| py4DSTEM: A software package for four-dimensional scanning transmission electron microscopy data analysis BH Savitzky, SE Zeltmann, LA Hughes, HG Brown, S Zhao, PM Pelz, ... Microscopy and Microanalysis 27 (4), 712-743, 2021 | 178 | 2021 |
| Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping TC Pekin, C Gammer, J Ciston, AM Minor, C Ophus Ultramicroscopy 176, 170-176, 2017 | 93 | 2017 |
| Direct measurement of nanostructural change during in situ deformation of a bulk metallic glass TC Pekin, J Ding, C Gammer, B Ozdol, C Ophus, M Asta, RO Ritchie, ... Nature communications 10 (1), 2445, 2019 | 57 | 2019 |
| Local nanoscale strain mapping of a metallic glass during in situ testing C Gammer, C Ophus, TC Pekin, J Eckert, AM Minor Applied Physics Letters 112 (17), 2018 | 53 | 2018 |
| In situ nanobeam electron diffraction strain mapping of planar slip in stainless steel TC Pekin, C Gammer, J Ciston, C Ophus, AM Minor Scripta Materialia 146, 87-90, 2018 | 53 | 2018 |
| Evaluation of neon focused ion beam milling for TEM sample preparation TC Pekin, FI Allen, AM Minor Journal of microscopy 264 (1), 59-63, 2016 | 31 | 2016 |
| Evaluation fo Neon Focused Ion Beam Milling for TEM sample Preparation TC Pekin, FI Allen, AM Minor Microscopy and Microanalysis 22 (S3), 146-147, 2016 | 31 | 2016 |
| Overcoming information reduced data and experimentally uncertain parameters in ptychography with regularized optimization M Schloz, TC Pekin, Z Chen, W Van den Broek, DA Muller, CT Koch Optics Express 28 (19), 28306-28323, 2020 | 28 | 2020 |
| Functional materials under stress: In situ TEM observations of structural evolution Y Deng, R Zhang, TC Pekin, C Gammer, J Ciston, P Ercius, C Ophus, ... Advanced Materials 32 (27), 1906105, 2020 | 19 | 2020 |
| Fast grain mapping with sub-nanometer resolution using 4D-STEM with grain classification by principal component analysis and non-negative matrix factorization FI Allen, TC Pekin, A Persaud, SJ Rozeveld, GF Meyers, J Ciston, ... Microscopy and microanalysis 27 (4), 794-803, 2021 | 13 | 2021 |
| A three-dimensional reconstruction algorithm for scanning transmission electron microscopy data from a single sample orientation HG Brown, PM Pelz, SL Hsu, Z Zhang, R Ramesh, K Inzani, E Sheridan, ... Microscopy and Microanalysis 28 (5), 1632-1640, 2022 | 9 | 2022 |
| Towards ptychography with structured illumination, and a derivative-based reconstruction algorithm W Van den Broek, M Schloz, TC Pekin, PM Pelz, PH Lu, M Kruth, V Grillo, ... Microscopy and Microanalysis 25 (S2), 58-59, 2019 | 8 | 2019 |
| py4DSTEM: a software package for multimodal analysis of four-dimensional scanning transmission electron microscopy datasets. arXiv e-prints 2020 BH Savitzky, LA Hughes, SE Zeltmann, HG Brown, S Zhao, PM Pelz, ... arXiv preprint arXiv:2003.09523, 2003 | 6 | 2003 |
| Deep reinforcement learning for data-driven adaptive scanning in ptychography M Schloz, J Müller, TC Pekin, W Van den Broek, J Madsen, T Susi, ... Scientific Reports 13 (1), 8732, 2023 | 5 | 2023 |
| LiberTEM/LiberTEM: 0.13. 1 A Clausen, L Houben, J Müller, A Stewart, R Chandra, ... Physik Nanoskaliger Systeme, 2023 | 5 | 2023 |
| Evaluating the effects of pillar shape and gallium ion beam damage on the mechanical properties of single crystal aluminum nanopillars Y Yang, SY Wang, B Xiang, S Yin, TC Pekin, X Li, R Zhang, K Yano, ... Journal of Materials Research 36, 2515-2528, 2021 | 5 | 2021 |
| Direct Observation of SRO effect of Ti-6Al Alloy Using Energy-filtered TEM and Scanning Nanobeam Electron Diffraction R Zhang, R Traylor, T Pekin, B Ozdol, C Ophus, AM Minor Microscopy and Microanalysis 24 (S1), 210-211, 2018 | 3 | 2018 |
| Comparison of Compression Methods for Ptychographic Reconstructions through Decomposition of the Diffraction Patterns in Orthonormal Bases A Gladyshev, M Schloz, TC Pekin, CT Koch Microscopy and Microanalysis 28 (S1), 394-397, 2022 | 2 | 2022 |
| Adaptive Scanning in Ptychography through Deep Reinforcement Learning M Schloz, J Müller, T Pekin, W Van den Broek, C Koch Microscopy and Microanalysis 27 (S1), 818-821, 2021 | 2 | 2021 |
| Imaging Short-range Order and Extracting 3-D Strain Tensor Using Energy-filtered 4D-STEM Techniques R Zhang, S Zeltmann, C Ophus, B Savitzky, T Pekin, E Rothchild, ... Microscopy and Microanalysis 26 (S2), 936-938, 2020 | 2 | 2020 |
Andrew MinorUniversity of California, Berkeley and Lawrence Berkeley National LaboratoryVerified email at lbl.gov
