael AlvarezDepartamento de Física Aplicada I. Escuela Politécnica Superior. Universidad de Sevilla.Verified email at us.es
Puértolas JAProfessor of Materials Science and Technology. Universidad de ZaragozaVerified email at unizar.es
Leonardo SorianoProfessor in Applied PhysicsVerified email at uam.es
Marco FinazziProfessor of Physics, Physics Department - Politecnico di Milano, ItalyVerified email at fisi.polimi.it
Alberto PalmeroPhD in Physics. Tenured Researcher at CSICVerified email at csic.es
Pablo Romero-GómezUniversity of MalagaVerified email at uma.es
maurizio sacchiCNRS - Institut des NanoSciences de ParisVerified email at synchrotron-soleil.fr
Alejandro GutierrezProfessor of Applied Physics, Universidad Autonoma de MadridVerified email at uam.es
Javier MéndezInstituto Ciencia de Materiales de MadridVerified email at icmm.csic.es
Jaime Esteban MorenoClinical microbiologistVerified email at fjd.es

Francisco Yubero

Tenured scientist

Verified email at icmse.csic.es

electron spectroscopy surface science thin films


Title Sort by citations Sort by year Sort by title	Cited by Cited by	Year
Model for quantitative analysis of reflection-electron-energy-loss spectra F Yubero, S Tougaard Physical Review B 46 (4), 2486, 1992	313	1992
Determination of the Cu 2p primary excitation spectra for Cu, Cu2O and CuO N Pauly, S Tougaard, F Yubero Surface Science 620, 17-22, 2014	213	2014
Model for quantitative analysis of reflection-electron-energy-loss spectra: Angular dependence F Yubero, JM Sanz, B Ramskov, S Tougaard Physical Review B 53 (15), 9719, 1996	205	1996
Electron inelastic mean free path for Ti, TiC, TiN and TiO₂ as determined by quantitative reflection electron energy‐loss spectroscopy GG Fuentes, E Elizalde, F Yubero, JM Sanz Surface and Interface Analysis: An International Journal devoted to the …, 2002	141	2002
XPS analysis of down stream plasma treated wool: Influence of the nature of the gas on the surface modification of wool R Molina, JP Espinós, F Yubero, P Erra, AR Gonzalez-Elipe Applied Surface Science 252 (5), 1417-1429, 2005	122	2005
Quantitative model of electron energy loss in XPS AC Simonsen, F Yubero, S Tougaard Physical Review B 56 (3), 1612, 1997	122	1997
Non-enzymatic glucose electrochemical sensor made of porous NiO thin films prepared by reactive magnetron sputtering at oblique angles FJ García-García, P Salazar, F Yubero, AR González-Elipe Electrochimica Acta 201, 38-44, 2016	116	2016
Electronic state characterization of SiOx thin films prepared by evaporation A Barranco, F Yubero, JP Espinós, P Gröning, AR González-Elipe Journal of applied physics 97 (11), 2005	102	2005
Dielectric loss function of Si and SiO₂ from quantitative analysis of REELS spectra F Yubero, S Tougaard, E Elizalde, JM Sanz Surface and interface analysis 20 (8), 719-726, 1993	102	1993
Preparation of transparent and conductive Al-doped ZnO thin films by ECR plasma enhanced CVD A Martın, JP Espinos, A Justo, JP Holgado, F Yubero, AR González-Elipe Surface and coatings Technology 151, 289-293, 2002	95	2002
SiO2/TiO2 thin films with variable refractive index prepared by ion beam induced and plasma enhanced chemical vapor deposition F Gracia, F Yubero, JP Holgado, JP Espinos, AR Gonzalez-Elipe, ... Thin Solid Films 500 (1-2), 19-26, 2006	94	2006
Low energy ion assisted film growth A Gonzalez-elipe, JM Sanz, F Yubero World Scientific, 2003	90	2003
QUEELS software package for calculation of surface effects in electron spectra S Tougaard, F Yubero Surface and Interface Analysis: An International Journal devoted to the …, 2004	81	2004
Recent advances in alkaline exchange membrane water electrolysis and electrode manufacturing E López-Fernández, CG Sacedón, J Gil-Rostra, F Yubero, ... Molecules 26 (21), 6326, 2021	79	2021
Synthesis of SiO2 and SiOxCyHz thin films by microwave plasma CVD A Barranco, J Cotrino, F Yubero, JP Espinós, J Benıtez, C Clerc, ... Thin solid films 401 (1-2), 150-158, 2001	78	2001
Chemical stability of species in thin films A Barranco, JA Mejıas, JP Espinos, A Caballero, AR Gonzalez-Elipe, ... Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 19 (1 …, 2001	78	2001
Quantification of plasmon excitations in core-level photoemission F Yubero, S Tougaard Physical Review B—Condensed Matter and Materials Physics 71 (4), 045414, 2005	76	2005
Interface effects in the x-ray photoelectron spectra of NiO thin films grown on oxide substrates I Preda, A Gutiérrez, M Abbate, F Yubero, J Méndez, L Alvarez, L Soriano Physical Review B—Condensed Matter and Materials Physics 77 (7), 075411, 2008	75	2008
Experimental test of model for angular and energy dependence of reflection-electron-energy-loss spectra F Yubero, D Fujita, B Ramskov, S Tougaard Physical Review B 53 (15), 9728, 1996	71	1996
Structure, microstructure and electronic characterisation of the Al2O3/SiO2 interface by electron spectroscopies R Reiche, F Yubero, JP Espinós, AR González-Elipe Surface Science 457 (1-2), 199-210, 2000	66	2000

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