| Evaluation of Radiation-Induced Soft Error in Majority Voters Designed in 7 nm FinFET Technology Y Aguiar, L Artola, G Hubert, C Meinhardt, F Kastensmidt, R Reis Microelectronics Reliability 76, 660-664, 2017 | 24 | 2017 |
| Introdução à Robótica e Estímulo à Lógica de Programação no Ensino Básico Utilizando o Kit Educativo LEGO® Mindstorms SDG Mattos, VM de Oliveira, LB Soares, YQ de Aguiar, BK Maciel Anais dos Workshops do Congresso Brasileiro de Informática na Educação 4 (1 …, 2015 | 20 | 2015 |
| Design development and implementation of an irradiation station at the neutron time-of-flight facility at CERN M Ferrari, D Senajova, O Aberle, YQ Aguiar, D Baillard, M Barbagallo, ... Physical Review Accelerators and Beams 25 (10), 103001, 2022 | 19 | 2022 |
| Characterization of radio-photo-luminescence (RPL) dosimeters as radiation monitors in the CERN accelerator complex D Pramberger, YQ Aguiar, J Trummer, H Vincke IEEE Transactions on Nuclear Science 69 (7), 1618-1624, 2022 | 18 | 2022 |
| Radiation sensitivity of XOR topologies in multigate technologies under voltage variability YQ de Aguiar, C Meinhardt, RAL Reis 2017 IEEE 8th Latin American Symposium on Circuits & Systems (LASCAS), 1-4, 2017 | 18 | 2017 |
| Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions YQ Aguiar, F Wrobel, JL Autran, P Leroux, F Saigné, AD Touboul, ... Microelectronics Reliability 88, 920-924, 2018 | 14 | 2018 |
| Mitigation and predictive assessment of SET immunity of digital logic circuits for space missions YQ Aguiar, F Wrobel, JL Autran, P Leroux, F Saigné, V Pouget, ... Aerospace 7 (2), 12, 2020 | 13 | 2020 |
| Radiation to Electronics Impact on CERN LHC Operation: Run 2 Overview and HL-LHC Outlook YQ Aguiar, G Lerner, RG Alía, D Prelipcean, A Apollonio, F Cerutti, ... Proc. 12th International Particle Accelerator Conference, 2021 | 11 | 2021 |
| Radiation hardening efficiency of gate sizing and transistor stacking based on standard cells YQ Aguiar, F Wrobel, S Guagliardo, JL Autran, P Leroux, F Saigné, ... Microelectronics Reliability 100, 113457, 2019 | 10 | 2019 |
| Permanent and single event transient faults reliability evaluation EDA tool YQ de Aguiar, AL Zimpeck, C Meinhardt, R Reis Microelectronics Reliability 64, 63-67, 2016 | 10 | 2016 |
| CERN Super Proton Synchrotron Radiation Environment and Related Radiation Hardness Assurance Implications K Biłko, RG Alía, D Di Francesca, Y Aguiar, S Danzeca, S Gilardoni, ... IEEE Transactions on Nuclear Science, 2023 | 9 | 2023 |
| Impact of complex logic cell layout on the single-event transient sensitivity YQ Aguiar, F Wrobel, JL Autran, P Leroux, F Saigné, AD Touboul, ... IEEE Transactions on Nuclear Science 66 (7), 1465-1472, 2019 | 9 | 2019 |
| Temperature dependence and ZTC bias point evaluation of sub 20nm bulk multigate devices YQ Aguiar, AL Zimpeck, C Meinhardt, RAL Reis 2017 24th IEEE International Conference on Electronics, Circuits and Systems …, 2017 | 9 | 2017 |
| Design exploration of majority voter architectures based on the signal probability for TMR strategy optimization in space applications YQ Aguiar, F Wrobel, JL Autran, P Leroux, F Saigné, V Pouget, ... Microelectronics Reliability 114, 113877, 2020 | 8 | 2020 |
| Exploiting transistor folding layout as RHBD technique against single-event transients YQ Aguiar, F Wrobel, JL Autran, FL Kastensmidt, P Leroux, F Saigné, ... IEEE Transactions on Nuclear Science 67 (7), 1581-1589, 2020 | 6 | 2020 |
| An analytical approach to calculate soft error rate induced by atmospheric neutrons F Wrobel, Y Aguiar, C Marques, G Lerner, R García Alía, F Saigné, J Boch Electronics 12 (1), 104, 2022 | 5 | 2022 |
| Implications and mitigation of radiation effects on the CERN SPS operation during 2021 Y Aguiar, A Apollonio, G Lerner, M Cecchetto, JB Potoine, M Brucoli, ... JACoW IPAC 2022, 740-743, 2022 | 5 | 2022 |
| Robustness of sub-22nm multigate devices against physical variability AL Zimpeck, Y Aguiar, C Meinhardt, R Reis 2017 IEEE International Symposium on Circuits and Systems (ISCAS), 1-4, 2017 | 5 | 2017 |
| Implications of Work-Function Fluctuation on Radiation Robustness of FinFET XOR Circuits YQ Aguiar, FL Kastensmidt, C Meinhardt, R Reis Radiation Effects on Components and Systems (RADECS) Conference, 2017 | 5 | 2017 |
| Geometric Variability Impact on 7nm Trigate Combinational Cells AL Zimpeck, YQ Aguiar, C Meinhardt, R Reis IEEE International Conference on Electronics, Circuits and Systems (ICECS …, 2016 | 5 | 2016 |
Cristina MeinhardtUniversidade Federal de Santa CatarinaVerified email at ufsc.br
