Michael J. Theisen
Michael J. Theisen
Sr. Optical Engineer
No verified email
Title
Cited by
Cited by
Year
Model development and system performance optimization for staring infrared search and track (IRST) sensors
C Olson, M Theisen, T Pace, C Halford, R Driggers
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVII 9820 …, 2016
132016
The generation and frequency measurement of short-wavelength far-infrared laser emissions
M Jackson, LR Zink, TJ Garrod, S Petersen, A Stokes, M Theisen
IEEE journal of quantum electronics 41 (12), 1528-1532, 2005
122005
Focused beam scatterometry for deep subwavelength metrology
TG Brown, MA Alonso, A Vella, MJ Theisen, ST Head, SR Gillmer, JD Ellis
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and …, 2014
112014
Staring array infrared search and track performance with dither and stare step
RG Driggers, CE Halford, MJ Theisen, DM Gaudiosi, SC Olson, GD Tener
Optical Engineering 57 (5), 053101, 2018
82018
Measurement of far-infrared laser frequencies from optically pumped CHD/sub 2/OH
TJ Garrod, S Petersen, A Stokes, M Theisen, LR Zink, M Jackson
IEEE journal of quantum electronics 41 (2), 224-226, 2005
72005
A comparison of MWIR and LWIR staring long range infrared search and track (IRST) performance
M Theisen
Mil. Sens. Symp, 2016
62016
Amplitude, phase, and polarization control with a single spatial light modulator
MJ Theisen, ST Head, TG Brown, SR Gillmer, JD Ellis
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and …, 2014
62014
Phase effects in guided mode resonances III: parametric analysis and Fano resonances
MJ Theisen, TG Brown
Journal of Modern Optics 62 (3), 244-250, 2015
4*2015
Weak measurements applied to process monitoring using focused beam scatterometry
TG Brown, MA Alonso, A Vella, MJ Theisen, ST Head
Metrology, Inspection, and Process Control for Microlithography XXVIII 9050 …, 2014
32014
Polarimetric properties of optically resonant nanostructures
MJ Theisen
University of Rochester, 2015
22015
Optical properties of gallium implanted silicon
MJ Theisen, TG Brown
Frontiers in Optics, FTu4A. 3, 2012
22012
Pulse visibility factor and its impact on infrared search and track systems
S Butrimas, RG Driggers, C Halford, H Gemar, G Tener, M Theisen, ...
Optical Engineering 58 (7), 073105, 2019
12019
Validation of an infrared sensor model with field collected imagery of unresolved unmanned aerial vehicle (UAV) targets
H Gemar, R Driggers, G Tener, C Halford, N Fudala, J Hewitt, R Short, ...
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX 11001 …, 2019
12019
Validation of infrared sensor model with field-collected imagery of unresolved unmanned aerial vehicle targets
H Gemar, RG Driggers, GD Tener, CE Halford, N Fudala, J Hewitt, ...
Optical Engineering 58 (5), 053107, 2019
12019
Focused beam scatterometry apparatus and method
MA Alonso, S Head, M Theisen, T Brown
US Patent 9,793,178, 2017
12017
Method and tool for generating and managing image quality allocations through the design and development process
AW Sparks, C Olson, MJ Theisen, CJ Addiego, TG Hutchins, ...
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVII 9820 …, 2016
12016
Phase effects in guided mode resonances II: measuring the angular phase of a surface plasmon polariton
MJ Theisen, TG Brown
Journal of Modern Optics 62 (3), 236-243, 2015
2015
Systems-level integration for focused beam scatterometry
SR Gillmer, ST Head, MJ Theisen, TG Brown, JD Ellis
30th Annual Meeting of the American Society for Precision Engineering, ASPE …, 2015
2015
Phase response of guided mode resonance structures
MJ Theisen, TG Brown
Frontiers in Optics, JW3A. 36, 2014
2014
Phase effects in guided mode resonance filters
MJ Theisen, TG Brown
International Optical Design Conference, IM2B. 7, 2014
2014
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Articles 1–20