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Phillip Dobson
Phillip Dobson
Verified email at glasgow.ac.uk - Homepage
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Cited by
Cited by
Year
Nanowire probes for high resolution combined scanning electrochemical microscopy− atomic force microscopy
DP Burt, NR Wilson, JMR Weaver, PS Dobson, JV Macpherson
Nano letters 5 (4), 639-643, 2005
1682005
SThM temperature mapping and nonlinear thermal resistance evolution with bias on AlGaN/GaN HEMT devices
R Aubry, JC Jacquet, J Weaver, O Durand, P Dobson, G Mills, ...
IEEE transactions on electron devices 54 (3), 385-390, 2007
1142007
Characterization of batch-microfabricated scanning electrochemical-atomic force microscopy probes
PS Dobson, JMR Weaver, MN Holder, PR Unwin, JV Macpherson
Analytical chemistry 77 (2), 424-434, 2005
1032005
Characterization of batch-microfabricated scanning electrochemical-atomic force microscopy probes
PS Dobson, JMR Weaver, MN Holder, PR Unwin, JV Macpherson
Analytical chemistry 77 (2), 424-434, 2005
1032005
Pattern transfer of a 23 nm-period grating and sub-15 nm dots into CVD diamond
KA Lister, BG Casey, PS Dobson, S Thoms, DS Macintyre, ...
Microelectronic engineering 73, 319-322, 2004
562004
Screening of biomineralization using microfluidics
H Yin, B Ji, PS Dobson, K Mosbahi, A Glidle, N Gadegaard, A Freer, ...
Analytical chemistry 81 (1), 473-478, 2009
522009
Ultra-rapid, sustainable and selective synthesis of silicon carbide powders and nanomaterials via microwave heating
L Carassiti, A Jones, P Harrison, PS Dobson, S Kingman, I MacLaren, ...
Energy & Environmental Science 4 (4), 1503-1510, 2011
482011
Ultra-rapid, sustainable and selective synthesis of silicon carbide powders and nanomaterials via microwave heating
L Carassiti, A Jones, P Harrison, PS Dobson, S Kingman, I MacLaren, ...
Energy & Environmental Science 4 (4), 1503-1510, 2011
482011
Liquid cooling of non-uniform heat flux of a chip circuit by subchannels
AAY Al-Waaly, MC Paul, P Dobson
Applied Thermal Engineering 115, 558-574, 2017
462017
Microfabricated temperature standard based on Johnson noise measurement for the calibration of micro-and nano-thermometers
PS Dobson, G Mills, JMR Weaver
Review of scientific instruments 76 (5), 2005
422005
Electron beam lithographically-defined scanning electrochemical-atomic force microscopy probes: fabrication method and application to high resolution imaging on heterogeneously …
PS Dobson, JMR Weaver, DP Burt, MN Holder, NR Wilson, PR Unwin, ...
Physical chemistry chemical physics 8 (33), 3909-3914, 2006
402006
Uses of electromagnetic interference patterns
JMR Weaver, PS Dobson, DP Burt, S Thoms, KE Docherty, Y Zhang
US Patent 9,618,369, 2017
372017
High temperature imaging using a thermally compensated cantilever resistive probe for scanning thermal microscopy
Y Zhang, PS Dobson, JMR Weaver
Journal of Vacuum Science & Technology B 30 (1), 2012
362012
Effects of metal underlayer grain size on carbon nanotube growth
DP Burt, WM Whyte, JMR Weaver, A Glidle, JP Edgeworth, ...
The Journal of Physical Chemistry C 113 (34), 15133-15139, 2009
362009
A simple method for high yield fabrication of sharp silicon tips
DP Burt, PS Dobson, L Donaldson, JMR Weaver
Microelectronic Engineering 85 (3), 625-630, 2008
352008
Batch fabricated dual cantilever resistive probe for scanning thermal microscopy
Y Zhang, PS Dobson, JMR Weaver
Microelectronic engineering 88 (8), 2435-2438, 2011
342011
New methods for calibrated scanning thermal microscopy (SThM)
PS Dobson, JMR Weaver, G Mills
SENSORS, 2007 IEEE, 708-711, 2007
332007
Atomic force microscopy investigation of the mechanism of calcite microcrystal growth under Kitano conditions
PS Dobson, LA Bindley, JV Macpherson, PR Unwin
Langmuir 21 (4), 1255-1260, 2005
322005
Identification and composition of secondary meniscus calcite in fossil coral and the effect on predicted sea surface temperature
P Dalbeck, M Cusack, PS Dobson, N Allison, AE Fallick, AW Tudhope
Chemical Geology 280 (3-4), 314-322, 2011
292011
Effects of thermocouple electrical insulation on the measurement of surface temperature
AAY AlWaaly, MC Paul, PS Dobson
Applied Thermal Engineering 89, 421-431, 2015
282015
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