| Cycle-time key factor identification and prediction in semiconductor manufacturing using machine learning and data mining Y Meidan, B Lerner, G Rabinowitz, M Hassoun IEEE transactions on semiconductor manufacturing 24 (2), 237-248, 2011 | 113 | 2011 |
| SMT2020—A semiconductor manufacturing testbed D Kopp, M Hassoun, A Kalir, L Mönch IEEE Transactions on Semiconductor Manufacturing 33 (4), 522-531, 2020 | 57 | 2020 |
| A new high-volume/low-mix simulation testbed for semiconductor manufacturing M Hassoun, D Kopp, L Mönch, A Kalir 2019 Winter Simulation Conference (WSC), 2419-2428, 2019 | 21 | 2019 |
| Equilibria, stability, and transients in re-entrant lines under FBFS and LBFS dispatch and constant release CB Yan, M Hassoun, SM Meerkov IEEE Transactions on Semiconductor Manufacturing 25 (2), 211-229, 2012 | 18 | 2012 |
| The single line moving target traveling salesman problem with release times M Hassoun, S Shoval, E Simchon, L Yedidsion Annals of Operations Research 289, 449-458, 2020 | 16 | 2020 |
| Integrating critical queue time constraints into SMT2020 simulation models D Kopp, M Hassoun, A Kalir, L Mönch 2020 Winter Simulation Conference (WSC), 1813-1824, 2020 | 15 | 2020 |
| Data mining for cycle time key factor identification and prediction in semiconductor manufacturing Y Meidan, B Lerner, M Hassoun, G Rabinowitz IFAC Proceedings Volumes 42 (4), 217-222, 2009 | 14 | 2009 |
| Towards a new simulation testbed for semiconductor manufacturing M Hassoun, A Kalir 2017 Winter Simulation Conference (WSC), 3612-3623, 2017 | 13 | 2017 |
| Setting defect charts control limits to balance cycle time and yield for a tandem production line M Gilenson, M Hassoun, L Yedidsion Computers & Operations Research 53, 301-308, 2015 | 13 | 2015 |
| On improving the predictability of cycle time in an NVM fab by correct segmentation of the process M Hassoun IEEE transactions on semiconductor manufacturing 26 (4), 613-618, 2013 | 12 | 2013 |
| Identification and cost estimation of WIP bubbles in a fab M Hassoun, G Rabinowitz, S Lachs IEEE transactions on semiconductor manufacturing 21 (2), 217-223, 2008 | 12 | 2008 |
| On the benefits of providing timely information in ticket queues with balking and calling times G Hanukov, M Hassoun, O Musicant Mathematics 9 (21), 2753, 2021 | 8 | 2021 |
| Hunting down the bubble makers in fabs M Hassoun, G Rabinowitz IEEE transactions on semiconductor manufacturing 23 (1), 13-20, 2009 | 8 | 2009 |
| The newsvendor problem with GHG emissions from waste disposal under cap-and-trade regulation JP Gayon, M Hassoun International Journal of Production Research, 1-21, 2024 | 6 | 2024 |
| On the importance of variability when managing metrology capacity S Dauzère-Pérès, M Hassoun European Journal of Operational Research 282 (1), 267-276, 2020 | 3 | 2020 |
| A Lagrangian heuristic for minimising risk using multiple heterogeneous metrology tools S Dauzère-Pérès, M Hassoun, A Sendon International Journal of Production Research 58 (4), 1222-1238, 2020 | 3 | 2020 |
| Allocating metrology capacity to multiple heterogeneous machines S Dauzère-Pérès, M Hassoun, A Sendon International Journal of Production Research 54 (20), 6082-6091, 2016 | 3 | 2016 |
| Optimizing capacity assignment of multiple identical metrology tools S Dauzère-Pérès, M Hassoun, A Sendon 2016 Winter Simulation Conference (WSC), 2709-2718, 2016 | 2 | 2016 |
| Setting quality control requirements to balance between Cycle Time and Yield in a semiconductor production line M Gilenson, M Hassoun, L Yedidsion Proceedings of the Winter Simulation Conference 2014, 2422-2433, 2014 | 2 | 2014 |
| Setting quality control requirements to balance cycle time and yield—The single machine case M Gilenson, L Yedidsion, M Hassoun Proceedings of the 2012 Winter Simulation Conference (WSC), 1-9, 2012 | 2 | 2012 |
Adar KalirProfessor of Operation Research, Ben Gurion University (BGU) and Ruppin Academic Center (RAC)Verified email at intel.com
