| Hard-x-ray microscopy with Fresnel zone plates reaches 40nm Rayleigh resolution YS Chu, JM Yi, F De Carlo, Q Shen, WK Lee, HJ Wu, CL Wang, JY Wang, ... Applied Physics Letters 92 (10), 2008 | 260 | 2008 |
| Nondestructive nanoscale 3D elemental mapping and analysis of a solid oxide fuel cell anode KN Grew, YS Chu, J Yi, AA Peracchio, JR Izzo, Y Hwu, F De Carlo, ... Journal of the Electrochemical Society 157 (6), B783, 2010 | 172 | 2010 |
| Full-field hard x-ray microscopy below 30 nm: a challenging nanofabrication achievement YT Chen, TN Lo, YS Chu, J Yi, CJ Liu, JY Wang, CL Wang, CW Chiu, ... Nanotechnology 19 (39), 395302, 2008 | 126 | 2008 |
| Morphological and topological analysis of coarsened nanoporous gold by x-ray nanotomography YK Chen, YS Chu, JM Yi, I McNulty, Q Shen, PW Voorhees, DC Dunand Applied Physics Letters 96 (4), 2010 | 123 | 2010 |
| Three-dimensional mapping of nickel oxidation states using full field x-ray absorption near edge structure nanotomography GJ Nelson, WM Harris, JR Izzo, KN Grew, WKS Chiu, YS Chu, J Yi, ... Applied Physics Letters 98 (17), 2011 | 80 | 2011 |
| Hard x-ray Zernike microscopy reaches 30 nm resolution YT Chen, TY Chen, J Yi, YS Chu, WK Lee, CL Wang, IM Kempson, Y Hwu, ... Optics letters 36 (7), 1269-1271, 2011 | 61 | 2011 |
| Coherent microradiology directly observes a critical cathode-anode distance effect in localized electrochemical deposition SK Seol, JM Yi, X Jin, CC Kim, JH Je, WL Tsai, PC Hsu, Y Hwu, CH Chen, ... electrochemical and solid-state letters 7 (9), C95, 2004 | 39 | 2004 |
| Interaction of micropipes with foreign polytype inclusions in SiC MY Gutkin, AG Sheinerman, TS Argunova, JM Yi, MU Kim, JH Je, ... Journal of applied physics 100 (9), 2006 | 31 | 2006 |
| dependence of synchrotron x-ray induced electroless nickel deposition PH Borse, JM Yi, JH Je, WL Tsai, Y Hwu Journal of Applied Physics 95 (3), 1166-1170, 2004 | 28 | 2004 |
| Formation of magnetic Ni nanoparticles in x-ray irradiated electroless solution PH Borse, JM Yi, JH Je, SD Choi, Y Hwu, P Ruterana, G Nouet Nanotechnology 15 (6), S389, 2004 | 21 | 2004 |
| High-resolution hard-x-ray microscopy using second-order zone-plate diffraction J Yi, YS Chu, YT Chen, TY Chen, Y Hwu, G Margaritondo Journal of Physics D: Applied Physics 44 (23), 232001, 2011 | 20 | 2011 |
| X-ray imaging apparatus and control method for the same J Yi, D Kang, YH Sung US Patent 9,504,439, 2016 | 19 | 2016 |
| Role of micropipes in the formation of pores at foreign polytype boundaries in SiC crystals MY Gutkin, AG Sheinerman, TS Argunova, JM Yi, JH Je, SS Nagalyuk, ... Physical Review B 76 (6), 064117, 2007 | 17 | 2007 |
| Dynamical growth behavior of copper clusters during electrodeposition PC Hsu, Y Chu, JM Yi, CL Wang, SR Wu, Y Hwu, G Margaritondo Applied Physics Letters 97 (3), 2010 | 16 | 2010 |
| Magnetic resonance imaging system and magnetic resonance imaging method using excited sub-volumes in groups YB Kim, Y Ryu, J Son, J Yi, S Lee US Patent 9,964,618, 2018 | 15 | 2018 |
| X-ray imaging apparatus and method of controlling the same D Kang, K Sunghoon, YH Sung, J Yi, J hak Lee, HAN Seokmin US Patent 10,085,706, 2018 | 14 | 2018 |
| X-ray imaging apparatus, image processing apparatus and image processing method JM Yi, D Kang, YH Sung, J hak Lee, JY Choi, SM Han US Patent 9,907,528, 2018 | 13 | 2018 |
| X-ray imaging apparatus and method of controlling the same JM Yi, DG Kang, YH Sung, J hak Lee, SM Han US Patent 9,743,901, 2017 | 13 | 2017 |
| Colloid coalescence with focused x rays BM Weon, JT Kim, JH Je, JM Yi, S Wang, WK Lee Physical Review Letters 107 (1), 018301, 2011 | 13 | 2011 |
| Bright-field imaging of lattice distortions using x rays JM Yi, JH Je, YS Chu, Y Zhong, Y Hwu, G Margaritondo Applied physics letters 89 (7), 2006 | 13 | 2006 |
