| Automatic reverse engineering of CAN bus data using machine learning techniques T Huybrechts, Y Vanommeslaeghe, D Blontrock, G Van Barel, P Hellinckx Advances on P2P, Parallel, Grid, Cloud and Internet Computing: Proceedings …, 2018 | 55 | 2018 |
| Proof of concept of high-rate decentralized pre-composting of kitchen waste: Optimizing design and operation of a novel drum reactor M Sakarika, M Spiller, R Baetens, G Donies, J Vanderstuyf, K Vinck, ... Waste Management 91, 20-32, 2019 | 29 | 2019 |
| Determination of the Young's modulus of poly-SiGe micromachined structures using novel mechanical actuation test techniques G Van Barel, R Modlinski, M Mastrangeli, A Witvrouw Eurosensors XX 2, 382-3, 2006 | 10 | 2006 |
| 4D Active and passive thermography measurement system using a KUKA KR16 robot and time-of-flight imaging B Ribbens, J Peeters, B Bogaerts, G Steenackers, S Sels, R Penne, ... Quantitative InfraRed Thermography, 670-677, 2016 | 8 | 2016 |
| Apparent and steady-state etch rates in thin film etching and under-etching of microstructures: I. Modelling G Van Barel, L Mertens, W De Ceuninck, A Witvrouw Journal of Micromechanics and Microengineering 20 (5), 055033, 2010 | 6 | 2010 |
| The influence of geometrical imperfections in micromachined cantilevers on the extracted Young's modulus using a simple model G Van Barel, W De Ceuninck, A Witvrouw Journal of Micromechanics and Microengineering 18 (11), 115027, 2008 | 6 | 2008 |
| Stacked boron doped poly-crystalline silicon-germanium layers: an excellent MEMS structural material G Claes, G Van Barel, R Van Hoof, B Du Bois, M Gromova, A Verbist, ... MRS Online Proceedings Library (OPL) 1075, 1075-J05-02, 2008 | 6 | 2008 |
| Apparent and steady-state etch rates in thin film etching and under-etching of microstructures: II. Characterization G Van Barel, B Du Bois, R Van Hoof, J De Wachter, W De Ceuninck, ... Journal of Micromechanics and Microengineering 20 (5), 055034, 2010 | 5 | 2010 |
| Apparent and steady-state etch rates in thin film etching and under-etching of microstructures: 2: characterization G Van Barel, B Du Bois, R Van Hoof, J De Wachter, W De Ceuninck, ... Journal of micromechanics and microengineering.-Bristol, 1-6, 2010 | 2 | 2010 |
| Fast Ground Detection for Range Cameras on Road Surfaces Using a Three-Step Segmentation I Van Crombrugge, IB Azza, R Penne, G Van Barel, S Vanlanduit Advanced Concepts for Intelligent Vision Systems: 18th International …, 2017 | 1 | 2017 |
| In-situ characterization of mechanical properties of MEMS structural layers using different test approaches, with application to thick poly-SiGe G Van Barel | 1 | 2011 |
| Processing and characterisation of poly-SiGe micromachined resonators and comparison with SOI G Claes, R Van Hoof, B Du Bois, G Van Barel, S Stoffels, S Decoutere, ... Proceedings of Eurosensors XXII, 831-834, 2008 | 1 | 2008 |
| Investigation of intrinsic stress effects in cantilever structures C Hollauer, H Ceric, G Van Barel, A Witvrouw, S Selberherr 2007 2nd IEEE International Conference on Nano/Micro Engineered and …, 2007 | 1 | 2007 |
| An Analysis of Beam Deflections in Poly-SiGe Cantilevers M Gonzalez, G Van Barel, A Witvrouw, B Vandevelde EuroSime 2006-7th International Conference on Thermal, Mechanical and …, 2006 | 1 | 2006 |
| Fast Ground Detection for Range Cameras on Road Surfaces Using a Three-Step Segmentation G Van Barel, S Vanlanduit Advanced Concepts for Intelligent Vision Systems: 18th International …, 2017 | | 2017 |
| Structure and method for testing MEMS devices G Van Barel US Patent 8,124,428, 2012 | | 2012 |
| Method for testing MEMS devices: EP 2202197 G Van Barel | | 2009 |
| Stacked boron doped poly-crystalline silicon-germanium: an excellent MEMS structural layer G Claes, G Van Barel, R Van Hoof, B Du Bois, JP Celis, A Witvrouw Passive and electromechanical materials and integration: proceedings of a …, 2008 | | 2008 |
| The influence of geometrical non-idealities in surface micro fabricated MEMS test structures on the extracted Young's modulus using analytical expressions assuming ideal … G Van Barel, A Witvrouw | | 2007 |
| Fabrication scheme for the in-situ mechanical characterization of freestanding MEMS structural layers, applied to Poly-SiGe G Van Barel, R Van Hoof, B Du Bois, A Verbist, A Witvrouw Materials for advanced metallization: MAM 2007, March 4-7, 2007, Brugge, Belgium, 2007 | | 2007 |
