|Potential induced degradation of N-type bifacial silicon solar cells: An investigation based on electrical and optical measurements|
M Barbato, A Barbato, M Meneghini, G Tavernaro, M Rossetto, ...
Solar Energy Materials and Solar Cells 168, 51-61, 2017
|Influence of shunt resistance on the performance of an illuminated string of solar cells: theory, simulation, and experimental analysis|
M Barbato, M Meneghini, A Cester, G Mura, E Zanoni, G Meneghesso
IEEE Transactions on Device and Materials Reliability 14 (4), 942-950, 2014
|Comparison of high efficiency flexible CdTe solar cells on different substrates at low temperature deposition|
A Salavei, D Menossi, F Piccinelli, A Kumar, G Mariotto, M Barbato, ...
Solar Energy 139, 13-18, 2016
|Local shunting in multicrystalline silicon solar cells: Distributed electrical simulations and experiments|
D Giaffreda, P Magnone, M Meneghini, M Barbato, G Meneghesso, ...
IEEE Journal of Photovoltaics 4 (1), 40-47, 2013
|Evolution of electrical parameters of dielectric-less ohmic RF-MEMS switches during continuous actuation stress|
A Tazzoli, E Autizi, M Barbato, G Meneghesso, F Solazzi, P Farinelli, ...
2009 Proceedings of the European Solid State Device Research Conference, 343-346, 2009
|Characterization and modeling of organic (P3HT: PCBM) solar cells as a function of bias and illumination|
A Rizzo, A Cester, N Wrachien, N Lago, L Torto, M Barbato, J Favaro, ...
Solar Energy Materials and Solar Cells 157, 337-345, 2016
|A physical-based equivalent circuit model for an organic/electrolyte interface|
N Lago, A Cester, N Wrachien, M Natali, SD Quiroga, S Bonetti, ...
Organic Electronics 35, 176-185, 2016
|Study of the actuation speed, bounces occurrences, and contact reliability of ohmic RF-MEMS switches|
A Tazzoli, M Barbato, F Mattiuzzo, V Ritrovato, G Meneghesso
Microelectronics Reliability 50 (9-11), 1604-1608, 2010
|Field-and current-driven degradation of GaN-based power HEMTs with p-GaN gate: Dependence on Mg-doping level|
I Rossetto, M Meneghini, E Canato, M Barbato, S Stoffels, N Posthuma, ...
Microelectronics Reliability 76, 298-303, 2017
|Demonstration of field-and power-dependent ESD failure in AlGaN/GaN RF HEMTs|
I Rossetto, M Meneghini, M Barbato, F Rampazzo, D Marcon, ...
IEEE Transactions on Electron Devices 62 (9), 2830-2836, 2015
|A combined mechanical and electrical characterization procedure for investigating the dynamic behavior of RF-MEMS switches|
M Barbato, V Giliberto, A Cester, G Meneghesso
IEEE Transactions on Device and Materials Reliability 14 (1), 13-20, 2013
|Effect of shunt resistance on the performance of mc-Silicon solar cells: a combined electro-optical and thermal investigation|
M Barbato, M Meneghini, V Giliberto, D Giaffreda, P Magnone, R De Rose, ...
2012 38th IEEE Photovoltaic Specialists Conference, 001241-001245, 2012
|Effects of constant voltage and constant current stress in PCBM: P3HT solar cells|
A Cester, A Rizzo, A Bazzega, N Lago, J Favaro, M Barbato, N Wrachien, ...
Microelectronics Reliability 55 (9-10), 1795-1799, 2015
|Distributed learning of random weights fuzzy neural networks|
R Fierimonte, M Barbato, A Rosato, M Panella
2016 IEEE International Conference on Fuzzy Systems (FUZZ-IEEE), 2287-2294, 2016
|A novel technique to alleviate the stiction phenomenon in radio frequency microelectromechanical switches|
M Barbato, G Meneghesso
IEEE Electron Device Letters 36 (2), 177-179, 2014
|Temperature as an accelerating factor for lifetime estimation of RF-MEMS switches|
V Mulloni, L Lorenzelli, B Margesin, M Barbato, G Meneghesso
Microelectronic Engineering 160, 63-67, 2016
|A new measurement set-up to investigate the charge trapping phenomena in RF MEMS packaged switches|
M Barbato, V Giliberto, G Meneghesso
2013 IEEE International Conference on Microelectronic Test Structures (ICMTS …, 2013
|Analysis of magnesium zinc oxide layers for high efficiency CdTe devices|
E Artegiani, M Leoncini, M Barbato, M Meneghini, G Meneghesso, ...
Thin Solid Films 672, 22-25, 2019
|Effects of current stress and thermal storage on polymeric heterojunction P3HT: PCBM solar cell|
A Rizzo, A Cester, L Torto, M Barbato, N Wrachien, N Lago, M Corazza, ...
2016 IEEE International Reliability Physics Symposium (IRPS), 3C-2-1-3C-2-6, 2016
|Preconditioning procedure for the better estimation of the long-term lifetime in microelectromechanical switches|
M Barbato, A Cester, V Mulloni, B Margesin, G Meneghesso
IEEE Transactions on Electron Devices 63 (3), 1274-1280, 2016