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Ryan J. Gasvoda
Ryan J. Gasvoda
Verified email at lamresearch.com
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Year
Surface Phenomena During Plasma-Assisted Atomic Layer Etching of SiO2
RJ Gasvoda, AW van de Steeg, R Bhowmick, EA Hudson, S Agarwal
ACS applied materials & interfaces 9 (36), 31067-31075, 2017
522017
Etch selectivity during plasma-assisted etching of SiO2 and SiNx: Transitioning from reactive ion etching to atomic layer etching
RJ Gasvoda, Z Zhang, S Wang, EA Hudson, S Agarwal
Journal of Vacuum Science & Technology A 38 (5), 2020
402020
Surface prefunctionalization of SiO2 to modify the etch per cycle during plasma-assisted atomic layer etching
RJ Gasvoda, YGP Verstappen, S Wang, EA Hudson, S Agarwal
Journal of Vacuum Science & Technology A 37 (5), 2019
242019
Gas Phase Organic Functionalization of SiO2 with Propanoyl Chloride
RJ Gasvoda, S Wang, DM Hausmann, EA Hudson, S Agarwal
Langmuir 34 (48), 14489-14497, 2018
182018
Mechanism for growth initiation on aminosilane-functionalized SiO2 during area-selective atomic layer deposition of ZrO2
W Xu, PC Lemaire, K Sharma, RJ Gasvoda, DM Hausmann, S Agarwal
Journal of Vacuum Science & Technology A 39 (3), 2021
112021
Selective Gas-Phase Functionalization of SiO2 and SiNx Surfaces with Hydrocarbons
RJ Gasvoda, W Xu, Z Zhang, S Wang, EA Hudson, S Agarwal
Langmuir 37 (13), 3960-3969, 2021
112021
Gas-phase surface functionalization of SiNx with benzaldehyde to increase SiO2 to SiNx etch selectivity in atomic layer etching
RJ Gasvoda, Z Zhang, EA Hudson, S Agarwal
Journal of Vacuum Science & Technology A 39 (4), 2021
82021
Vacancy Healing as a Desorption Tool: Oxygen Triggered Removal of Stored Ammonia from NiO1–x/MOR Validated by Experiments and Simulations
JM Crawford, R Anderson, RJ Gasvoda, NC Kovach, CS Smoljan, ...
ACS Applied Energy Materials 3 (9), 8233-8239, 2020
82020
Area-selective atomic layer deposition of Al2O3 on SiNx with SiO2 as the nongrowth surface
W Xu, RJ Gasvoda, PC Lemaire, K Sharma, DM Hausmann, S Agarwal
Journal of Vacuum Science & Technology A 40 (1), 2022
62022
Investigating silver nanoparticle interactions with quaternary ammonium functionalized triblock copolymers and their effect on midblock crystallinity
NC Buggy, Y Du, MC Kuo, RJ Gasvoda, S Seifert, S Agarwal, ...
ACS Applied Polymer Materials 2 (11), 4914-4923, 2020
62020
Control of etch profiles in high aspect ratio holes via precise reactant dosing in thermal atomic layer etching
A Fischer, A Routzahn, RJ Gasvoda, J Sims, T Lill
Journal of Vacuum Science & Technology A 40 (2), 2022
52022
Designing anion-exchange ionomers with oriented nanoscale phase separation at a Silver interface
NC Buggy, Y Du, MC Kuo, S Seifert, RJ Gasvoda, S Agarwal, ...
The Journal of Physical Chemistry C 125 (37), 20592-20605, 2021
42021
Surface reaction modelling of thermal atomic layer etching on blanket hafnium oxide and its application on high aspect ratio structures
A Fischer, D Mui, A Routzahn, R Gasvoda, J Sims, T Lill
Journal of Vacuum Science & Technology A 41 (1), 2023
32023
Selective functionalization of partially etched SiNx to enhance SiO2 to SiNx etch selectivity
RJ Gasvoda, X Wang, P Kumar, EA Hudson, S Agarwal
Journal of Vacuum Science & Technology A 39 (5), 2021
12021
Selective thermal atomic layer deposition
RM Pearlstein, X Lei, RG Ridgeway, A Wu, YC Lee, S Agarwal, ...
US Patent App. 18/254,467, 2024
2024
SELECTIVE ATTACHMENT TO ENHANCE SIO2:SINX ETCH SELECTIVITY
E Hudson, CC A. Wang, S Agarwal, R Gasvoda
US Patent 17,754,020, 2022
2022
(Invited) Transport and Reaction Kinetics of Thermal ALE in High Aspect Ratio Hafnium Oxide Structures
A Fischer, D Mui, A Routzahn, RJ Gasvoda, J Sims, T Lill
Electrochemical Society Meeting Abstracts 242, 884-884, 2022
2022
Selective plasma enhanced atomic layer deposition
RM Pearlstein, X Lei, RG Ridgeway, A Wu, Y Lee, S Agarwal, ...
WO Patent WO2022119865A1, 2022
2022
Inhibiting Thermal and O2 Plasma Assisted ALD of SiO2 using Fluorothiol Passivation Layer on Cu
RN Kavassery Ramesh, W Xu, RJ Gasvoda, X Lei, A Derecskei, ...
Electrochemical Society Meeting Abstracts 240, 854-854, 2021
2021
Inhibiting Thermal and O2 Plasma Assisted ALD of SiO2 using Fluorothiol Passivation Layer on Cu
RNK Ramesh, W Xu, RJ Gasvoda, X Lei, A Derecskei, H Chandra, ...
240th ECS Meeting (October 10-14, 2021), 2021
2021
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