Rainer H. Fink
Rainer H. Fink
Professor für Physikalische Chemie FAU Erlangen-Nürnberg
Verified email at fau.de - Homepage
TitleCited byYear
Chemical bonding of PTCDA on Ag surfaces and the formation of interface states
Y Zou, L Kilian, A Schöll, T Schmidt, R Fink, E Umbach
Surface Science 600 (6), 1240-1251, 2006
3002006
Polarized X-ray scattering reveals non-crystalline orientational ordering in organic films
BA Collins, JE Cochran, H Yan, E Gann, C Hub, R Fink, C Wang, ...
Nature materials 11 (6), 536, 2012
2372012
Substrate-interaction, long-range order, and epitaxy of large organic adsorbates
E Umbach, M Sokolowski, R Fink
Applied Physics A 63 (6), 565-576, 1996
2061996
PolLux: A new facility for soft x-ray spectromicroscopy at the Swiss Light Source
J Raabe, G Tzvetkov, U Flechsig, M Böge, A Jaggi, B Sarafimov, ...
Review of scientific instruments 79 (11), 113704, 2008
1912008
A generic interface to reduce the efficiency-stability-cost gap of perovskite solar cells
Y Hou, X Du, S Scheiner, DP McMeekin, Z Wang, N Li, MS Killian, H Chen, ...
Science 358 (6367), 1192-1197, 2017
1792017
SMART: a planned ultrahigh-resolution spectromicroscope for BESSY II
R Fink, MR Weiss, E Umbach, D Preikszas, H Rose, R Spehr, P Hartel, ...
Journal of Electron Spectroscopy and Related Phenomena 84 (1-3), 231-250, 1997
1711997
Observation of intermixing at the buried thin film solar cell heterojunction
C Heske, D Eich, R Fink, E Umbach, T Van Buuren, C Bostedt, ...
Applied physics letters 74 (10), 1451-1453, 1999
1531999
Investigations on chemically capped CdS, ZnS and ZnCdS nanoparticles
SK Kulkarni, U Winkler, N Deshmukh, PH Borse, R Fink, E Umbach
Applied Surface Science 169, 438-446, 2001
1392001
Advanced thin film technology for ultrahigh resolution X-ray microscopy
J Vila-Comamala, K Jefimovs, J Raabe, T Pilvi, RH Fink, M Senoner, ...
Ultramicroscopy 109 (11), 1360-1364, 2009
1232009
An evaluation of the membrane constants and the potassium conductance in metabolically exhausted muscle fibres.
R Fink, HC Lüttgau
The Journal of Physiology 263 (2), 215-238, 1976
1151976
XPEEM with energy-filtering: advantages and first results from the SMART project
T Schmidt, U Groh, R Fink, E Umbach, O Schaff, W Engel, B Richter, ...
Surface Review and Letters 9 (01), 223-232, 2002
1062002
Detailed investigation of CdS nanoparticle surfaces by high-resolution photoelectron spectroscopy
U Winkler, D Eich, ZH Chen, R Fink, SK Kulkarni, E Umbach
Chemical Physics Letters 306 (1-2), 95-102, 1999
1041999
Line shapes and satellites in high-resolution x-ray photoelectron spectra of large π-conjugated organic molecules
A Schöll, Y Zou, M Jung, T Schmidt, R Fink, E Umbach
The Journal of chemical physics 121 (20), 10260-10267, 2004
1012004
Na‐induced effects on the electronic structure and composition of Cu(In,Ga)Se2 thin‐film surfaces
C Heske, R Fink, E Umbach, W Riedl, F Karg
Applied physics letters 68 (24), 3431-3433, 1996
1001996
Enhancement of photoluminescence in manganese-doped ZnS nanoparticles due to a silica shell
AS Ethiraj, N Hebalkar, SK Kulkarni, R Pasricha, J Urban, C Dem, ...
The Journal of chemical physics 118 (19), 8945-8953, 2003
992003
Influence of substrate morphology on organic layer growth: PTCDA on Ag (1 1 1)
H Marchetto, U Groh, T Schmidt, R Fink, HJ Freund, E Umbach
Chemical Physics 325 (1), 178-184, 2006
892006
Energy calibration and intensity normalization in high-resolution NEXAFS spectroscopy
A Schöll, Y Zou, T Schmidt, R Fink, E Umbach
Journal of Electron Spectroscopy and Related Phenomena 129 (1), 1-8, 2003
872003
SMART: An aberration-corrected XPEEM/LEEM with energy filter
R Wichtendahl, R Fink, H Kuhlenbeck, D Preikszas, H Rose, R Spehr, ...
Surface Review and Letters 5 (06), 1249-1256, 1998
861998
Isolated indium atoms on copper surfaces: A perturbed γ-γ angular correlation study
T Klas, R Fink, G Krausch, R Platzer, J Voigt, R Wesche, G Schatz
Surface Science 216 (1-2), 270-302, 1989
831989
Orientation and bonding of thiophene and 2, 2′-bithiophene on Ag (111): a combined near edge extended X-ray absorption fine structure and Xα scattered-wave study
P Väterlein, M Schmelzer, J Taborski, T Krause, F Viczian, M Bäßler, ...
Surface science 452 (1-3), 20-32, 2000
822000
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