Nicola Trivellin
Nicola Trivellin
Research fellow at University of Padova - General Manager at LightCube SRL
Verified email at unipd.it
TitleCited byYear
The 2018 GaN power electronics roadmap
H Amano, Y Baines, E Beam, M Borga, T Bouchet, PR Chalker, M Charles, ...
Journal of Physics D: Applied Physics 51 (16), 163001, 2018
1412018
A combined electro-optical method for the determination of the recombination parameters in InGaN-based light-emitting diodes
M Meneghini, N Trivellin, G Meneghesso, E Zanoni, U Zehnder, B Hahn
Journal of Applied Physics 106 (11), 114508, 2009
1022009
Phosphors for LED-based light sources: Thermal properties and reliability issues
M Dal Lago, M Meneghini, N Trivellin, G Mura, M Vanzi, G Meneghesso, ...
Microelectronics Reliability 52 (9-10), 2164-2167, 2012
522012
Leakage current and reverse-bias luminescence in InGaN-based light-emitting diodes
M Meneghini, N Trivellin, M Pavesi, M Manfredi, U Zehnder, B Hahn, ...
Applied Physics Letters 95 (17), 173507, 2009
512009
Degradation of InGaN-based laser diodes analyzed by means of electrical and optical measurements
M Meneghini, N Trivellin, K Orita, S Takigawa, T Tanaka, D Ueda, ...
Applied Physics Letters 97 (26), 263501, 2010
462010
Investigation of the deep level involved in InGaN laser degradation by deep level transient spectroscopy
M Meneghini, C De Santi, N Trivellin, K Orita, S Takigawa, T Tanaka, ...
Applied Physics Letters 99 (9), 093506, 2011
452011
Thermally activated degradation of remote phosphors for application in LED lighting
M Meneghini, M Dal Lago, N Trivellin, G Meneghesso, E Zanoni
IEEE Transactions on Device and Materials Reliability 13 (1), 316-318, 2012
442012
Analysis of defect-related localized emission processes in InGaN/GaN-based LEDs
M Meneghini, S Vaccari, N Trivellin, D Zhu, C Humphreys, R Butendheich, ...
IEEE Transactions on Electron Devices 59 (5), 1416-1422, 2012
422012
Chip and package-related degradation of high power white LEDs
M Meneghini, M Dal Lago, N Trivellin, G Mura, M Vanzi, G Meneghesso, ...
Microelectronics Reliability 52 (5), 804-812, 2012
402012
Extensive analysis of the degradation of Blu-Ray laser diodes
M Meneghini, G Meneghesso, N Trivellin, E Zanoni, K Orita, M Yuri, ...
IEEE Electron Device Letters 29 (6), 578-581, 2008
382008
Degradation mechanisms of high-power LEDs for lighting applications: An overview
M Meneghini, M Dal Lago, N Trivellin, G Meneghesso, E Zanoni
IEEE Transactions on Industry Applications 50 (1), 78-85, 2013
342013
Extensive analysis of the degradation of phosphor-converted LEDs
M Meneghini, LR Trevisanello, F De Zuani, N Trivellin, G Meneghesso, ...
Ninth International Conference on Solid State Lighting 7422, 74220H, 2009
322009
Analysis of diffusion-related gradual degradation of InGaN-based laser diodes
K Orita, M Meneghini, H Ohno, N Trivellin, N Ikedo, S Takigawa, M Yuri, ...
IEEE Journal of Quantum Electronics 48 (9), 1169-1176, 2012
282012
Reliability of deep-UV light-emitting diodes
M Meneghini, M Pavesi, N Trivellin, R Gaska, E Zanoni, G Meneghesso
IEEE Transactions on Device and Materials Reliability 8 (2), 248-254, 2008
212008
Degradation of InGaN-based laser diodes related to nonradiative recombination
M Meneghini, N Trivellin, K Orita, S Takigawa, M Yuri, T Tanaka, D Ueda, ...
IEEE Electron Device Letters 30 (4), 356-358, 2009
202009
Degradation mechanisms of high-power white LEDs activated by current and temperature
M Dal Lago, M Meneghini, N Trivellin, G Meneghesso, E Zanoni
Microelectronics Reliability 51 (9-11), 1742-1746, 2011
192011
Thermally activated degradation and package instabilities of low flux LEDs
L Trevisanello, F De Zuani, M Meneghini, N Trivellin, E Zanoni, ...
2009 IEEE international reliability physics symposium, 98-103, 2009
182009
Degradation of InGaN/GaN laser diodes investigated by micro-cathodoluminescence and micro-photoluminescence
M Meneghini, S Carraro, G Meneghesso, N Trivellin, G Mura, F Rossi, ...
Applied Physics Letters 103 (23), 233506, 2013
172013
A review on the reliability of GaN-based laser diodes
N Trivellin, M Meneghini, E Zanoni, K Orita, M Yuri, T Tanaka, D Ueda, ...
2010 IEEE International Reliability Physics Symposium, 1-6, 2010
152010
Reliability issues in GaN-based light-emitting diodes: Effect of dc and PWM stress
M Meneghini, M Dal Lago, L Rodighiero, N Trivellin, E Zanoni, ...
Microelectronics Reliability 52 (8), 1621-1626, 2012
132012
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