Niklas Dellby
Niklas Dellby
Unknown affiliation
Verified email at nion.com
TitleCited byYear
Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy
OL Krivanek, MF Chisholm, V Nicolosi, TJ Pennycook, GJ Corbin, ...
Nature 464 (7288), 571, 2010
9092010
Sub-ångstrom resolution using aberration corrected electron optics
PE Batson, N Dellby, OL Krivanek
Nature 418 (6898), 617, 2002
8772002
Towards sub-Å electron beams
OL Krivanek, N Dellby, AR Lupini
Ultramicroscopy 78 (1-4), 1-11, 1999
6201999
Direct sub-angstrom imaging of a crystal lattice
PD Nellist, MF Chisholm, N Dellby, OL Krivanek, MF Murfitt, ZS Szilagyi, ...
Science 305 (5691), 1741-1741, 2004
5832004
Atomic-scale chemical imaging of composition and bonding by aberration-corrected microscopy
DA Muller, LF Kourkoutis, M Murfitt, JH Song, HY Hwang, J Silcox, ...
Science 319 (5866), 1073-1076, 2008
5792008
Vibrational spectroscopy in the electron microscope
OL Krivanek, TC Lovejoy, N Dellby, T Aoki, RW Carpenter, P Rez, ...
Nature 514 (7521), 209, 2014
3242014
Spectroscopic imaging of single atoms within a bulk solid
M Varela, SD Findlay, AR Lupini, HM Christen, AY Borisevich, N Dellby, ...
Physical Review Letters 92 (9), 095502, 2004
3122004
An electron microscope for the aberration-corrected era
OL Krivanek, GJ Corbin, N Dellby, BF Elston, RJ Keyse, MF Murfitt, ...
Ultramicroscopy 108 (3), 179-195, 2008
3022008
Progress in aberration-corrected scanning transmission electron microscopy
N Dellby, L Krivanek, D Nellist, E Batson, R Lupini
Microscopy 50 (3), 177-185, 2001
2532001
Towards sub-0.5 Å electron beams
OL Krivanek, PD Nellist, N Dellby, MF Murfitt, Z Szilagyi
Ultramicroscopy 96 (3-4), 229-237, 2003
1942003
Gentle STEM: ADF imaging and EELS at low primary energies
OL Krivanek, N Dellby, MF Murfitt, MF Chisholm, TJ Pennycook, ...
Ultramicroscopy 110 (8), 935-945, 2010
1792010
Design and first applications of a post-column imaging filter
OL Krivanek, AJ Gubbens, N Dellby, CE Meyer
Microscopy Microanalysis Microstructures 3 (2-3), 187-199, 1992
1731992
Developments in EELS instrumentation for spectroscopy and imaging
OL Krivanek, AJ Gubbens, N Dellby
Microscopy Microanalysis Microstructures 2 (2-3), 315-332, 1991
1451991
High-energy-resolution monochromator for aberration-corrected scanning transmission electron microscopy/electron energy-loss spectroscopy
OL Krivanek, JP Ursin, NJ Bacon, GJ Corbin, N Dellby, P Hrncirik, ...
Philosophical Transactions of the Royal Society A: Mathematical, Physical …, 2009
1252009
Monochromated STEM with a 30 meV-wide, atom-sized electron probe
OL Krivanek, TC Lovejoy, N Dellby, RW Carpenter
Microscopy 62 (1), 3-21, 2013
1072013
Aberration correction in the STEM
OL Krivanek
Inst. Phys. Conf. Ser. 153, 35-39, 1997
981997
Improvements in the X-ray analytical capabilities of a scanning transmission electron microscope by spherical-aberration correction
M Watanabe, DW Ackland, A Burrows, CJ Kiely, DB Williams, OL Krivanek, ...
Microscopy and Microanalysis 12 (6), 515-526, 2006
782006
Development of aberration-corrected electron microscopy
DJ Smith
Microscopy and Microanalysis 14 (1), 2-15, 2008
672008
Single atom identification by energy dispersive X-ray spectroscopy
TC Lovejoy, QM Ramasse, M Falke, A Kaeppel, R Terborg, R Zan, ...
Applied Physics Letters 100 (15), 154101, 2012
642012
Motion of gold atoms on carbon in the aberration-corrected STEM
PE Batson
Microscopy and Microanalysis 14 (1), 89-97, 2008
642008
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Articles 1–20