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Co-authors
- guan chunyingHarbin Engineering UniversityVerified email at hrbeu.edu.cn
- Tie Jun CuiSoutheast University, ChinaVerified email at seu.edu.cn
- Hui Feng MaSoutheast UniversityVerified email at seu.edu.cn
- Nikolay I. ZheludevUniversity of Southampton and NTU SingaporeVerified email at soton.ac.uk
- Eric PlumOptoelectronics Research Centre & Zepler Institute, University of SouthamptonVerified email at orc.soton.ac.uk
- Shuang ZhangChair Professor, University of Hong Kong;Verified email at hku.hk
- Wei Xiang JiangSoutheast UniversityVerified email at seu.edu.cn
- Han ZhangProfessor and Director, Email: hzhang@szu.edu.cnVerified email at szu.edu.cn
- Guang-Yu NieSamsung Semiconductor, Inc.Verified email at samsung.com
- Hongchao LiuUniversity of MacauVerified email at um.edu.mo
- Anagnostis TsiatmasApplications, ASMLVerified email at asml.com
- Xu FangLecturer, University of SouthamptonVerified email at soton.ac.uk
- Edward RogersResearch Fellow, University of SouthamptonVerified email at soton.ac.uk