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Co-authors
Kazu SuenagaAISTVerified email at aist.go.jp
Po-Wen ChiuDepartment of Electrical Engineering, Nation Tsing Hua UniversityVerified email at ee.nthu.edu.tw
Lain-Jong LiUniversity of Hong KongVerified email at hku.hk
Dumitru DumcencoUniversity of GenevaVerified email at unige.ch
Krasheninnikov ArkadyHelmholtz-Zentrum Dresden-Rossendorf and Aalto UniversityVerified email at aalto.fi
Jamie warnerUniversity of Texas at AustinVerified email at austin.utexas.edu
Hannu-Pekka KomsaAalto UniversityVerified email at aalto.fi
Jin chuanhongZhejiang UniversityVerified email at zju.edu.cn
Jr-Hau HeProfessor of Materials Science & Engineering, City University of Hong KongVerified email at cityu.edu.hk
Alex W RobertsonDepartment of Materials, University of OxfordVerified email at materials.ox.ac.uk
Luiz H G TizeiCNRS - FranceVerified email at u-psud.fr
Ying-Sheng HuangChair Professor @ National Taiwan University of Science and TechnologyVerified email at mail.ntust.edu.tw
Torbjörn BjörkmanÅbo Akademi University, Physics/Faculty of Natural Science and EngineeringVerified email at abo.fi
Ching-Hwa HoProfessor of National Taiwan University of Science and TechnologyVerified email at mail.ntust.edu.tw
Ryosuke SengaAISTVerified email at aist.go.jp
Kuang HeUniversity of Oxford