Nicolas Chevalier
Nicolas Chevalier
Univ. Grenoble Alpes, CEA, LETI
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Work function tuning for high‐performance solution‐processed organic photodetectors with inverted structure
E Saracco, B Bouthinon, JM Verilhac, C Celle, N Chevalier, D Mariolle, ...
Advanced Materials 25 (45), 6534-6538, 2013
Chemical and structural properties of conducting nanofilaments in TiN/HfO2-based resistive switching structures
P Calka, E Martinez, V Delaye, D Lafond, G Audoit, D Mariolle, ...
Nanotechnology 24 (8), 085706, 2013
A hard x-ray nanoprobe for scanning and projection nanotomography
P Bleuet, P Cloetens, P Gergaud, D Mariolle, N Chevalier, R Tucoulou, ...
Review of scientific instruments 80 (5), 056101, 2009
Near-field optical imaging with a CdSe single nanocrystal-based active tip
Y Sonnefraud, N Chevalier, JF Motte, S Huant, P Reiss, J Bleuse, ...
Optics express 14 (22), 10596-10602, 2006
CdSe single-nanoparticle based active tips for near-field optical microscopy
N Chevalier, MJ Nasse, JC Woehl, P Reiss, J Bleuse, F Chandezon, ...
Nanotechnology 16 (4), 613, 2005
Remote optical addressing of single nano-objects
M Brun, A Drezet, H Mariette, N Chevalier, JC Woehl, S Huant
EPL (Europhysics Letters) 64 (5), 634, 2003
Doping efficiency of single and randomly stacked bilayer graphene by iodine adsorption
HK Kim, O Renault, A Tyurnina, JP Simonato, D Rouchon, D Mariolle, ...
Applied Physics Letters 105 (1), 011605, 2014
Measuring the lifetime of silicon nanocrystal solar cell photo-carriers by using Kelvin probe force microscopy and x-ray photoelectron spectroscopy
H Lepage, N Chevalier, D Mariolle, O Renault
Nanotechnology 25 (26), 265703, 2014
Functionalization of Silica Nanoparticles and Native Silicon Oxide with Tailored Boron-Molecular Precursors for Efficient and Predictive p-Doping of Silicon
L Mathey, T Alphazan, M Valla, L Veyre, H Fontaine, V Enyedi, K Yckache, ...
The Journal of Physical Chemistry C 119 (24), 13750-13757, 2015
Controlled in situ n-doping of silicon nanowires during VLS growth and their characterization by scanning spreading resistance microscopy
C Celle, C Mouchet, E Rouviere, JP Simonato, D Mariolle, N Chevalier, ...
The Journal of Physical Chemistry C 114 (2), 760-765, 2010
Electrical properties measurements on individual carbon nanofibers by scanning spreading resistance microscopy
L Fourdrinier, H Le Poche, N Chevalier, D Mariolle, E Rouviere
Journal of Applied Physics 104 (11), 114305, 2008
Aperture-size-controlled optical fiber tips for high-resolution optical microscopy
N Chevalier, Y Sonnefraud, JF Motte, S Huant, K Karrai
Review of scientific instruments 77 (6), 063704, 2006
Dewetting application to CdTe single crystal growth on earth
N Chevalier, P Dusserre, JP Garandet, T Duffar
Journal of crystal growth 261 (4), 590-594, 2004
Cleaning of InGaAs and InP layers for nanoelectronics and photonics contact technology applications
P Rodriguez, L Toselli, E Ghegin, M Rebaud, N Rochat, N Chevalier, ...
ECS Transactions 69 (8), 251, 2015
Surface-induced p-type conductivity in ZnO nanopillars investigated by scanning probe microscopy
E Latu-Romain, P Gilet, N Chevalier, D Mariolle, F Bertin, G Feuillet, ...
Journal of Applied Physics 107 (12), 124307, 2010
From atomistic to device level investigation of hybrid redox molecular/silicon field-effect memory devices
T Pro, J Buckley, R Barattin, A Calborean, V Aiello, G Nicotra, K Huang, ...
IEEE transactions on nanotechnology 10 (2), 275-283, 2010
Dopant profiling in silicon nanowires measured by scanning capacitance microscopy
F Bassani, P Periwal, B Salem, N Chevalier, D Mariolle, G Audoit, ...
physica status solidi (RRL)–Rapid Research Letters 8 (4), 312-316, 2014
Aligned carbon nanotube based ultrasonic microtransducers for durability monitoring in civil engineering
B Lebental, P Chainais, P Chenevier, N Chevalier, E Delevoye, JM Fabbri, ...
Nanotechnology 22 (39), 395501, 2011
An experimental method to determine the resistance of a vertically aligned carbon nanotube forest in contact with a conductive layer
TT Vo, C Poulain, J Dijon, A Fournier, N Chevalier, D Mariolle
Journal of Applied Physics 112 (4), 044901, 2012
Direct probing of trapped charge dynamics in SiN by Kelvin force microscopy
E Vianello, E Nowak, D Mariolle, N Chevalier, L Perniola, G Molas, ...
2010 International Conference on Microelectronic Test Structures (ICMTS), 94-97, 2010
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