Herbert Hutter
Herbert Hutter
Verified email at tuwien.ac.at
TitleCited byYear
Surface and Thin‐Film Analysis
H Bubert, JC Rivière, HF Arlinghaus, H Hutter, H Jenett, P Bauer, ...
Ullmann's Encyclopedia of Industrial Chemistry, 2002
2152002
Relationship between cation segregation and the electrochemical oxygen reduction kinetics of La0. 6Sr0. 4CoO3− δ thin film electrodes
M Kubicek, A Limbeck, T Frömling, H Hutter, J Fleig
Journal of The Electrochemical Society 158 (6), B727-B734, 2011
1652011
Tensile Lattice Strain Accelerates Oxygen Surface Exchange and Diffusion in La1–xSrxCoO3−δ Thin Films
M Kubicek, Z Cai, W Ma, B Yildiz, H Hutter, J Fleig
ACS nano 7 (4), 3276-3286, 2013
1592013
Wavelet denoising of Gaussian peaks: a comparative study
CR Mittermayr, SG Nikolov, H Hutter, M Grasserbauer
Chemometrics and Intelligent Laboratory Systems 34 (2), 187-202, 1996
1211996
Cation diffusion in La 0.6 Sr 0.4 CoO 3− δ below 800 C and its relevance for Sr segregation
M Kubicek, GM Rupp, S Huber, A Penn, AK Opitz, J Bernardi, ...
Physical Chemistry Chemical Physics 16 (6), 2715-2726, 2014
792014
Fast oxygen exchange and diffusion kinetics of grain boundaries in Sr-doped LaMnO 3 thin films
E Navickas, TM Huber, Y Chen, W Hetaba, G Holzlechner, G Rupp, ...
Physical Chemistry Chemical Physics 17 (12), 7659-7669, 2015
622015
Initial oxidation of silver surfaces by S2− and S4+ species
C Kleber, R Wiesinger, J Schnöller, U Hilfrich, H Hutter, M Schreiner
Corrosion Science 50 (4), 1112-1121, 2008
602008
On the effect of Ta on improved oxidation resistance of Ti–Al–Ta–N coatings
M Pfeiler, C Scheu, H Hutter, J Schnöller, C Michotte, C Mitterer, ...
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 27 (3 …, 2009
582009
A novel ToF-SIMS operation mode for sub 100 nm lateral resolution: Application and performance
M Kubicek, G Holzlechner, AK Opitz, S Larisegger, H Hutter, J Fleig
Applied surface science 289, 407-416, 2014
552014
De-noising of SIMS images via wavelet shrinkage
SG Nikolov, H Hutter, M Grasserbauer
Chemometrics and Intelligent Laboratory Systems 34 (2), 263-273, 1996
531996
Bulk and surface characterization of InO(001) single crystals
DR Hagleitner, M Menhart, P Jacobson, S Blomberg, K Schulte, ...
Physical Review B 85 (11), 115441, 2012
502012
Evolution of tungsten film deposition induced by focused ion beam
H Langfischer, B Basnar, H Hutter, E Bertagnolli
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 20 (4 …, 2002
482002
A novel ToF-SIMS operation mode for improved accuracy and lateral resolution of oxygen isotope measurements on oxides
G Holzlechner, M Kubicek, H Hutter, J Fleig
Journal of Analytical Atomic Spectrometry 28 (7), 1080-1089, 2013
472013
Investigations of the incorporation of B, P and N into CVD-diamond films by secondary ion mass spectrometry
H Spicka, M Griesser, H Hutter, M Grasserbauer, S Bohr, R Haubner, ...
Diamond and Related Materials 5 (3-5), 383-387, 1996
461996
Investigation of the oxygen exchange mechanism on Pt| yttria stabilized zirconia at intermediate temperatures: Surface path versus bulk path
AK Opitz, A Lutz, M Kubicek, F Kubel, H Hutter, J Fleig
Electrochimica acta 56 (27), 9727-9740, 2011
452011
Optical Er-doping of Si during sublimational molecular beam epitaxy
BA Andreev, AY Andreev, H Ellmer, H Hutter, ZF Krasil'nik, VP Kuznetsov, ...
Journal of crystal growth 201, 534-537, 1999
441999
Three dimensional ultra trace analysis of materials
H Hutter, M Grasserbauer
Microchimica Acta 107 (3-6), 137-148, 1992
441992
Low friction CrN/TiN multilayer coatings prepared by a hybrid high power impulse magnetron sputtering/DC magnetron sputtering deposition technique
J Paulitsch, M Schenkel, A Schintlmeister, H Hutter, PH Mayrhofer
Thin Solid Films 518 (19), 5553-5557, 2010
412010
Pulsed laser deposition: a new technique for deposition of amorphous SiOx thin films
JM Lackner, W Waldhauser, R Ebner, W Lenz, C Suess, G Jakopic, ...
Surface and Coatings Technology 163, 300-305, 2003
392003
Digital holographic reflectometry
T Colomb, S Krivec, H Hutter, AA Akatay, N Pavillon, F Montfort, E Cuche, ...
Optics express 18 (4), 3719-3731, 2010
382010
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