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Co-authors
Rodney RuoffThe IBS CMCM, Dept of Chemistry, School of Energy and ChEng, School of MS&EVerified email at unist.ac.kr
Robert M. WallaceUniversity of Texas at DallasVerified email at utdallas.edu
Antonio L P RotondaroTokyo Electron AmericaVerified email at us.tel.com
Archana VenugopalTechnologist at Texas InstrumentsVerified email at ti.com
Emanuel TutucProfessor, The University of Texas at AustinVerified email at mer.utexas.edu
Seyoung KimPOSTECH, South KoreaVerified email at postech.ac.kr
Eric M VogelProfessor of Materials Science and Engineering, Georgia Institute of TechnologyVerified email at mse.gatech.edu
Jiyoung KimProfessor of Materials Science and Engineering, University of Texas at DallasVerified email at utdallas.edu
Theodore S. MoiseTexas InstrumentsVerified email at ti.com
Francesco BonaccorsoBeDimensional S.p.A., Istituto Italiano di TecnologiaVerified email at iit.it
Manuel Quevedo-lopezUniversity of Texas at DallasVerified email at utdallas.edu
Xuesong LiUniversity of Electronic Science and Technology of ChinaVerified email at uestc.edu.cn
Stephen McDonnellUniversity of VirginiaVerified email at virginia.edu
Junghyo NahProfessor, Dept. of Electrical Engineering, Chungnam National UniversityVerified email at cnu.ac.kr
Yufeng Hao (郝玉峰)Nanjing UniversityVerified email at nju.edu.cn
"KS Novoselov" or "K Novoselov"University of ManchesterVerified email at manchester.ac.uk
Rafik AddouOregon State UniversityVerified email at oregonstate.edu
Harry ChouUniversity of Texas at AustinVerified email at utexas.edu
Babak FallahazadSoC Device Engineer, IntelVerified email at intel.com
Cheng GongAssistant Professor, University of MarylandVerified email at umd.edu