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John Dell
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Effect of deposition conditions on mechanical properties of low-temperature PECVD silicon nitride films
H Huang, KJ Winchester, A Suvorova, BR Lawn, Y Liu, XZ Hu, JM Dell, ...
Materials Science and Engineering: A 435, 453-459, 2006
2512006
Scattering mechanisms limiting two-dimensional electron gas mobility in modulation-doped field-effect transistors
J Antoszewski, M Gracey, JM Dell, L Faraone, TA Fisher, G Parish, YF Wu, ...
Journal of Applied Physics 87 (8), 3900-3904, 2000
1612000
Widely tunable MEMS-based Fabry–Perot filter
JS Milne, JM Dell, AJ Keating, L Faraone
Journal of microelectromechanical systems 18 (4), 905-913, 2009
1522009
/sup 60/Co gamma irradiation effects on n-GaN Schottky diodes
GA Umana-Membreno, JM Dell, G Parish, BD Nener, L Faraone, ...
IEEE Transactions on Electron Devices 50 (12), 2326-2334, 2003
1352003
MEMS-based microspectrometer technologies for NIR and MIR wavelengths
LP Schuler, JS Milne, JM Dell, L Faraone
Journal of Physics D: Applied Physics 42 (13), 133001, 2009
1312009
Nanoscratch-induced phase transformation of monocrystalline Si
YQ Wu, H Huang, J Zou, LC Zhang, JM Dell
Scripta Materialia 63 (8), 847-850, 2010
1032010
Determination of mechanical properties of PECVD silicon nitride thin films for tunable MEMS Fabry–Perot optical filters
H Huang, K Winchester, Y Liu, XZ Hu, CA Musca, JM Dell, L Faraone
Journal of Micromechanics and Microengineering 15 (3), 608, 2005
962005
60Co gamma-irradiation-induced defects in
GA Umana-Membreno, JM Dell, TP Hessler, BD Nener, G Parish, ...
Applied physics letters 80 (23), 4354-4356, 2002
902002
Monolithic integration of an infrared photon detector with a MEMS-based tunable filter
CA Musca, J Antoszewski, KJ Winchester, AJ Keating, T Nguyen, K Silva, ...
IEEE electron device letters 26 (12), 888-890, 2005
872005
Tunable Fabry-Pérot cavities fabricated from PECVD silicon nitride employing zinc sulphide as the sacrificial layer
KJ Winchester, JM Dell
Journal of Micromechanics and Microengineering 11 (5), 589, 2001
802001
HgCdTe mid-wavelength IR photovoltaic detectors fabricated using plasma induced junction technology
JM Dell, J Antoszewski, MH Rais, C Musca, JK White, BD Nener, ...
Journal of Electronic Materials 29, 841-848, 2000
772000
Quantifying the effects of 16p11. 2 copy number variants on brain structure: a multisite genetic-first study
S Martin-Brevet, B Rodríguez-Herreros, JA Nielsen, C Moreau, ...
Biological Psychiatry 84 (4), 253-264, 2018
762018
Magnetic field dependent Hall data analysis of electron transport in modulation-doped AlGaN/GaN heterostructures
Z Dziuba, J Antoszewski, JM Dell, L Faraone, P Kozodoy, S Keller, ...
Journal of applied physics 82 (6), 2996-3002, 1997
681997
Stress in low-temperature plasma enhanced chemical vapour deposited silicon nitride thin films
M Martyniuk, J Antoszewski, CA Musca, JM Dell, L Faraone
Smart Materials and Structures 15 (1), S29, 2005
672005
Nanoscratch-induced deformation of single crystal silicon
YQ Wu, H Huang, J Zou, JM Dell
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2009
652009
GaSb: a new alternative substrate for epitaxial growth of HgCdTe
W Lei, RJ Gu, J Antoszewski, J Dell, L Faraone
Journal of electronic materials 43, 2788-2794, 2014
642014
Characterization of Hg0.7Cd0.3Te n- on p-type structures obtained by reactive ion etching induced p- to n conversion
J Antoszewski, CA Musca, JM Dell, L Faraone
Journal of Electronic materials 29, 837-840, 2000
632000
Generation-recombination effects on dark currents in CdTe-passivated midwave infrared HgCdTe photodiodes
A Jozwikowska, K Jozwikowski, J Antoszewski, CA Musca, T Nguyen, ...
Journal of applied physics 98 (1), 2005
562005
MEMS-based tunable Fabry–Perot filters for adaptive multispectral thermal imaging
H Mao, KD Silva, M Martyniuk, J Antoszewski, J Bumgarner, BD Nener, ...
Journal of Microelectromechanical Systems 25 (1), 227-235, 2016
522016
MBE growth of mid-wave infrared HgCdTe layers on GaSb alternative substrates
W Lei, RJ Gu, J Antoszewski, J Dell, G Neusser, M Sieger, B Mizaikoff, ...
Journal of Electronic Materials 44, 3180-3187, 2015
522015
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