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Christina L. Porter
Christina L. Porter
Graduate Student in Physics, University of Colorado, Boulder
Verified email at colorado.edu
Title
Cited by
Cited by
Year
Subwavelength coherent imaging of periodic samples using a 13.5 nm tabletop high-harmonic light source
DF Gardner, M Tanksalvala, ER Shanblatt, X Zhang, BR Galloway, ...
Nature Photonics 11 (4), 259-263, 2017
1972017
Nondestructive, high-resolution, chemically specific 3D nanostructure characterization using phase-sensitive EUV imaging reflectometry
M Tanksalvala, CL Porter, Y Esashi, B Wang, NW Jenkins, Z Zhang, ...
Science Advances 7 (5), eabd9667, 2021
682021
Ptychographic hyperspectral spectromicroscopy with an extreme ultraviolet high harmonic comb
B Zhang, DF Gardner, MH Seaberg, ER Shanblatt, CL Porter, R Karl, ...
Optics express 24 (16), 18745-18754, 2016
632016
Synergistic effect of Bi-doped exfoliated MoS 2 nanosheets on their bactericidal and dye degradation potential
U Qumar, M Ikram, M Imran, A Haider, A Ul-Hamid, J Haider, KN Riaz, ...
Dalton Transactions 49 (16), 5362-5377, 2020
582020
Quantitative chemically specific coherent diffractive imaging of reactions at buried interfaces with few nanometer precision
ER Shanblatt, CL Porter, DF Gardner, GF Mancini, RM Karl Jr, ...
Nano letters 16 (9), 5444-5450, 2016
502016
General-purpose, wide field-of-view reflection imaging with a tabletop 13 nm light source
CL Porter, M Tanksalvala, M Gerrity, G Miley, X Zhang, C Bevis, ...
Optica 4 (12), 1552-1557, 2017
412017
Spatial, spectral, and polarization multiplexed ptychography
R Karl, C Bevis, R Lopez-Rios, J Reichanadter, D Gardner, C Porter, ...
Optics express 23 (23), 30250-30258, 2015
392015
Full-field imaging of thermal and acoustic dynamics in an individual nanostructure using tabletop high harmonic beams
RM Karl Jr, GF Mancini, JL Knobloch, TD Frazer, JN Hernandez-Charpak, ...
Science advances 4 (10), eaau4295, 2018
362018
Multiple beam ptychography for large field-of-view, high throughput, quantitative phase contrast imaging
C Bevis, R Karl Jr, J Reichanadter, DF Gardner, C Porter, E Shanblatt, ...
Ultramicroscopy 184, 164-171, 2018
212018
High-resolution wavefront sensing and aberration analysis of multi-spectral extreme ultraviolet beams
M Du, X Liu, A Pelekanidis, F Zhang, L Loetgering, P Konold, CL Porter, ...
Optica 10 (2), 255-263, 2023
132023
RK Jr, C
DF Gardner, M Tanksalvala, ER Shanblatt, X Zhang, BR Galloway, ...
Bevis, DE Adams, HC Kapteyn, MM Murnane, and GF Mancini,“Subwavelength …, 0
8
Quantitative chemically-specific coherent diffractive imaging of buried interfaces using a tabletop EUV nanoscope
ER Shanblatt, CL Porter, DF Gardner, GF Mancini, RM Karl Jr, ...
arXiv preprint arXiv:1603.01301, 2016
62016
Two-tone frequency-modulation stimulated Rayleigh spectroscopy
GW Faris, A Markosyan, CL Porter, S Doshay
Optics Letters 39 (15), 4615-4618, 2014
62014
Soft x-ray: novel metrology for 3D profilometry and device pitch overlay
C Porter, T Coenen, N Geypen, S Scholz, L van Rijswijk, HK Nienhuys, ...
Metrology, Inspection, and Process Control XXXVII 12496, 412-420, 2023
52023
Complex Spatially-Resolved Reflectometry/Refractometry
C Porter, DE Adams, M Tanksalvala, E Shanblatt, MM Murnane, ...
US Patent App. 16/303,059, 2019
52019
Reflection Mode Tabletop Coherent Diffraction Imaging of Buried Nanostructures
ER Shanblatt, CL Porter, DF Gardner, GF Mancini, R Karl, C Bevis, ...
Frontiers in Optics, FW6B. 2, 2015
32015
Stroboscopic Imaging of Acoustic Waves in Nanostructures using Tabletop High Harmonics
R Karl, G Mancini, D Gardner, J Knobloch, T Frazer, ...
Computational Optical Sensing and Imaging, CW1B. 2, 2017
22017
Full-field functional imaging of nanoscale dynamics using tabletop high harmonics
RM Karl, GF Mancini, D Gardner, E Shanblatt, J Knobloch, T Frazer, ...
CLEO: Applications and Technology, JTh5C. 8, 2017
22017
Sub-wavelength transmission and reflection mode tabletop imaging with 13nm illumination via ptychography CDI
M Tanksalvala, CL Porter, DF Gardner Jr, M Gerrity, GF Mancini, X Zhang, ...
Metrology, Inspection, and Process Control for Microlithography XXXI 10145 …, 2017
22017
Method for correcting measurements in the manufacture of integrated circuits and associated apparatuses
HK Nienhuys, TJ Coenen, SB Roobol, J Cottaar, SI Mossavat, N Geypen, ...
US Patent App. 17/787,253, 2023
12023
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