Bryan Reed
Bryan Reed
Chief Technology Officer, Integrated Dynamic Electron Solutions, Inc.
Verified email at phaseplate.com - Homepage
TitleCited byYear
Ultrafast electron microscopy in materials science, biology, and chemistry
WE King, GH Campbell, A Frank, B Reed, JF Schmerge, BJ Siwick, ...
Journal of Applied Physics 97 (11), 8, 2005
3412005
Imaging of transient structures using nanosecond in situ TEM
JS Kim, T LaGrange, BW Reed, ML Taheri, MR Armstrong, WE King, ...
Science 321 (5895), 1472-1475, 2008
2762008
Simultaneous observation of the quantization and the interference pattern of a plasmonic near-field
L Piazza, TTA Lummen, E Quinonez, Y Murooka, BW Reed, B Barwick, ...
Nature communications 6, 6407, 2015
1512015
Single-shot dynamic transmission electron microscopy
T LaGrange, MR Armstrong, K Boyden, CG Brown, GH Campbell, ...
Applied Physics Letters 89 (4), 044105, 2006
1322006
Nanosecond time-resolved investigations using the in situ of dynamic transmission electron microscope (DTEM)
T LaGrange, GH Campbell, BW Reed, M Taheri, JB Pesavento, JS Kim, ...
Ultramicroscopy 108 (11), 1441-1449, 2008
1232008
Electronic properties of carbon nanotubes by transmission electron energy-loss spectroscopy
BW Reed, M Sarikaya
Physical Review B 64 (19), 195404, 2001
1002001
Practical considerations for high spatial and temporal resolution dynamic transmission electron microscopy
MR Armstrong, K Boyden, ND Browning, GH Campbell, JD Colvin, ...
Ultramicroscopy 107 (4-5), 356-367, 2007
982007
High-density chemical intercalation of zero-valent copper into Bi2Se3 nanoribbons
KJ Koski, JJ Cha, BW Reed, CD Wessells, D Kong, Y Cui
Journal of the American Chemical Society 134 (18), 7584-7587, 2012
942012
The evolution of ultrafast electron microscope instrumentation
BW Reed, MR Armstrong, ND Browning, GH Campbell, JE Evans, ...
Microscopy and microanalysis 15 (4), 272-281, 2009
932009
Trench isolation for micromechanical devices
SG Adams, KA Shaw, RY Webb, BW Reed, NC MacDonald, TJ Davis
US Patent 6,239,473, 2001
892001
Design and implementation of a fs-resolved transmission electron microscope based on thermionic gun technology
L Piazza, DJ Masiel, T LaGrange, BW Reed, B Barwick, F Carbone
Chemical Physics 423, 79-84, 2013
852013
Femtosecond electron pulse propagation for ultrafast electron diffraction
BW Reed
Journal of applied physics 100 (3), 034916, 2006
832006
Chemical intercalation of zerovalent metals into 2D layered Bi2Se3 nanoribbons
KJ Koski, CD Wessells, BW Reed, JJ Cha, D Kong, Y Cui
Journal of the American Chemical Society 134 (33), 13773-13779, 2012
792012
Grain boundary energy function for fcc metals
VV Bulatov, BW Reed, M Kumar
Acta Materialia 65, 161-175, 2014
782014
Direct characterization of phase transformations and morphologies in moving reaction zones in Al/Ni nanolaminates using dynamic transmission electron microscopy
JS Kim, T LaGrange, BW Reed, R Knepper, TP Weihs, ND Browning, ...
Acta Materialia 59 (9), 3571-3580, 2011
652011
Mathematical methods for analyzing highly-twinned grain boundary networks
BW Reed, M Kumar
Scripta materialia 54 (6), 1029-1033, 2006
612006
Controlled assembly of conducting monomers for molecular electronics
MH Zareie, H Ma, BW Reed, AKY Jen, M Sarikaya
Nano Letters 3 (2), 139-142, 2003
612003
Recent developments in dynamic transmission electron microscopy
ND Browning, MA Bonds, GH Campbell, JE Evans, T LaGrange, ...
Current Opinion in Solid State and Materials Science 16 (1), 23-30, 2012
602012
Fracture roughness scaling and its correlation with grain boundary network structure
BW Reed, M Kumar, RW Minich, RE Rudd
Acta Materialia 56 (13), 3278-3289, 2008
572008
Approaches for ultrafast imaging of transient materials processes in the transmission electron microscope
T LaGrange, BW Reed, MK Santala, JT McKeown, A Kulovits, ...
Micron 43 (11), 1108-1120, 2012
532012
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