Theodosia Gougousi
Theodosia Gougousi
Professor of Physics, UMBC
Verified email at umbc.edu - Homepage
Title
Cited by
Cited by
Year
Microcontact patterning of ruthenium gate electrodes by selective area atomic layer deposition
KJ Park, JM Doub, T Gougousi, GN Parsons
Applied Physics Letters 86 (5), 051903, 2005
1682005
Photodissociation study of in the first continuum
T Gougousi, PC Samartzis, TN Kitsopoulos
The Journal of chemical physics 108 (14), 5742-5746, 1998
1291998
Properties of La-silicate high-K dielectric films formed by oxidation of La on silicon
T Gougousi, MJ Kelly, DB Terry, GN Parsons
Journal of applied physics 93 (3), 1691-1696, 2003
1022003
Deposition of yttrium oxide thin films in supercritical carbon dioxide
T Gougousi, Z Chen
Thin Solid Films 516 (18), 6197-6204, 2008
992008
Properties of atomic layer deposited HfO2 thin films
JC Hackley, T Gougousi
Thin Solid Films 517 (24), 6576-6583, 2009
912009
Atmospheric pressure plasma enhanced chemical vapor deposition of hydrophobic coatings using fluorine-based liquid precursors
JH Yim, V Rodriguez-Santiago, AA Williams, T Gougousi, DD Pappas, ...
Surface and Coatings Technology 234, 21-32, 2013
862013
Metal Oxide Thin Films Deposited from Metal Organic Precursors in Supercritical CO2 Solutions
T Gougousi, D Barua, ED Young, GN Parsons
Chemistry of materials 17 (20), 5093-5100, 2005
762005
Recombination of H3+ and D3+ ions in a flowing afterglow plasma
T Gougousi, R Johnsen, MF Golde
International Journal of Mass Spectrometry and Ion Processes 149, 131-151, 1995
751995
Carbonate formation during post-deposition ambient exposure of high- dielectrics
T Gougousi, D Niu, RW Ashcraft, GN Parsons
Applied physics letters 83 (17), 3543-3545, 2003
672003
Electron-ion recombination rate coefficient measurements in a flowing afterglow plasma
T Gougousi, MF Golde, R Johnsen
Chemical physics letters 265 (3-5), 399-403, 1997
671997
Nucleation of atomic layer deposition films on chemical oxide and H-terminated Si
JC Hackley, T Gougousi, JD Demaree
Journal of Applied Physics 102 (3), 034101, 2007
622007
High electron velocity submicrometer AlN/GaN MOS-HEMTs on freestanding GaN substrates
DJ Meyer, DA Deen, DF Storm, MG Ancona, DS Katzer, R Bass, ...
IEEE electron device letters 34 (2), 199-201, 2013
592013
Interface of atomic layer deposited films on GaAs (100) surfaces
JC Hackley, JD Demaree, T Gougousi
Applied Physics Letters 92 (16), 162902, 2008
582008
Photofragmentation study of Cl using ion imaging
PC Samartzis, I Sakellariou, T Gougousi, TN Kitsopoulos
The Journal of chemical physics 107 (1), 43-48, 1997
581997
Langmuir-probe measurements in flowing-afterglow plasmas
R Johnsen, EV Shun’ko, T Gougousi, MF Golde
Physical Review E 50 (5), 3994, 1994
501994
Tip-enhanced strong coupling spectroscopy, imaging, and control of a single quantum emitter
KD Park, MA May, H Leng, J Wang, JA Kropp, T Gougousi, M Pelton, ...
Science advances 5 (7), eaav5931, 2019
482019
Atomic layer deposited gate insulation for enhancing breakdown voltage of AlN/GaN high electron mobility transistors
DA Deen, DF Storm, R Bass, DJ Meyer, DS Katzer, SC Binari, JW Lacis, ...
Applied Physics Letters 98 (2), 023506, 2011
472011
Measurement of the absolute yield of products in the dissociative recombination of ions with electrons
MP Skrzypkowski, T Gougousi, R Johnsen, MF Golde
The Journal of chemical physics 108 (20), 8400-8407, 1998
471998
The role of the OH species in high-k/polycrystalline silicon gate electrode interface reactions
T Gougousi, MJ Kelly, GN Parsons
Applied Physics Letters 80 (23), 4419-4421, 2002
462002
Native oxide consumption during the atomic layer deposition of TiO2 films on GaAs (100) surfaces
T Gougousi, JW Lacis
Thin Solid Films 518 (8), 2006-2009, 2010
452010
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Articles 1–20