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Judit Lisoni
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Coexistence of the bipolar and unipolar resistive-switching modes in NiO cells made by thermal oxidation of Ni layers
L Goux, JG Lisoni, M Jurczak, DJ Wouters, L Courtade, C Muller
Journal of Applied Physics 107 (2), 2010
2342010
Surface roughness and surface-induced resistivity of gold films on mica: Application of quantitative scanning tunneling microscopy
RC Munoz, G Vidal, M Mulsow, JG Lisoni, C Arenas, A Concha, F Mora, ...
Physical Review B 62 (7), 4686, 2000
1552000
Optimized Ni oxidation in 80-nm contact holes for integration of forming-free and low-power Ni/NiO/Ni memory cells
L Goux, JG Lisoni, XP Wang, M Jurczak, DJ Wouters
IEEE transactions on electron devices 56 (10), 2363-2368, 2009
1072009
Tall triple-gate devices with TiN/HfO/sub 2/gate stack
N Collaert, M Demand, I Ferain, J Lisoni, R Singanamalla, P Zimmerman, ...
Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005., 108-109, 2005
1042005
Metal gate work function tuning by Al incorporation in TiN
LPB Lima, HFW Dekkers, JG Lisoni, JA Diniz, S Van Elshocht, S De Gendt
Journal of Applied Physics 115 (7), 2014
842014
Synthesis of Ferroelectric Bi4Ti3O12 by Alternative Routes:  Wet No-Coprecipitation Chemistry and Mechanochemical Activation
JG Lisoni, P Millán, E Vila, JL Martín de Vidales, T Hoffmann, A Castro
Chemistry of materials 13 (6), 2084-2091, 2001
682001
Evidence of the thermo-electric Thomson effect and influence on the program conditions and cell optimization in phase-change memory cells
DT Castro, L Goux, GAM Hurkx, K Attenborough, R Delhougne, J Lisoni, ...
2007 IEEE International Electron Devices Meeting, 315-318, 2007
642007
Intrinsic electron traps in atomic-layer deposited HfO2 insulators
F Cerbu, O Madia, DV Andreev, S Fadida, M Eizenberg, L Breuil, ...
Applied Physics Letters 108 (22), 2016
602016
Oxidation kinetics of Ni metallic films: formation of NiO-based resistive switching structures
L Courtade, C Turquat, C Muller, JG Lisoni, L Goux, DJ Wouters, ...
Thin solid films 516 (12), 4083-4092, 2008
572008
Degradation of the reset switching during endurance testing of a phase-change line cell
L Goux, DT Castro, GAM Hurkx, JG Lisoni, R Delhougne, DJ Gravesteijn, ...
IEEE Transactions on Electron Devices 56 (2), 354-358, 2009
552009
Ruthenium gate electrodes on SiO2 and HfO2: Sensitivity to hydrogen and oxygen ambients
L Pantisano, T Schram, Z Li, JG Lisoni, G Pourtois, S De Gendt, ...
Applied physics letters 88 (24), 2006
552006
Electron grain boundary scattering and the resistivity of nanometric metallic structures
R Henriquez, S Cancino, A Espinosa, M Flores, T Hoffmann, G Kremer, ...
Physical Review B—Condensed Matter and Materials Physics 82 (11), 113409, 2010
542010
Ultrasound as a probe of dislocation density in aluminum
N Mujica, R Espinoza, J Lisoni, F Lund
Acta materialia 60 (16), 5828-5837, 2012
532012
A highly reliable 3-D integrated SBT ferroelectric capacitor enabling FeRAM scaling
L Goux, G Russo, N Menou, JG Lisoni, M Schwitters, V Paraschiv, D Maes, ...
IEEE transactions on electron devices 52 (4), 447-453, 2005
482005
MOCVD of Bismuth Oxides:  Transport Properties and Deposition Mechanisms of the Bi(C6H5)3 Precursor
C Bedoya, GG Condorelli, G Anastasi, A Baeri, F Scerra, IL Fragala, ...
Chemistry of materials 16 (16), 3176-3183, 2004
422004
Sr3Ti2O7 Ruddlesden−Popper Phase Synthesis by Milling Routes
T Hungria, JG Lisoni, A Castro
Chemistry of materials 14 (4), 1747-1754, 2002
382002
Intrinsic electron trapping in amorphous oxide
J Strand, M Kaviani, VV Afanas’ev, JG Lisoni, AL Shluger
Nanotechnology 29 (12), 125703, 2018
372018
Integration of SrBi2Ta2O9 thin films for high density ferroelectric random access memory
DJ Wouters, D Maes, L Goux, JG Lisoni, V Paraschiv, JA Johnson, ...
Journal of applied physics 100 (5), 2006
362006
Method for manufacturing a memory element comprising a resistivity-switching NiO layer and devices obtained thereof
L Courtade, JL Reyes, L Goux, C Turquat, C Muller, D Wouters
US Patent 7,960,775, 2011
352011
Superconducting and electro-optical thin films prepared by pulsed laser deposition technique
J Schubert, M Siegert, M Fardmanesh, W Zander, M Prömpers, C Buchal, ...
Applied surface science 168 (1-4), 208-214, 2000
332000
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