Follow
Naoyuki Taketoshi
Naoyuki Taketoshi
NMIJ/AIST
Verified email at aist.go.jp
Title
Cited by
Cited by
Year
Development of a thermal diffusivity measurement system for metal thin films using a picosecond thermoreflectance technique
N Taketoshi, T Baba, A Ono
Measurement Science and Technology 12 (12), 2064, 2001
1562001
Thermal transport properties of polycrystalline tin-doped indium oxide films
T Ashida, A Miyamura, N Oka, Y Sato, T Yagi, N Taketoshi, T Baba, ...
Journal of applied physics 105 (7), 2009
1542009
Lattice thermal conductivity of MgSiO3 perovskite and post-perovskite at the core–mantle boundary
K Ohta, T Yagi, N Taketoshi, K Hirose, T Komabayashi, T Baba, Y Ohishi, ...
Earth and Planetary Science Letters 349, 109-115, 2012
1272012
Analysis on thermal properties of tin doped indium oxide films by picosecond thermoreflectance measurement
T Yagi, K Tamano, Y Sato, N Taketoshi, T Baba, Y Shigesato
Journal of Vacuum Science & Technology A 23 (4), 1180-1186, 2005
1042005
Observation of heat diffusion across submicrometer metal thin films using a picosecond thermoreflectance technique
NTN Taketoshi, TBT Baba, AOA Ono
Japanese Journal of Applied Physics 38 (11A), L1268, 1999
971999
Thermoreflectance technique to measure thermal effusivity distribution with high spatial resolution
K Hatori, N Taketoshi, T Baba, H Ohta
Review of scientific instruments 76 (11), 2005
902005
Temperature dependence of thermal conductivity of VO2 thin films across metal–insulator transition
H Kizuka, T Yagi, J Jia, Y Yamashita, S Nakamura, N Taketoshi, ...
Japanese journal of applied physics 54 (5), 053201, 2015
802015
Thermal conductivity of amorphous indium–gallium–zinc oxide thin films
T Yoshikawa, T Yagi, N Oka, J Jia, Y Yamashita, K Hattori, Y Seino, ...
Applied Physics Express 6 (2), 021101, 2013
712013
Homodyne detection technique using spontaneously generated reference signal in picosecond thermoreflectance measurements
N Taketoshi, T Baba, E Schaub, A Ono
Review of scientific instruments 74 (12), 5226-5230, 2003
642003
Development of ultrafast laser flash methods for measuring thermophysical properties of thin films and boundary thermal resistances
T Baba, N Taketoshi, T Yagi
Japanese Journal of Applied Physics 50 (11S), 11RA01, 2011
622011
Development of ultrafast laser flash methods for measuring thermophysical properties of thin films and boundary thermal resistances
T Baba, N Taketoshi, T Yagi
Japanese Journal of Applied Physics 50 (11S), 11RA01, 2011
622011
Electrical delay technique in the picosecond thermoreflectance method for thermophysical property measurements of thin films
N Taketoshi, T Baba, A Ono
Review of scientific instruments 76 (9), 2005
542005
Thermal diffusivity measurement in a diamond anvil cell using a light pulse thermoreflectance technique
T Yagi, K Ohta, K Kobayashi, N Taketoshi, K Hirose, T Baba
Measurement Science and Technology 22 (2), 024011, 2010
522010
Measurements of temperature dependence of optical and thermal properties of optical disk materials
M Kuwahara, O Suzuki, N Taketoshi, Y Yamakawa, T Yagi, P Fons, ...
Japanese journal of applied physics 45 (2S), 1419, 2006
522006
Temperature dependence of the thermal properties of optical memory materials
M Kuwahara, O Suzuki, Y Yamakawa, N Taketoshi, T Yagi, P Fons, ...
Japanese journal of applied physics 46 (6S), 3909, 2007
492007
Measurement of the thermal conductivity of nanometer scale thin films by thermoreflectance phenomenon
M Kuwahara, O Suzuki, Y Yamakawa, N Taketoshi, T Yagi, P Fons, ...
Microelectronic engineering 84 (5-8), 1792-1796, 2007
432007
Thermophysical properties of aluminum oxide and molybdenum layered films
N Oka, R Arisawa, A Miyamura, Y Sato, T Yagi, N Taketoshi, T Baba, ...
Thin Solid Films 518 (11), 3119-3121, 2010
412010
Effect of electrical properties on thermal diffusivity of amorphous indium zinc oxide films
T Ashida, A Miyamura, Y Sato, T Yagi, N Taketoshi, T Baba, Y Shigesato
Journal of Vacuum Science & Technology A 25 (4), 1178-1183, 2007
412007
Thermal conductivity of hetero-epitaxial ZnO thin films on c-and r-plane sapphire substrates: Thickness and grain size effect
Y Yamashita, K Honda, T Yagi, J Jia, N Taketoshi, Y Shigesato
Journal of Applied Physics 125 (3), 2019
402019
Development of a thermal diffusivity measurement system with a picosecond thermoreflectance technique
N Taketoshi, T Baba, A Ono
計量研究所報告 46 (4), 246-253, 1997
321997
The system can't perform the operation now. Try again later.
Articles 1–20