| Influence of Si-and W-doping on micro-scale reciprocating wear and impact performance of DLC coatings on hardened steel BD Beake, SJ McMaster, TW Liskiewicz, A Neville Tribology International 160, 107063, 2021 | 37 | 2021 |
| Probing fatigue resistance in multi-layer DLC coatings by micro-and nano-impact: Correlation to erosion tests SJ McMaster, TW Liskiewicz, A Neville, BD Beake Surface and Coatings Technology 402, 126319, 2020 | 25 | 2020 |
| Friction and electrical contact resistance in reciprocating nano-scale wear testing of metallic materials BD Beake, AJ Harris, TW Liskiewicz, J Wagner, SJ McMaster, SR Goodes, ... Wear 474, 203866, 2021 | 18 | 2021 |
| Contact size effects on the friction and wear of amorphous carbon films TWL Ben D. Beake, Sam J. McMaster Applied Surface Science Advances 9, 100248, 2022 | 7 | 2022 |
| Utilising H/E to predict fretting wear performance of DLC coating systems SJ McMaster, S Kosarieh, TW Liskiewicz, A Neville, BD Beake Tribology International, 2023 | 6 | 2023 |
| Selective soldering nozzles: insights into wear mechanisms and future developments SJ McMaster, A Cobley, JE Graves IPC APEX Technical Conference, 2023 | 1 | 2023 |
| Selective Soldering: A need for Innovation and Development MM Samuel J., A Cobley, JE Graves, N Monk Journal of the Institute of Circuit Technology 15 (3), 2022 | 1* | 2022 |
| Nanomechanical Characterisation of Diamond-Like Carbon Coatings for Tribological Performance SJ McMaster University of Leeds, 2021 | 1 | 2021 |
| Analysis of Pre-Treatment Processes to Enable Electroplating on Nitrided Steel SJ McMaster, F Krümmling, VK Chandrasekharan, A Bund, A Cobley, ... Electrochemical Society Meeting Abstracts 244, 1259-1259, 2023 | | 2023 |
| The challenges in selective soldering and meeting training needs SJ McMaster, KF Witham, A Cobley, JE Graves, E Groves Journal of the Institute of Circuit Technology 16 (3), 2023 | | 2023 |
Tomasz LiskiewiczProfessor of Tribology and Surface Engineering, Manchester Metropolitan UniversityVerified email at mmu.ac.uk
