Perfect X-ray focusing via fitting corrective glasses to aberrated optics F Seiboth, A Schropp, M Scholz, F Wittwer, C Rödel, M Wünsche, ... Nature Communications 8 (1), 14623, 2017 | 153 | 2017 |
Focusing hard x rays beyond the critical angle of total reflection by adiabatically focusing lenses J Patommel, S Klare, R Hoppe, S Ritter, D Samberg, F Wittwer, A Jahn, ... Applied Physics Letters 110 (10), 2017 | 39 | 2017 |
In Situ Ptychography of Heterogeneous Catalysts using Hard X-Rays: High Resolution Imaging at Ambient Pressure and Elevated Temperature S Baier, CD Damsgaard, M Scholz, F Benzi, A Rochet, R Hoppe, ... Microscopy and Microanalysis 22 (1), 178-188, 2016 | 39 | 2016 |
PtyNAMi: ptychographic nano-analytical microscope A Schropp, R Döhrmann, S Botta, D Brückner, M Kahnt, M Lyubomirskiy, ... Journal of applied crystallography 53 (4), 957-971, 2020 | 33 | 2020 |
Hard x-ray nanoprobe of beamline P06 at PETRA III CG Schroer, C Baumbach, R Döhrmann, S Klare, R Hoppe, M Kahnt, ... AIP conference proceedings 1741 (1), 2016 | 27 | 2016 |
PtyNAMi: Ptychographic Nano-Analytical Microscope at PETRA III: interferometrically tracking positions for 3D x-ray scanning microscopy using a ball-lens retroreflector CG Schroer, M Seyrich, M Kahnt, S Botta, R Döhrmann, G Falkenberg, ... X-Ray Nanoimaging: Instruments and Methods III 10389, 8-17, 2017 | 25 | 2017 |
Hard x-ray nanofocusing by refractive lenses of constant thickness F Seiboth, M Scholz, J Patommel, R Hoppe, F Wittwer, J Reinhardt, ... Applied Physics Letters 105 (13), 2014 | 23 | 2014 |
Hard x-ray nanofocusing with refractive x-ray optics: full beam characterization by ptychographic imaging CG Schroer, FE Brack, R Brendler, S Hönig, R Hoppe, J Patommel, ... Advances in X-Ray/EUV Optics and Components VIII 8848, 38-47, 2013 | 21 | 2013 |
Nanofocusing with aberration-corrected rotationally parabolic refractive X-ray lenses F Seiboth, F Wittwer, M Scholz, M Kahnt, M Seyrich, A Schropp, U Wagner, ... Journal of synchrotron radiation 25 (1), 108-115, 2018 | 18 | 2018 |
Quantitative characterization of aberrations in x-ray optics F Seiboth, M Kahnt, M Scholz, M Seyrich, F Wittwer, J Garrevoet, ... Advances in X-Ray/EUV Optics and Components XI 9963, 88-95, 2016 | 17 | 2016 |
Simultaneous hard X-ray ptychographic tomography and X-ray fluorescence tomography of isolated hollow core-shell GaN rods M Kahnt, G Falkenberg, J Garrevoet, J Hartmann, T Krause, M Niehle, ... Microscopy and Microanalysis 24 (S2), 32-33, 2018 | 5 | 2018 |
Ptychography with a Virtually Enlarged Illumination. F Wittwer, R Hoppe, F Seiboth, J Reinhardt, M Scholz, CG Schroer Microscopy and Microanalysis 24 (S2), 46-47, 2018 | 5 | 2018 |
In situ X-ray measurements over large Q-space to study the evolution of oxide thin films prepared by RF sputter deposition P Walter, J Wernecke, M Scholz, D Reuther, A Rothkirch, D Haas, J Blume, ... Journal of Materials Science 56, 290-304, 2021 | 3 | 2021 |
Aberration correction for hard x-ray focusing at the nanoscale F Seiboth, A Schropp, M Scholz, F Wittwer, C Rödel, M Wünsche, ... Advances in X-Ray/EUV Optics and Components XII 10386, 41-50, 2017 | 3 | 2017 |
Correlative XRF, ptychography and light microscopy on shielding pigments of Clunio larval ocelli G Falkenberg, G Fleissner, P Alraun, J Reinhardt, M Scholz, A Schropp, ... Journal of Instrumentation 13 (07), C07001, 2018 | 2 | 2018 |
Adiabatically Focusing Lenses (AFL) J Patommel, S Hönig, S Ritter, M Scholz, F Seiboth, C Schroer, A Kubec, ... Tech. rep. DESY annual report, 2012. url: http://photon-science. desy. de …, 0 | 1 | |
Nanofocusing with aberration-corrected rotationally parabolic refractive X-ray lenses. Corrigendum F Seiboth, F Wittwer, M Scholz, M Kahnt, M Seyrich, A Schropp, U Wagner, ... Journal of Synchrotron Radiation 28 (3), 1030-1030, 2021 | | 2021 |
Correlative Imaging of Melanosoms with Ptychography, X-ray Fluorescence and Light Microscopy G Falkenberg, G Fleissner, P Alraun, J Reinhardt, M Scholz, A Schropp, ... Microscopy and Microanalysis 24 (S2), 390-391, 2018 | | 2018 |
PtyNAMi: Ptychographic Nano-Analytical Microscope at PETRA III-How to Achieve Sub-nanometer Sample Stability R Doehrmann, S Botta, G Falkenberg, J Garrevoet, M Kahnt, ... | | 2018 |
Hard x-ray nanoprobe of beamline P06 at PETRA III C Baumbach, R Döhrmann, M Kahnt, J Reinhardt, M Scholz, A Schropp, ... AIP Conference Proceedings 1741 (1), 2016 | | 2016 |