Follow
Diederik Maas
Diederik Maas
Verified email at tno.nl
Title
Cited by
Cited by
Year
High-speed spatial atomic-layer deposition of aluminum oxide layers for solar cell passivation
P Poodt, A Lankhorst, F Roozeboom, K Spee, D Maas, A Vermeer
Adv. Mater 22 (32), 3564-3567, 2010
4002010
Sub-10-nm nanolithography with a scanning helium beam
V Sidorkin, E van Veldhoven, E van der Drift, P Alkemade, H Salemink, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2009
1752009
Vibrational ladder climbing in NO by (sub) picosecond frequency-chirped infrared laser pulses
DJ Maas, DI Duncan, RB Vrijen, WJ Van Der Zande, LD Noordam
Chemical physics letters 290 (1-3), 75-80, 1998
1741998
Interference in climbing a quantum ladder system with frequency-chirped laser pulses
P Balling, DJ Maas, LD Noordam
Physical Review A 50 (5), 4276, 1994
1471994
Population transfer via adiabatic passage in the rubidium quantum ladder system
DJ Maas, CW Rella, P Antoine, ES Toma, LD Noordam
Physical Review A 59 (2), 1374, 1999
931999
Vibrational ladder climbing in NO by ultrashort infrared laser pulses
DJ Maas, DI Duncan, AFG Van der Meer, WJ Van der Zande, ...
Chemical Physics Letters 270 (1-2), 45-49, 1997
761997
Charging effects in quantum dots at high magnetic fields
NC Van der Vaart, AT Johnson, LP Kouwenhoven, DJ Maas, W de Jong, ...
Physica B: Condensed Matter 189 (1-4), 99-110, 1993
761993
Precise control of domain wall injection and pinning using helium and gallium focused ion beams
JH Franken, M Hoeijmakers, R Lavrijsen, JT Kohlhepp, HJM Swagten, ...
Journal of Applied Physics 109 (7), 2011
742011
Nanofabrication with a helium ion microscope
D Maas, E van Veldhoven, P Chen, V Sidorkin, H Salemink, ...
Metrology, Inspection, and Process Control for Microlithography XXIV 7638 …, 2010
672010
Nanopillar growth by focused helium ion-beam-induced deposition
P Chen, E van Veldhoven, CA Sanford, HWM Salemink, DJ Maas, ...
Nanotechnology 21 (45), 455302, 2010
642010
Beam induced deposition of platinum using a helium ion microscope
CA Sanford, L Stern, L Barriss, L Farkas, M DiManna, R Mello, DJ Maas, ...
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2009
562009
Rotational interference in vibrational ladder climbing in NO by chirped infrared laser pulses
DJ Maas, MJJ Vrakking, LD Noordam
Physical Review A 60 (2), 1351, 1999
551999
Imaging and Nanofabrication With the Helium Ion Microscope of the V an L eeuwenhoek Laboratory in D elft
PFA Alkemade, EM Koster, E van Veldhoven, DJ Maas
Scanning 34 (2), 90-100, 2012
512012
High-resolution direct-write patterning using focused ion beams
LE Ocola, C Rue, D Maas
Mrs Bulletin 39 (4), 336-341, 2014
382014
Model for nanopillar growth by focused helium ion-beam-induced deposition
PFA Alkemade, P Chen, E van Veldhoven, D Maas
Journal of Vacuum Science & Technology B 28 (6), C6F22-C6F25, 2010
362010
Structural characterization of He ion microscope platinum deposition and sub-surface silicon damage
Y Drezner, Y Greenzweig, D Fishman, E van Veldhoven, DJ Maas, ...
Journal of Vacuum Science & Technology B 30 (4), 2012
312012
Generation of frequency-chirped pulses in the far-infrared by means of a sub-picosecond free-electron laser and an external pulse shaper
GMH Knippels, AFG Van der Meer, R Mols, PW Van Amersfoort, RB Vrijen, ...
Optics communications 118 (5-6), 546-550, 1995
291995
Helium Ion Lithography: Principles and Performance
E van der Drift, DJ Maas
Nanofabrication: Techniques and Principles, 93-116, 2011
252011
Pulsed helium ion beam induced deposition: A means to high growth rates
PFA Alkemade, H Miro, E Van Veldhoven, DJ Maas, DA Smith, PD Rack
Journal of Vacuum Science & Technology B 29 (6), 2011
232011
On the influence of the sputtering in determining the resolution of a scanning ion microscope
V Castaldo, CW Hagen, P Kruit, E Van Veldhoven, D Maas
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2009
202009
The system can't perform the operation now. Try again later.
Articles 1–20