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Martina Marzano
Martina Marzano
Researcher, Istituto Nazionale di Ricerca Metrologica (INRiM), Torino, Italy
Verified email at inrim.it
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Cited by
Year
Next-generation crossover-free quantum Hall arrays with superconducting interconnections
M Kruskopf, AF Rigosi, AR Panna, M Marzano, D Patel, H Jin, DB Newell, ...
Metrologia 56 (6), 065002, 2019
592019
Two-terminal and multi-terminal designs for next-generation quantized Hall resistance standards: contact material and geometry
M Kruskopf, AF Rigosi, AR Panna, DK Patel, H Jin, M Marzano, M Berilla, ...
IEEE transactions on electron devices 66 (9), 3973-3977, 2019
562019
Atypical quantized resistances in millimeter-scale epitaxial graphene pn junctions
AF Rigosi, D Patel, M Marzano, M Kruskopf, HM Hill, H Jin, J Hu, ...
Carbon 154, 230-237, 2019
412019
Analytical determination of atypical quantized resistances in graphene pn junctions
AF Rigosi, M Marzano, A Levy, HM Hill, DK Patel, M Kruskopf, H Jin, ...
Physica B: Condensed Matter 582, 411971, 2020
342020
An international comparison of phase angle standards between the novel impedance bridges of CMI, INRIM and METAS
M Ortolano, L Palafox, J Kučera, L Callegaro, V D’Elia, M Marzano, ...
Metrologia 55 (4), 499, 2018
322018
A comprehensive analysis of error sources in electronic fully digital impedance bridges
M Ortolano, M Marzano, V D’Elia, NTM Tran, R Rybski, J Kaczmarek, ...
IEEE Transactions on Instrumentation and Measurement 70, 1-14, 2020
152020
A correlation noise spectrometer for flicker noise measurement in graphene samples
M Marzano, A Cultrera, M Ortolano, L Callegaro
Measurement Science and Technology 30 (3), 035102, 2019
142019
Error modelling of quantum Hall array resistance standards
M Marzano, T Oe, M Ortolano, L Callegaro, NH Kaneko
Metrologia 55 (2), 167, 2018
122018
A fully digital bridge towards the realization of the farad from the quantum Hall effect
M Marzano, M Ortolano, V D’Elia, A Müller, L Callegaro
Metrologia 58 (1), 015002, 2020
112020
Accessing ratios of quantized resistances in graphene p–n junction devices using multiple terminals
D Patel, M Marzano, CI Liu, HM Hill, M Kruskopf, H Jin, J Hu, DB Newell, ...
AIP Advances 10 (2), 2020
112020
Implementation of a graphene quantum Hall Kelvin bridge-on-a-chip for resistance calibrations
M Marzano, M Kruskopf, AR Panna, AF Rigosi, DK Patel, H Jin, S Cular, ...
Metrologia 57 (1), 015007, 2020
92020
Quantum Hall resistance dartboards using graphene pn junction devices with Corbino geometries
CI Liu, DK Patel, M Marzano, M Kruskopf, HM Hill, AF Rigosi
AIP Advances 10 (3), 2020
72020
Role of plasma-induced defects in the generation of 1/f noise in graphene
A Cultrera, L Callegaro, M Marzano, M Ortolano, G Amato
Applied Physics Letters 112 (9), 2018
62018
Error sources in electronic fully-digital impedance bridges
M Ortolano, M Marzano, V D'Elia, NTM Tran, R Rybski, J Kaczmarek, ...
2020 Conference on Precision Electromagnetic Measurements (CPEM), 1-2, 2020
32020
Superconducting contact geometries for next-generation quantized Hall resistance standards
AR Panna, M Kruskopf, AF Rigosi, M Marzano, DK Patel, SU Payagala, ...
2020 Conference on Precision Electromagnetic Measurements (CPEM), 1-2, 2020
32020
The EMPIR project GIQS: Graphene impedance quantum standard
L Callegaro, V D'Elia, M Marzano, NTM Tran, M Ortolano, J Kučera, ...
2020 Conference on Precision Electromagnetic Measurements (CPEM), 1-2, 2020
32020
Practical Precision Electrical Impedance Measurement for the 21st Century–EMPIR Project 17RPT04 VersICal
O Power, A Ziolek, AE Christensen, A Pokatilov, A Nestor, G Gumez, ...
19th International Congress of Metrology (CIM2019), 02001, 2019
32019
A quantum Hall effect Kelvin bridge for resistance calibration
M Marzano, L Callegaro, M Ortolano
2018 Conference on Precision Electromagnetic Measurements (CPEM 2018), 1-2, 2018
32018
Virtual Training Laboratory for Primary Impedance Metrology
J Kaczmarek, M Ortolano, O Power, J Kučera, L Callegaro, V D'Elia, ...
IEEE Transactions on Instrumentation and Measurement 72, 1-12, 2022
22022
Primary realization of inductance and capacitance scales with a fully digital bridge
M Marzano, V D’Elia, M Ortolano, L Callegaro
IEEE Transactions on Instrumentation and Measurement 71, 1-8, 2022
22022
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