Andrew Yacoot
TitleCited byYear
Advances in scanning force microscopy for dimensional metrology
HU Danzebrink, L Koenders, G Wilkening, A Yacoot, H Kunzmann
CIRP Annals-Manufacturing Technology 55 (2), 841-878, 2006
Aspects of scanning force microscope probes and their effects on dimensional measurement
A Yacoot, L Koenders
Journal of Physics D: Applied Physics 41 (10), 103001, 2008
Combined optical and X–ray interferometry for high–precision dimensional metrology
G Basile, P Becker, A Bergamin, G Cavagnero, A Franks, K Jackson, ...
Proceedings of the Royal Society of London A: Mathematical, Physical and …, 2000
Advances in traceable nanometrology at the National Physical Laboratory
R Leach, J Haycocks, K Jackson, A Lewis, S Oldfield, A Yacoot
Nanotechnology 12 (1), R1, 2001
The use of x-ray interferometry to investigate the linearity of the NPL differential plane mirror optical interferometer
A Yacoot, MJ Downs
Measurement Science and Technology 11 (8), 1126, 2000
The European nanometrology landscape
RK Leach, R Boyd, T Burke, HU Danzebrink, K Dirscherl, T Dziomba, ...
Nanotechnology 22 (6), 062001, 2011
A heterodyne interferometer with periodic nonlinearities smaller than±10 pm
C Weichert, P Köchert, R Köning, J Flügge, B Andreas, U Kuetgens, ...
Measurement Science and Technology 23 (9), 094005, 2012
Comparison of the performance of the next generation of optical interferometers
M Pisani, A Yacoot, P Balling, N Bancone, C Birlikseven, M Celik, ...
Metrologia 49 (4), 455, 2012
Recent developments in dimensional nanometrology using AFMs
A Yacoot, L Koenders
Measurement Science and Technology 22 (12), 122001, 2011
Measurement of picometre non-linearity in an optical grating encoder using x-ray interferometry
A Yacoot, N Cross
Measurement Science and Technology 14 (1), 148, 2002
A review of recent work in sub-nanometre displacement measurement using optical and X–ray interferometry
GN Peggs, A Yacoot
Philosophical Transactions of the Royal Society of London A: Mathematical …, 2002
X-ray topographic studies and measurement of lattice parameter differences within synthetic diamonds grown by the reconstitution technique
W Wierzchowski, M Moore, APW Makepeace, A Yacoot
Journal of crystal growth 114 (1-2), 209-227, 1991
An atomic force microscope for the study of the effects of tip–sample interactions on dimensional metrology
A Yacoot, L Koenders, H Wolff
Measurement Science and Technology 18 (2), 350, 2007
Methods for determining and processing 3D errors and uncertainties for AFM data analysis
P Klapetek, D Nečas, A Campbellová, A Yacoot, L Koenders
Measurement Science and Technology 22 (2), 025501, 2011
Advances in engineering nanometrology at the National Physical Laboratory
RK Leach, J Claverley, C Giusca, CW Jones, L Nimishakavi, W Sun, ...
Measurement Science and Technology 23 (7), 074002, 2012
Large area high-speed metrology SPM system
P Klapetek, M Valtr, L Picco, OD Payton, J Martinek, A Yacoot, M Miles
Nanotechnology 26 (6), 065501, 2015
A combined scanning tunnelling microscope and x-ray interferometer
A Yacoot, U Kuetgens, L Koenders, T Weimann
Measurement Science and Technology 12 (10), 1660, 2001
From nanometre to millimetre: a feasibility study of the combination of scanning probe microscopy and combined optical and x-ray interferometry
A Yacoot, L Koenders
Measurement Science and Technology 14 (9), N59, 2003
Error mapping of high-speed AFM systems
P Klapetek, L Picco, O Payton, A Yacoot, M Miles
Measurement Science and Technology 24 (2), 025006, 2013
Twinning in natural diamond. I. Contact twins
A Yacoot, M Moore, WG Machado
Journal of applied crystallography 31 (5), 767-776, 1998
The system can't perform the operation now. Try again later.
Articles 1–20