Gheorghe Stan
Cited by
Cited by
Charge‐Induced Disorder Controls the Thermal Conductivity of Entropy‐Stabilized Oxides
JL Braun, CM Rost, M Lim, A Giri, DH Olson, GN Kotsonis, G Stan, ...
Advanced Materials 30 (51), 1805004, 2018
Diameter-dependent radial and tangential elastic moduli of ZnO nanowires
G Stan, CV Ciobanu, PM Parthangal, RF Cook
Nano Letters 7 (12), 3691-3697, 2007
Critical field for complete vortex expulsion from narrow superconducting strips
G Stan, SB Field, JM Martinis
Physical review letters 92 (9), 097003, 2004
Vertical 2D/3D Semiconductor Heterostructures Based on Epitaxial Molybdenum Disulfide and Gallium Nitride
D Ruzmetov, K Zhang, G Stan, B Kalanyan, GR Bhimanapati, SM Eichfeld, ...
ACS nano 10 (3), 3580-3588, 2016
Immobilization of streptavidin on 4H–SiC for biosensor development
EH Williams, AV Davydov, A Motayed, SG Sundaresan, P Bocchini, ...
Applied surface science 258 (16), 6056-6063, 2012
Ultimate bending strength of Si nanowires
G Stan, S Krylyuk, AV Davydov, I Levin, RF Cook
Nano letters 12 (5), 2599-2604, 2012
Elastic moduli of faceted aluminum nitride nanotubes measured by contact resonance atomic force microscopy
G Stan, CV Ciobanu, TP Thayer, GT Wang, JR Creighton, ...
Nanotechnology 20 (3), 035706, 2008
Influence of network bond percolation on the thermal, mechanical, electrical and optical properties of high and low-k a-SiC: H thin films
SW King, J Bielefeld, G Xu, WA Lanford, Y Matsuda, RH Dauskardt, N Kim, ...
Journal of Non-Crystalline Solids 379, 67-79, 2013
Mapping the elastic properties of granular Au films by contact resonance atomic force microscopy
G Stan, RF Cook
Nanotechnology 19 (23), 235701, 2008
Quantitative measurements of indentation moduli by atomic force acoustic microscopy using a dual reference method
G Stan, W Price
Review of scientific instruments 77 (10), 103707, 2006
Nanoscale mapping of contact stiffness and damping by contact resonance atomic force microscopy
G Stan, SW King, RF Cook
Nanotechnology 23 (21), 215703, 2012
Compressive stress effect on the radial elastic modulus of oxidized Si nanowires
G Stan, S Krylyuk, AV Davydov, RF Cook
Nano letters 10 (6), 2031-2037, 2010
Surface effects on the elastic modulus of Te nanowires
G Stan, S Krylyuk, AV Davydov, M Vaudin, LA Bendersky, RF Cook
Applied Physics Letters 92 (24), 241908, 2008
Elastic modulus of low-k dielectric thin films measured by load-dependent contact-resonance atomic force microscopy
G Stan, SW King, RF Cook
Journal of Materials Research 24 (09), 2960-2964, 2009
Adhesive contact between a rigid spherical indenter and an elastic multi-layer coated substrate
G Stan, GG Adams
International Journal of Solids and Structures 87, 1-10, 2016
Nanoscale mechanics by tomographic contact resonance atomic force microscopy
G Stan, SD Solares, B Pittenger, N Erina, C Su
Nanoscale 6 (2), 962-969, 2014
High resolution surface morphology measurements using EBSD cross-correlation techniques and AFM
MD Vaudin, G Stan, YB Gerbig, RF Cook
Ultramicroscopy 111 (8), 1206-1213, 2011
Bending manipulation and measurements of fracture strength of silicon and oxidized silicon nanowires by atomic force microscopy
G Stan, S Krylyuk, AV Davydov, RF Cook
Journal of Materials Research 27 (03), 562-570, 2012
Atomic force microscopy for nanoscale mechanical property characterization
G Stan, SW King
Journal of Vacuum Science & Technology B 38 (6), 2020
Nanomechanical Properties of Polyethylene Glycol Brushes on Gold Substrates
G Stan, FW DelRio, RI MacCuspie, RF Cook
The Journal of Physical Chemistry B 116 (10), 3138-3147, 2012
The system can't perform the operation now. Try again later.
Articles 1–20