Laurent Bechou
Laurent Bechou
Professeur
Verified email at ims-bordeaux.fr
TitleCited byYear
Detection and location of defects in electronic devices by means of scanning ultrasonic microscopy and the wavelet transform
L Angrisani, L Bechou, D Dallet, P Daponte, Y Ousten
Measurement 31 (2), 77-91, 2002
452002
Long‐term Reliability Prediction of 935 nm LEDs Using Failure Laws and Low Acceleration Factor Ageing Tests
Y Deshayes, L Bechou, F Verdier, Y Danto
Quality and Reliability Engineering International 21 (6), 571-594, 2005
372005
Effects of silicone coating degradation on GaN MQW LEDs performances using physical and chemical analyses
R Baillot, Y Deshayes, L Bechou, T Buffeteau, I Pianet, C Armand, ...
Microelectronics Reliability 50 (9-11), 1568-1573, 2010
232010
Ultrasonic images interpretation improvement for microassembling technologies characterisation
L Bechou, Y Ousten, B Tregon, F Marc, Y Danto, R Even, P Kertesz
Microelectronics Reliability 37 (10-11), 1787-1790, 1997
211997
An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy
L Bechou, D Dallet, Y Danto, P Daponte, Y Ousten, S Rapuano
IEEE Transactions on Instrumentation and Measurement 52 (1), 135-142, 2003
202003
Early failure signatures of 1310 nm laser modules using electrical, optical and spectral measurements
Y Deshayes, L Bechou, L Mendizabal, Y Danto
Measurement 34 (2), 157-178, 2003
182003
Measurement of the thermal characteristics of packaged double-heterostructure light emitting diodes for space applications using spontaneous optical spectrum properties
L Bechou, O Rehioui, Y Deshayes, O Gilard, G Quadri, Y Ousten
Optics & Laser Technology 40 (4), 589-601, 2008
172008
Study of a polymer optical microring resonator for hexavalent chromium sensing
F Meziane, V Raimbault, H Hallil, S Joly, V Conédéra, JL Lachaud, ...
Sensors and Actuators B: Chemical 209, 1049-1056, 2015
162015
Estimation of lifetime distributions on 1550-nm DFB laser diodes using Monte-Carlo statistic computations
Y Deshayes, F Verdier, L Bechou, B Tregon, Y Danto, D Laffitte, ...
Reliability of Optical Fiber Components, Devices, Systems, and Networks II …, 2004
162004
Probabilistic design for reliability (PDfR) and a novel approach to qualification testing (QT)
E Suhir, R Mahajan, A Lucero, L Bechou
152012
Path tracking design by fractional prefilter extension to square MIMO systems
P Melchior, C Inarn, A Oustaloup
ASME 2009 International Design Engineering Technical Conferences and …, 2010
152010
Availability index and minimized reliability cost
E Suhir, L Bechou
Circuit Assemblies, 2013
142013
Technical Diagnostics in Electronics: Application of Bayes Formula and Boltzmann-Arrhenius-Zhurkov (BAZ) Model
E Suhir, L Bechou, A Bensoussan
Printed Circuit Design& Fab/Circuits Assembly 29 (12), 25-28, 2012
142012
Highly accelerated life testing (HALT), failure oriented accelerated testing (FOAT), and their role in making a viable device into a reliable product
E Suhir, A Bensoussan, J Nicolics, L Bechou
2014 IEEE Aerospace Conference, Big Sky, Montana, 2014
132014
Predicted size of an inelastic zone in a ball-grid-array assembly
E Suhir, L Bechou, B Levrier
Journal of Applied Mechanics 80 (2), 021007, 2013
132013
Predicted Thermal Stresses in a Trimaterial Assembly With Application to Silicon-Based Photovoltaic Module
E Suhir, D Shangguan, L Bechou
Journal of Applied Mechanics 80 (2), 021008, 2013
132013
Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations
JY Delétage, FJM Verdier, B Plano, Y Deshayes, L Bechou, Y Danto
Microelectronics Reliability 43 (7), 1137-1144, 2003
132003
Three-dimensional FEM simulations of thermomechanical stresses in 1.55 μm Laser modules
Y Deshayes, L Bechou, JY Deletage, F Verdier, Y Danto, D Laffitte, ...
Microelectronics Reliability 43 (7), 1125-1136, 2003
132003
The use of impedance spectroscopy, SEM and SAM imaging for early detection of failure in SMT assemblies
Y Ousten, S Mejdi, A Fenech, JY Deletage, L Bechou, MG Perichaud, ...
Microelectronics reliability 38 (10), 1539-1545, 1998
13*1998
Improved performances of polymer-based dielectric by using inorganic/organic core-shell nanoparticles
W Benhadjala, I Bord-Majek, L Béchou, E Suhir, M Buet, F Rougé, V Gaud, ...
Applied Physics Letters 101 (14), 142901, 2012
122012
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Articles 1–20