| Advances in scanning force microscopy for dimensional metrology HU Danzebrink, L Koenders, G Wilkening, A Yacoot, H Kunzmann CIRP Annals-Manufacturing Technology 55 (2), 841-878, 2006 | 192 | 2006 |
| Aspects of scanning force microscope probes and their effects on dimensional measurement A Yacoot, L Koenders Journal of Physics D: Applied Physics 41 (10), 103001, 2008 | 191 | 2008 |
| Combined optical and X–ray interferometry for high–precision dimensional metrology G Basile, P Becker, A Bergamin, G Cavagnero, A Franks, K Jackson, ... Proceedings of the Royal Society of London A: Mathematical, Physical and …, 2000 | 117 | 2000 |
| A heterodyne interferometer with periodic nonlinearities smaller than±10 pm C Weichert, P Köchert, R Köning, J Flügge, B Andreas, U Kuetgens, ... Measurement Science and Technology 23 (9), 094005, 2012 | 110 | 2012 |
| Comparison of the performance of the next generation of optical interferometers M Pisani, A Yacoot, P Balling, N Bancone, C Birlikseven, M Celik, ... Metrologia 49 (4), 455, 2012 | 103 | 2012 |
| Advances in traceable nanometrology at the National Physical Laboratory R Leach, J Haycocks, K Jackson, A Lewis, S Oldfield, A Yacoot Nanotechnology 12 (1), R1, 2001 | 101 | 2001 |
| The use of x-ray interferometry to investigate the linearity of the NPL differential plane mirror optical interferometer A Yacoot, MJ Downs Measurement Science and Technology 11 (8), 1126, 2000 | 98 | 2000 |
| Recent developments in dimensional nanometrology using AFMs A Yacoot, L Koenders Measurement Science and Technology 22 (12), 122001, 2011 | 96 | 2011 |
| The European nanometrology landscape RK Leach, R Boyd, T Burke, HU Danzebrink, K Dirscherl, T Dziomba, ... Nanotechnology 22 (6), 062001, 2011 | 96 | 2011 |
| Measurement of picometre non-linearity in an optical grating encoder using x-ray interferometry A Yacoot, N Cross Measurement Science and Technology 14 (1), 148, 2002 | 62 | 2002 |
| A review of recent work in sub-nanometre displacement measurement using optical and X–ray interferometry GN Peggs, A Yacoot Philosophical Transactions of the Royal Society of London A: Mathematical …, 2002 | 57 | 2002 |
| X-ray topographic studies and measurement of lattice parameter differences within synthetic diamonds grown by the reconstitution technique W Wierzchowski, M Moore, APW Makepeace, A Yacoot Journal of crystal growth 114 (1-2), 209-227, 1991 | 52 | 1991 |
| Methods for determining and processing 3D errors and uncertainties for AFM data analysis P Klapetek, D Nečas, A Campbellová, A Yacoot, L Koenders Measurement Science and Technology 22 (2), 025501, 2011 | 51 | 2011 |
| An atomic force microscope for the study of the effects of tip–sample interactions on dimensional metrology A Yacoot, L Koenders, H Wolff Measurement Science and Technology 18 (2), 350, 2007 | 46 | 2007 |
| Microscope calibration using laser written fluorescence AD Corbett, M Shaw, A Yacoot, A Jefferson, L Schermelleh, T Wilson, ... arXiv preprint arXiv:1806.05457, 2018 | 42 | 2018 |
| Advances in engineering nanometrology at the National Physical Laboratory RK Leach, J Claverley, C Giusca, CW Jones, L Nimishakavi, W Sun, ... Measurement Science and Technology 23 (7), 074002, 2012 | 36 | 2012 |
| DNA nanomapping using CRISPR-Cas9 as a programmable nanoparticle A Mikheikin, A Olsen, K Leslie, F Russell-Pavier, A Yacoot, L Picco, ... Nature communications 8 (1), 1665, 2017 | 33 | 2017 |
| Large area high-speed metrology SPM system P Klapetek, M Valtr, L Picco, OD Payton, J Martinek, A Yacoot, M Miles Nanotechnology 26 (6), 065501, 2015 | 32 | 2015 |
| A combined scanning tunnelling microscope and x-ray interferometer A Yacoot, U Kuetgens, L Koenders, T Weimann Measurement Science and Technology 12 (10), 1660, 2001 | 32 | 2001 |
| The lattice parameter of silicon: a secondary realisation of the metre A Yacoot, H Bosse, R Dixson Measurement Science and Technology 31 (12), 121001, 2020 | 31 | 2020 |
