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Brad Bittel
Brad Bittel
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Verified email at intel.com
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Cited by
Cited by
Year
Defect structure and electronic properties of SiOC: H films used for back end of line dielectrics
TA Pomorski, BC Bittel, PM Lenahan, E Mays, C Ege, J Bielefeld, ...
Journal of Applied Physics 115 (23), 2014
672014
Spin dependent charge pumping in SiC metal-oxide-semiconductor field-effect-transistors
BC Bittel, PM Lenahan, JT Ryan, J Fronheiser, AJ Lelis
Applied Physics Letters 99 (8), 2011
492011
Ultraviolet radiation effects on paramagnetic defects in low-κ dielectrics for ultralarge scale integrated circuit interconnects
BC Bittel, PM Lenahan, SW King
Applied Physics Letters 97 (6), 2010
352010
Color center formation in vacuum sintered Nd3xY3− 3xAl5O12 transparent ceramics
AJ Stevenson, BC Bittel, CG Leh, X Li, EC Dickey, PM Lenahan, ...
Applied Physics Letters 98 (5), 2011
312011
Defects and electronic transport in hydrogenated amorphous SiC films of interest for low dielectric constant back end of the line dielectric systems
TA Pomorski, BC Bittel, CJ Cochrane, PM Lenahan, J Bielefeld, SW King
Journal of Applied Physics 114 (7), 2013
282013
Band diagram for low-k/Cu interconnects: The starting point for understanding back-end-of-line (BEOL) electrical reliability
MJ Mutch, T Pomorski, BC Bittel, CJ Cochrane, PM Lenahan, X Liu, ...
Microelectronics Reliability 63, 201-213, 2016
262016
Trap-assisted conduction in Pt-gated Gd2O3/Si capacitors
E Lipp, Z Shahar, BC Bittel, PM Lenahan, D Schwendt, HJ Osten, ...
Journal of Applied Physics 109 (7), 2011
232011
Study of Defect Structure and Electrical Transport in Back End of Line Dielectrics and SiC MOSFETs
B Bittel
52012
EDMR and EPR studies of 4H SiC MOSFETs and capacitors
CJ Cochrane, BC Bittel, PM Lenahan, J Fronheiser, K Matocha, AJ Lelis
Materials Science Forum 645, 527-530, 2010
42010
Exploring negative bias temperature instability in tri-gate mosfets through electrically detected magnetic resonance
KJ Myers, PM Lenahan, BC Bittel, I Meric
2019 IEEE International Integrated Reliability Workshop (IIRW), 1-4, 2019
32019
Increasing velocity of wafer level reliability characterization: Novel approaches and limitations
B Bittel, S Vadlamani, S Ramey, S Padiyar
2016 IEEE International Integrated Reliability Workshop (IIRW), 87-90, 2016
32016
Spin dependent charge pumping: A new tool for reliability studies
BC Bittel, PM Lenahan, JT Ryan, J Fronheiser, AJ Lelis
2011 IEEE International Integrated Reliability Workshop Final Report, 142-145, 2011
32011
An Electron Paramagnetic Resonance Study of Defects in Interlayer Dielectrics
BC Bittel, T Pomorski, PM Lenahan, S King
ECS Transactions 35 (4), 747, 2011
32011
Spin dependent charge pumping: A new tool for MOS interface characterization
BC Bittel, PM Lenahan, JT Ryan, J Fronheiser, AJ Lelis
2011 International Semiconductor Device Research Symposium (ISDRS), 1-2, 2011
22011
Defects in low-κ dielectrics and etch stop layers for use as interlayer dielectrics in ULSI
BC Bittel, TA Pomorski, PM Lenahan, S King
2010 IEEE International Integrated Reliability Workshop Final Report, 37-41, 2010
22010
Reliability and performance limiting defects in low-к dielectrics for use as interlayer dielectrics
BC Bittel, PM Lenahan, S King
2010 IEEE International Reliability Physics Symposium, 947-950, 2010
22010
Data Center Silent Data Errors: Implications to Artificial Intelligence Workloads & Mitigations
B Bittel, M Shamsa, B Inkley, A Gur, D Lerner, M Adams
2024 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2024
12024
Electron paramagnetic resonance studies of interlayer dielectrics
BC Bittel, TA Pomorski, PM Lenahan, S King, E Mays
2011 IEEE International Integrated Reliability Workshop Final Report, 50-54, 2011
12011
Band diagram for low-k/Cu interconnects
MJ Mutch, T Pomorski, BC Bittel, CJ Cochrane, PM Lenahan, X Liu, ...
Microelectronics Reliability, 2016
2016
Novel Charge Pumping method applied to tri-gate MOSFETs for reliability characterization
B Bittel, S Novak, S Ramey, S Padiyar, JT Ryan, JP Campbell, ...
2015 IEEE International Integrated Reliability Workshop (IIRW), 69-72, 2015
2015
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