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Xinping GuanShanghai Jiao Tong UniversityVerified email at sjtu.edu.cn
Cunqing HuaShanghai Jiao Tong UniversityVerified email at sjtu.edu.cn
Xuemin (Sherman) ShenUniversity Professor, University of WaterlooVerified email at uwaterloo.ca
Qiaoni HanSchool of Electronic, Information and Electrical Engineering, Shanghai Jiao Tong UniversityVerified email at sjtu.edu.cn
Haojin ZhuFIEEE, Distinguished Professor, Shanghai Jiao Tong UniversityVerified email at cs.sjtu.edu.cn
Xiaoli MaProfessor of ECE, Georgia TechVerified email at gatech.edu
Ning LuAssistant Professor, Department of Electrical and Computer Engineering, Queen's UniversityVerified email at queensu.ca
Yiyin WangShanghai Jiao Tong UniversityVerified email at sjtu.edu.cn
Zhengtao DingProfessor of Control Systems, University of ManchesterVerified email at manchester.ac.uk
haipeng pengBeijing University of Posts and TelecommunicationsVerified email at bupt.edu.cn
Hao LiangAssociate Professor, Department of Electrical and Computer Engineering, University of AlbertaVerified email at ualberta.ca
Yichang LiuSML RFIDVerified email at sml.com
Barry LennoxProfessor of Applied Control, University of ManchesterVerified email at manchester.ac.uk
Gary FengEducational Testing ServiceVerified email at ets.org