Rasmus Havelund
Rasmus Havelund
Lillebaelt Hospital, Vejle, Denmark
Verified email at rsyd.dk
Title
Cited by
Cited by
Year
The 3D OrbiSIMS—label-free metabolic imaging with subcellular lateral resolution and high mass-resolving power
MK Passarelli, A Pirkl, R Moellers, D Grinfeld, F Kollmer, R Havelund, ...
Nature methods 14 (12), 1175-1183, 2017
1822017
Functional electrospun polystyrene nanofibers incorporating α-, β-, and γ-cyclodextrins: comparison of molecular filter performance
T Uyar, R Havelund, J Hacaloglu, F Besenbacher, P Kingshott
ACS nano 4 (9), 5121-5130, 2010
1472010
Argon cluster ion beams for organic depth profiling: results from a VAMAS interlaboratory study
AG Shard, R Havelund, MP Seah, SJ Spencer, IS Gilmore, N Winograd, ...
Analytical chemistry 84 (18), 7865-7873, 2012
1452012
Molecular filters based on cyclodextrin functionalized electrospun fibers
T Uyar, R Havelund, Y Nur, J Hacaloglu, F Besenbacher, P Kingshott
Journal of Membrane Science 332 (1-2), 129-137, 2009
1332009
Thermo-Responsive Core−Sheath Electrospun Nanofibers from Poly (N-isopropylacrylamide)/Polycaprolactone Blends
M Chen, M Dong, R Havelund, VR Regina, RL Meyer, F Besenbacher, ...
Chemistry of Materials 22 (14), 4214-4221, 2010
1212010
Cyclodextrin functionalized poly (methyl methacrylate)(PMMA) electrospun nanofibers for organic vapors waste treatment
T Uyar, R Havelund, Y Nur, A Balan, J Hacaloglu, L Toppare, ...
Journal of Membrane Science 365 (1-2), 409-417, 2010
942010
Argon cluster ion source evaluation on lipid standards and rat brain tissue samples
C Bich, R Havelund, R Moellers, D Touboul, F Kollmer, E Niehuis, ...
Analytical Chemistry 85 (16), 7745-7752, 2013
792013
Direct electrospinning of Ag/polyvinylpyrrolidone nanocables
J Song, M Chen, MB Olesen, C Wang, R Havelund, Q Li, E Xie, R Yang, ...
Nanoscale 3 (12), 4966-4971, 2011
712011
The matrix effect in organic secondary ion mass spectrometry
AG Shard, SJ Spencer, SA Smith, R Havelund, IS Gilmore
International Journal of Mass Spectrometry 377, 599-609, 2015
652015
3D ToF-SIMS imaging of polymer multilayer films using argon cluster sputter depth profiling
J Bailey, R Havelund, AG Shard, IS Gilmore, MR Alexander, JS Sharp, ...
ACS applied materials & interfaces 7 (4), 2654-2659, 2015
612015
Measuring compositions in organic depth profiling: results from a VAMAS interlaboratory study
AG Shard, R Havelund, SJ Spencer, IS Gilmore, MR Alexander, ...
The Journal of Physical Chemistry B 119 (33), 10784-10797, 2015
532015
The formation and characterization of cyclodextrin functionalized polystyrene nanofibers produced by electrospinning
T Uyar, R Havelund, J Hacaloglu, X Zhou, F Besenbacher, P Kingshott
Nanotechnology 20 (12), 125605, 2009
502009
Peptide fragmentation and surface structural analysis by means of ToF-SIMS using large cluster ion sources
Y Yokoyama, S Aoyagi, M Fujii, J Matsuo, JS Fletcher, NP Lockyer, ...
Analytical chemistry 88 (7), 3592-3597, 2016
432016
Universal equation for argon cluster size-dependence of secondary ion spectra in SIMS of organic materials
MP Seah, R Havelund, IS Gilmore
The Journal of Physical Chemistry C 118 (24), 12862-12872, 2014
322014
Improving Secondary Ion Mass Spectrometry C60n+ Sputter Depth Profiling of Challenging Polymers with Nitric Oxide Gas Dosing
R Havelund, A Licciardello, J Bailey, N Tuccitto, D Sapuppo, IS Gilmore, ...
Analytical chemistry 85 (10), 5064-5070, 2013
242013
Intracellular Drug Uptake A Comparison of Single Cell Measurements Using ToF-SIMS Imaging and Quantification from Cell Populations with LC/MS/MS
CF Newman, R Havelund, MK Passarelli, PS Marshall, I Francis, A West, ...
Analytical chemistry 89 (22), 11944-11953, 2017
222017
Sputtering yields for mixtures of organic materials using argon gas cluster ions
MP Seah, R Havelund, AG Shard, IS Gilmore
The Journal of Physical Chemistry B 119 (42), 13433-13439, 2015
192015
Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster size
MP Seah, SJ Spencer, R Havelund, IS Gilmore, AG Shard
Analyst 140 (19), 6508-6516, 2015
192015
Fundamental aspects of Arn+ SIMS profiling of common organic semiconductors
C Fleischmann, T Conard, R Havelund, A Franquet, C Poleunis, ...
Surface and Interface Analysis 46 (S1), 54-57, 2014
162014
Semiempirical rules to determine drug sensitivity and ionization efficiency in secondary ion mass spectrometry using a model tissue sample
JL Vorng, AM Kotowska, MK Passarelli, A West, PS Marshall, R Havelund, ...
Analytical chemistry 88 (22), 11028-11036, 2016
142016
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