John Kramar
Title
Cited by
Cited by
Year
Review of SI traceable force metrology for instrumented indentation and atomic force microscopy
JR Pratt, JA Kramar, DB Newell, DT Smith
Measurement science and technology 16 (11), 2129, 2005
1422005
Nanometre resolution metrology with the molecular measuring machine
JA Kramar
Measurement Science and Technology 16 (11), 2121, 2005
1282005
Progress toward Système International d’Unités traceable force metrology for nanomechanics
JR Pratt, DT Smith, DB Newell, JA Kramar, E Whitenton
Journal of materials research 19 (1), 366-379, 2004
1042004
Band bending and the apparent barrier height in scanning tunneling microscopy
M Weimer, J Kramar, JD Baldeschwieler
Physical Review B 39 (8), 5572, 1989
921989
Spring constant calibration of atomic force microscopy cantilevers with a piezosensor transfer standard
ED Langlois, GA Shaw, JA Kramar, JR Pratt, DC Hurley
Review of Scientific Instruments 78 (9), 093705, 2007
852007
Electronic limitations in phase meters for heterodyne interferometry
NM Oldham, JA Kramar, PS Hetrick, EC Teague
Precision engineering 15 (3), 173-179, 1993
851993
The NIST microforce realization and measurement project
DB Newell, JA Kramar, JR Pratt, DT Smith, ER Williams
IEEE Transactions on instrumentation and measurement 52 (2), 508-511, 2003
842003
Tunneling microscopy of 2H-MoS 2: A compound semiconductor surface
M Weimer, J Kramar, C Bai, JD Baldeschwieler
Physical Review B 37 (8), 4292, 1988
741988
Scanning probe microscope dimensional metrology at NIST
JA Kramar, R Dixson, NG Orji
Measurement science and technology 22 (2), 024001, 2010
692010
Milligram mass metrology using an electrostatic force balance
GA Shaw, J Stirling, JA Kramar, A Moses, P Abbott, R Steiner, A Koffman, ...
Metrologia 53 (5), A86, 2016
492016
Kinematic modeling and calibration of a flexure based hexapod nanopositioner
H Shi, HJ Su, N Dagalakis, JA Kramar
Precision Engineering 37 (1), 117-128, 2013
492013
Positioning stage
EG Amatucci, NG Dagalakis, J Marcinkoski, FE Scire, JA Kramar
US Patent 6,467,761, 2002
442002
SI realization of small forces using an electrostatic force balance
JR Pratt, JA Kramar
Proc. XVIII IMEKO World Congress on Metrology for a Sustainable Development …, 2006
372006
Atomic force microscope cantilever flexural stiffness calibration: Toward a standard traceable method
RS Gates, MG Reitsma, JA Kramar, JR Pratt
Journal of Research of the National Institute of Standards and Technology …, 2011
352011
TSOM method for semiconductor metrology
R Attota, RG Dixson, JA Kramar, JE Potzick, AE Vladár, B Bunday, ...
Metrology, Inspection, and Process Control for Microlithography XXV 7971, 79710T, 2011
352011
SI-traceable spring constant calibration of microfabricated cantilevers for small force measurement
GA Shaw, J Kramar, J Pratt
Experimental mechanics 47 (1), 143-151, 2007
262007
Active vibration isolation of a large stroke scanning probe microscope by using discrete sliding mode control
JY Yen, KJ Lan, JA Kramar
Sensors and Actuators A: Physical 121 (1), 243-250, 2005
262005
Toward nanometer accuracy measurements
J Kramar, E Amatucci, DE Gilsinn, JSJ Jun, WB Penzes, F Scire, ...
Metrology, Inspection, and Process Control for Microlithography XIII 3677 …, 1999
251999
A flexure balance with adjustable restoring torque for nanonewton force measurement
JR Pratt, DB Newell, JA Kramar
VDI BERICHTE 1685, 77-82, 2002
242002
Helium ion microscopy: a new technique for semiconductor metrology and nanotechnology
MT Postek, AE Vladar, J Kramar, LA Stern, J Notte, S McVey
AIP Conference Proceedings 931 (1), 161-167, 2007
212007
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